JPWO2021010181A1 - - Google Patents
Info
- Publication number
- JPWO2021010181A1 JPWO2021010181A1 JP2021532783A JP2021532783A JPWO2021010181A1 JP WO2021010181 A1 JPWO2021010181 A1 JP WO2021010181A1 JP 2021532783 A JP2021532783 A JP 2021532783A JP 2021532783 A JP2021532783 A JP 2021532783A JP WO2021010181 A1 JPWO2021010181 A1 JP WO2021010181A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J13/00—Controls for manipulators
- B25J13/08—Controls for manipulators by means of sensing devices, e.g. viewing or touching devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Human Computer Interaction (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Manipulator (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019131635 | 2019-07-17 | ||
| JP2019131635 | 2019-07-17 | ||
| PCT/JP2020/026010 WO2021010181A1 (ja) | 2019-07-17 | 2020-07-02 | 検査装置、検査方法、位置決め方法、およびプログラム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2021010181A1 true JPWO2021010181A1 (https=) | 2021-01-21 |
| JPWO2021010181A5 JPWO2021010181A5 (https=) | 2024-02-07 |
| JP7528939B2 JP7528939B2 (ja) | 2024-08-06 |
Family
ID=74210477
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021532783A Active JP7528939B2 (ja) | 2019-07-17 | 2020-07-02 | 検査装置、検査方法、位置決め方法、およびプログラム |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7528939B2 (https=) |
| WO (1) | WO2021010181A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023127021A1 (ja) * | 2021-12-27 | 2023-07-06 | 株式会社ニコン | 制御装置、制御システム、ロボットシステム、制御方法及びコンピュータプログラム |
| US12330304B2 (en) * | 2022-02-02 | 2025-06-17 | Intrinsic Innovation Llc | Object placement |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001255279A (ja) * | 2001-01-09 | 2001-09-21 | Hitachi Ltd | パターン欠陥検査方法およびその装置 |
| JP2007240434A (ja) * | 2006-03-10 | 2007-09-20 | Omron Corp | 表面状態の検査方法および表面状態検査装置 |
| JP2007248241A (ja) * | 2006-03-15 | 2007-09-27 | Omron Corp | 表面状態の検査方法および表面状態検査装置 |
| JP2008292430A (ja) * | 2007-05-28 | 2008-12-04 | Panasonic Electric Works Co Ltd | 外観検査方法および外観検査装置 |
| WO2015008373A1 (ja) * | 2013-07-19 | 2015-01-22 | 富士通株式会社 | 情報処理装置、検査範囲の計算方法、及びプログラム |
| JP2015085493A (ja) * | 2013-11-01 | 2015-05-07 | セイコーエプソン株式会社 | ロボット、処理装置及び検査方法 |
| JP2017062154A (ja) * | 2015-09-24 | 2017-03-30 | アイシン精機株式会社 | 欠陥検出装置及び欠陥検出方法 |
| JP2018004310A (ja) * | 2016-06-28 | 2018-01-11 | キヤノン株式会社 | 情報処理装置、計測システム、情報処理方法及びプログラム |
| JP2018194542A (ja) * | 2017-05-17 | 2018-12-06 | オムロン株式会社 | 画像処理システム、画像処理装置および画像処理プログラム |
| JP2019002788A (ja) * | 2017-06-15 | 2019-01-10 | リョーエイ株式会社 | 金属加工面の検査方法、金属加工面の検査装置 |
-
2020
- 2020-07-02 JP JP2021532783A patent/JP7528939B2/ja active Active
- 2020-07-02 WO PCT/JP2020/026010 patent/WO2021010181A1/ja not_active Ceased
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001255279A (ja) * | 2001-01-09 | 2001-09-21 | Hitachi Ltd | パターン欠陥検査方法およびその装置 |
| JP2007240434A (ja) * | 2006-03-10 | 2007-09-20 | Omron Corp | 表面状態の検査方法および表面状態検査装置 |
| JP2007248241A (ja) * | 2006-03-15 | 2007-09-27 | Omron Corp | 表面状態の検査方法および表面状態検査装置 |
| JP2008292430A (ja) * | 2007-05-28 | 2008-12-04 | Panasonic Electric Works Co Ltd | 外観検査方法および外観検査装置 |
| WO2015008373A1 (ja) * | 2013-07-19 | 2015-01-22 | 富士通株式会社 | 情報処理装置、検査範囲の計算方法、及びプログラム |
| JP2015085493A (ja) * | 2013-11-01 | 2015-05-07 | セイコーエプソン株式会社 | ロボット、処理装置及び検査方法 |
| JP2017062154A (ja) * | 2015-09-24 | 2017-03-30 | アイシン精機株式会社 | 欠陥検出装置及び欠陥検出方法 |
| JP2018004310A (ja) * | 2016-06-28 | 2018-01-11 | キヤノン株式会社 | 情報処理装置、計測システム、情報処理方法及びプログラム |
| JP2018194542A (ja) * | 2017-05-17 | 2018-12-06 | オムロン株式会社 | 画像処理システム、画像処理装置および画像処理プログラム |
| JP2019002788A (ja) * | 2017-06-15 | 2019-01-10 | リョーエイ株式会社 | 金属加工面の検査方法、金属加工面の検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2021010181A1 (ja) | 2021-01-21 |
| JP7528939B2 (ja) | 2024-08-06 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20211027 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230626 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240130 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240604 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240613 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20240625 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20240708 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7528939 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |