JPWO2021049330A1 - - Google Patents
Info
- Publication number
- JPWO2021049330A1 JPWO2021049330A1 JP2021545217A JP2021545217A JPWO2021049330A1 JP WO2021049330 A1 JPWO2021049330 A1 JP WO2021049330A1 JP 2021545217 A JP2021545217 A JP 2021545217A JP 2021545217 A JP2021545217 A JP 2021545217A JP WO2021049330 A1 JPWO2021049330 A1 JP WO2021049330A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
- C11D17/08—Liquid soap, e.g. for dispensers; capsuled
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/34—Organic compounds containing sulfur
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/36—Organic compounds containing phosphorus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
- C23G1/02—Cleaning or pickling metallic material with solutions or molten salts with acid solutions
- C23G1/04—Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors
- C23G1/06—Cleaning or pickling metallic material with solutions or molten salts with acid solutions using inhibitors organic inhibitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/69—Etching of wafers, substrates or parts of devices using masks for semiconductor materials
- H10P50/691—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019165317 | 2019-09-11 | ||
| PCT/JP2020/032679 WO2021049330A1 (ja) | 2019-09-11 | 2020-08-28 | 処理液、処理方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2021049330A1 true JPWO2021049330A1 (https=) | 2021-03-18 |
Family
ID=74867237
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021545217A Pending JPWO2021049330A1 (https=) | 2019-09-11 | 2020-08-28 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2021049330A1 (https=) |
| TW (1) | TWI896555B (https=) |
| WO (1) | WO2021049330A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025204631A1 (ja) * | 2024-03-27 | 2025-10-02 | 富士フイルム株式会社 | 薬液、半導体デバイスの製造方法 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002523546A (ja) * | 1998-08-18 | 2002-07-30 | アーチ・スペシャルティ・ケミカルズ・インコーポレイテッド | 非腐食性のストリッピングおよびクリーニング組成物 |
| JP2005522027A (ja) * | 2002-03-25 | 2005-07-21 | アドバンスド.テクノロジー.マテリアルス.インコーポレイテッド | 半導体基板洗浄のためのph緩衝組成物 |
| JP2012084917A (ja) * | 2008-10-28 | 2012-04-26 | Avantor Performance Materials Inc | 多金属デバイス処理のためのグルコン酸含有フォトレジスト洗浄組成物 |
| JP2013157516A (ja) * | 2012-01-31 | 2013-08-15 | Advanced Technology Materials Inc | 銅配線半導体用洗浄剤 |
| JP2015122496A (ja) * | 2013-12-20 | 2015-07-02 | エア プロダクツ アンド ケミカルズ インコーポレイテッドAir Products And Chemicals Incorporated | 窒化チタンハードマスク用組成物及びエッチング残渣の除去 |
| WO2017208749A1 (ja) * | 2016-06-02 | 2017-12-07 | 富士フイルム株式会社 | 処理液、基板の洗浄方法及びレジストの除去方法 |
| WO2018061670A1 (ja) * | 2016-09-29 | 2018-04-05 | 富士フイルム株式会社 | 処理液、および積層体の処理方法 |
| WO2018061582A1 (ja) * | 2016-09-29 | 2018-04-05 | 富士フイルム株式会社 | 処理液および積層体の処理方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6139975B2 (ja) * | 2013-05-15 | 2017-05-31 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| US11127587B2 (en) * | 2014-02-05 | 2021-09-21 | Entegris, Inc. | Non-amine post-CMP compositions and method of use |
| US9957469B2 (en) * | 2014-07-14 | 2018-05-01 | Versum Materials Us, Llc | Copper corrosion inhibition system |
-
2020
- 2020-08-28 JP JP2021545217A patent/JPWO2021049330A1/ja active Pending
- 2020-08-28 WO PCT/JP2020/032679 patent/WO2021049330A1/ja not_active Ceased
- 2020-09-08 TW TW109130810A patent/TWI896555B/zh active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002523546A (ja) * | 1998-08-18 | 2002-07-30 | アーチ・スペシャルティ・ケミカルズ・インコーポレイテッド | 非腐食性のストリッピングおよびクリーニング組成物 |
| JP2005522027A (ja) * | 2002-03-25 | 2005-07-21 | アドバンスド.テクノロジー.マテリアルス.インコーポレイテッド | 半導体基板洗浄のためのph緩衝組成物 |
| JP2012084917A (ja) * | 2008-10-28 | 2012-04-26 | Avantor Performance Materials Inc | 多金属デバイス処理のためのグルコン酸含有フォトレジスト洗浄組成物 |
| JP2013157516A (ja) * | 2012-01-31 | 2013-08-15 | Advanced Technology Materials Inc | 銅配線半導体用洗浄剤 |
| JP2015122496A (ja) * | 2013-12-20 | 2015-07-02 | エア プロダクツ アンド ケミカルズ インコーポレイテッドAir Products And Chemicals Incorporated | 窒化チタンハードマスク用組成物及びエッチング残渣の除去 |
| WO2017208749A1 (ja) * | 2016-06-02 | 2017-12-07 | 富士フイルム株式会社 | 処理液、基板の洗浄方法及びレジストの除去方法 |
| WO2018061670A1 (ja) * | 2016-09-29 | 2018-04-05 | 富士フイルム株式会社 | 処理液、および積層体の処理方法 |
| WO2018061582A1 (ja) * | 2016-09-29 | 2018-04-05 | 富士フイルム株式会社 | 処理液および積層体の処理方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2021049330A1 (ja) | 2021-03-18 |
| TWI896555B (zh) | 2025-09-11 |
| TW202111104A (zh) | 2021-03-16 |
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