JPWO2021014696A1 - - Google Patents

Info

Publication number
JPWO2021014696A1
JPWO2021014696A1 JP2021534539A JP2021534539A JPWO2021014696A1 JP WO2021014696 A1 JPWO2021014696 A1 JP WO2021014696A1 JP 2021534539 A JP2021534539 A JP 2021534539A JP 2021534539 A JP2021534539 A JP 2021534539A JP WO2021014696 A1 JPWO2021014696 A1 JP WO2021014696A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021534539A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021014696A1 publication Critical patent/JPWO2021014696A1/ja
Pending legal-status Critical Current

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/02—Devices for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computerised tomographs
    • A61B6/032—Transmission computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/54—Control of apparatus or devices for radiation diagnosis
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating apparatus or devices for radiation diagnosis
    • A61B6/582—Calibration
    • A61B6/583—Calibration using calibration phantoms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
JP2021534539A 2019-07-25 2020-04-08 Pending JPWO2021014696A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019136652 2019-07-25
PCT/JP2020/015783 WO2021014696A1 (ja) 2019-07-25 2020-04-08 Ｘ線ｃｔ装置

Publications (1)

Publication Number Publication Date
JPWO2021014696A1 true JPWO2021014696A1 (ja) 2021-01-28

Family

ID=74194080

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021534539A Pending JPWO2021014696A1 (ja) 2019-07-25 2020-04-08

Country Status (4)

Country Link
US (1) US20220252528A1 (ja)
JP (1) JPWO2021014696A1 (ja)
CN (1) CN114072658A (ja)
WO (1) WO2021014696A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3141246A1 (fr) * 2022-10-24 2024-04-26 Safran Ceramics Essai de flexion quatre points in situ d’une corniere

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63307341A (ja) * 1987-06-10 1988-12-15 Hitachi Ltd Ｘ線断層撮影装置
JP2000298106A (ja) * 1999-04-14 2000-10-24 Hitachi Ltd Ｘ線ｃｔ利用システム
JP2001083103A (ja) * 1999-09-13 2001-03-30 Toshiba Fa Syst Eng Corp コンピュータ断層撮影装置
JP2006214841A (ja) * 2005-02-03 2006-08-17 Shimadzu Corp Ｘ線ｃｔ装置
JP2008058227A (ja) * 2006-09-01 2008-03-13 Shimadzu Corp 放射線断層撮像装置
JP2008249668A (ja) * 2007-03-30 2008-10-16 Universal Seikan Kk 缶の巻き締め検査装置並びに巻き締め検査方法
JP2010151532A (ja) * 2008-12-24 2010-07-08 Honda Motor Co Ltd Ｘ線解析装置
JP2017032325A (ja) * 2015-07-30 2017-02-09 株式会社島津製作所 Ｘ線観察用の曲げ試験機
CN108982242A (zh) * 2018-07-30 2018-12-11 西南交通大学 一种采用x射线三维成像的悬臂式旋转弯曲原位疲劳试验机
JP2019090802A (ja) * 2017-11-10 2019-06-13 東芝Ｉｔコントロールシステム株式会社 非破壊解析装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6665433B2 (en) * 2001-07-31 2003-12-16 Agilent Technologies, Inc. Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography
JP4016265B2 (ja) * 2002-10-15 2007-12-05 株式会社島津製作所 Ｘ線ｃｔ装置
US8446734B2 (en) * 2006-03-30 2013-05-21 Kyocera Corporation Circuit board and mounting structure
JP5618292B2 (ja) * 2010-09-14 2014-11-05 朝日レントゲン工業株式会社 Ｘ線ｃｔ撮影装置及びｘ線ｃｔ画像の表示方法
US9129715B2 (en) * 2012-09-05 2015-09-08 SVXR, Inc. High speed x-ray inspection microscope
US9791385B2 (en) * 2013-12-10 2017-10-17 Arizona Board Of Regents On Behalf Of Arizona State University Modular high resolution X-ray computed tomography system
WO2018089405A1 (en) * 2016-11-09 2018-05-17 Ohio State Innovation Foundation Bending apparatus for material testing and micro-ct imaging
KR102190447B1 (ko) * 2019-05-14 2020-12-14 주식회사 뷰웍스 전수 검사 자동화를 위한 배터리 셀 검사 장치 및 검사 방법

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63307341A (ja) * 1987-06-10 1988-12-15 Hitachi Ltd Ｘ線断層撮影装置
JP2000298106A (ja) * 1999-04-14 2000-10-24 Hitachi Ltd Ｘ線ｃｔ利用システム
JP2001083103A (ja) * 1999-09-13 2001-03-30 Toshiba Fa Syst Eng Corp コンピュータ断層撮影装置
JP2006214841A (ja) * 2005-02-03 2006-08-17 Shimadzu Corp Ｘ線ｃｔ装置
JP2008058227A (ja) * 2006-09-01 2008-03-13 Shimadzu Corp 放射線断層撮像装置
JP2008249668A (ja) * 2007-03-30 2008-10-16 Universal Seikan Kk 缶の巻き締め検査装置並びに巻き締め検査方法
JP2010151532A (ja) * 2008-12-24 2010-07-08 Honda Motor Co Ltd Ｘ線解析装置
JP2017032325A (ja) * 2015-07-30 2017-02-09 株式会社島津製作所 Ｘ線観察用の曲げ試験機
JP2019090802A (ja) * 2017-11-10 2019-06-13 東芝Ｉｔコントロールシステム株式会社 非破壊解析装置
CN108982242A (zh) * 2018-07-30 2018-12-11 西南交通大学 一种采用x射线三维成像的悬臂式旋转弯曲原位疲劳试验机

Also Published As

Publication number Publication date
WO2021014696A1 (ja) 2021-01-28
CN114072658A (zh) 2022-02-18
US20220252528A1 (en) 2022-08-11

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