JPWO2021014583A1 - - Google Patents

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Publication number
JPWO2021014583A1
JPWO2021014583A1 JP2021534461A JP2021534461A JPWO2021014583A1 JP WO2021014583 A1 JPWO2021014583 A1 JP WO2021014583A1 JP 2021534461 A JP2021534461 A JP 2021534461A JP 2021534461 A JP2021534461 A JP 2021534461A JP WO2021014583 A1 JPWO2021014583 A1 JP WO2021014583A1
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JP
Japan
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JP2021534461A
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JP7256876B2 (ja
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Publication of JPWO2021014583A1 publication Critical patent/JPWO2021014583A1/ja
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Publication of JP7256876B2 publication Critical patent/JP7256876B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738—Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1744—Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2021534461A 2019-07-23 2019-07-23 物性値計測方法、及び物性値算出装置 Active JP7256876B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/028893 WO2021014583A1 (ja) 2019-07-23 2019-07-23 物性値計測方法、及び物性値算出装置

Publications (2)

Publication Number Publication Date
JPWO2021014583A1 true JPWO2021014583A1 (ja) 2021-01-28
JP7256876B2 JP7256876B2 (ja) 2023-04-12

Family

ID=74193554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021534461A Active JP7256876B2 (ja) 2019-07-23 2019-07-23 物性値計測方法、及び物性値算出装置

Country Status (3)

Country Link
US (1) US20220091034A1 (ja)
JP (1) JP7256876B2 (ja)
WO (1) WO2021014583A1 (ja)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000266669A (ja) * 1999-03-19 2000-09-29 Hamamatsu Photonics Kk 濃度測定装置
JP2006521869A (ja) * 2003-04-01 2006-09-28 グルコン インク 光音響分析評価方法と装置
US20060293599A1 (en) * 2003-01-23 2006-12-28 Dhiraj Sardar Method and apparatus for diagnosing neovascularized tissues
JP2010088498A (ja) * 2008-10-03 2010-04-22 Canon Inc 生体情報処理装置及び生体情報処理方法
WO2014087825A1 (ja) * 2012-12-06 2014-06-12 国立大学法人北海道大学 非侵襲型生体脂質濃度計測器、非侵襲型生体脂質代謝機能計測器、非侵襲による生体脂質濃度計測方法および非侵襲による生体脂質代謝機能検査方法
JP2014128487A (ja) * 2012-12-28 2014-07-10 Kao Corp 皮膚の評価方法及び皮膚の評価システム
JP2017225811A (ja) * 2016-06-20 2017-12-28 公立大学法人大阪市立大学 皮膚診断装置、皮膚状態出力方法、プログラムおよび記録媒体
JP2018115939A (ja) * 2017-01-18 2018-07-26 公立大学法人大阪市立大学 物質含有量を断層可視化する装置および方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5783564B2 (ja) * 2011-08-15 2015-09-24 国立大学法人神戸大学 三次元光散乱体の実効散乱係数の算定方法
CN104080390A (zh) * 2012-04-10 2014-10-01 奥林巴斯医疗株式会社 光学测量装置以及内窥镜系统
EP2949273A4 (en) * 2013-01-23 2016-11-09 Olympus Corp AN ECHOGRAPHIC OBSERVATION DEVICE, A METHOD FOR OPERATING AN ECHOGRAPHIC OBSERVATION DEVICE, AND A PROGRAM FOR OPERATING AN ECHOGRAPHIC OBSERVATION DEVICE
WO2018079326A1 (ja) * 2016-10-28 2018-05-03 富士フイルム株式会社 光干渉断層画像撮像装置および計測方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000266669A (ja) * 1999-03-19 2000-09-29 Hamamatsu Photonics Kk 濃度測定装置
US20060293599A1 (en) * 2003-01-23 2006-12-28 Dhiraj Sardar Method and apparatus for diagnosing neovascularized tissues
JP2006521869A (ja) * 2003-04-01 2006-09-28 グルコン インク 光音響分析評価方法と装置
JP2010088498A (ja) * 2008-10-03 2010-04-22 Canon Inc 生体情報処理装置及び生体情報処理方法
WO2014087825A1 (ja) * 2012-12-06 2014-06-12 国立大学法人北海道大学 非侵襲型生体脂質濃度計測器、非侵襲型生体脂質代謝機能計測器、非侵襲による生体脂質濃度計測方法および非侵襲による生体脂質代謝機能検査方法
JP2014128487A (ja) * 2012-12-28 2014-07-10 Kao Corp 皮膚の評価方法及び皮膚の評価システム
JP2017225811A (ja) * 2016-06-20 2017-12-28 公立大学法人大阪市立大学 皮膚診断装置、皮膚状態出力方法、プログラムおよび記録媒体
JP2018115939A (ja) * 2017-01-18 2018-07-26 公立大学法人大阪市立大学 物質含有量を断層可視化する装置および方法

Also Published As

Publication number Publication date
WO2021014583A1 (ja) 2021-01-28
US20220091034A1 (en) 2022-03-24
JP7256876B2 (ja) 2023-04-12

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