JPWO2021005730A1 - - Google Patents
Info
- Publication number
- JPWO2021005730A1 JPWO2021005730A1 JP2021530412A JP2021530412A JPWO2021005730A1 JP WO2021005730 A1 JPWO2021005730 A1 JP WO2021005730A1 JP 2021530412 A JP2021530412 A JP 2021530412A JP 2021530412 A JP2021530412 A JP 2021530412A JP WO2021005730 A1 JPWO2021005730 A1 JP WO2021005730A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/165—Electrospray ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/24—Vacuum systems, e.g. maintaining desired pressures
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2019/027237 WO2021005730A1 (ja) | 2019-07-10 | 2019-07-10 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2021005730A1 true JPWO2021005730A1 (zh) | 2021-01-14 |
JP7138247B2 JP7138247B2 (ja) | 2022-09-15 |
Family
ID=74114994
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021530412A Active JP7138247B2 (ja) | 2019-07-10 | 2019-07-10 | 質量分析装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20220319825A1 (zh) |
EP (1) | EP3998624A4 (zh) |
JP (1) | JP7138247B2 (zh) |
CN (1) | CN114026671A (zh) |
WO (1) | WO2021005730A1 (zh) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001272375A (ja) * | 2000-03-24 | 2001-10-05 | Shimadzu Corp | 液体クロマトグラフ質量分析装置 |
JP2004028763A (ja) * | 2002-06-25 | 2004-01-29 | Japan Science & Technology Corp | 質量分析等に用いるジェット流放電大気圧イオン化方法 |
WO2014084015A1 (ja) * | 2012-11-29 | 2014-06-05 | 株式会社日立ハイテクノロジーズ | ハイブリッドイオン源、質量分析計及びイオンモビリティ装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004025841B4 (de) * | 2004-05-24 | 2015-07-09 | Bruker Daltonik Gmbh | Verfahren und Vorrichtung zur massenspektroskopischen Untersuchung von Analyten |
WO2006060130A2 (en) * | 2004-11-09 | 2006-06-08 | E.I. Dupont De Nemours And Company | Ion source for a mass spectrometer |
US7737395B2 (en) * | 2006-09-20 | 2010-06-15 | Agilent Technologies, Inc. | Apparatuses, methods and compositions for ionization of samples and mass calibrants |
BR112013031106B1 (pt) * | 2011-06-03 | 2021-06-22 | Perkinelmer Health Sciences, Inc | Aparelho para análise de espécies químicas |
CN105474352B (zh) | 2013-09-05 | 2017-07-11 | 株式会社日立高新技术 | 混合离子源以及质量分析装置 |
-
2019
- 2019-07-10 WO PCT/JP2019/027237 patent/WO2021005730A1/ja unknown
- 2019-07-10 JP JP2021530412A patent/JP7138247B2/ja active Active
- 2019-07-10 CN CN201980097858.5A patent/CN114026671A/zh active Pending
- 2019-07-10 US US17/597,245 patent/US20220319825A1/en active Pending
- 2019-07-10 EP EP19936872.1A patent/EP3998624A4/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001272375A (ja) * | 2000-03-24 | 2001-10-05 | Shimadzu Corp | 液体クロマトグラフ質量分析装置 |
JP2004028763A (ja) * | 2002-06-25 | 2004-01-29 | Japan Science & Technology Corp | 質量分析等に用いるジェット流放電大気圧イオン化方法 |
WO2014084015A1 (ja) * | 2012-11-29 | 2014-06-05 | 株式会社日立ハイテクノロジーズ | ハイブリッドイオン源、質量分析計及びイオンモビリティ装置 |
Also Published As
Publication number | Publication date |
---|---|
EP3998624A4 (en) | 2023-03-29 |
CN114026671A (zh) | 2022-02-08 |
JP7138247B2 (ja) | 2022-09-15 |
WO2021005730A1 (ja) | 2021-01-14 |
EP3998624A1 (en) | 2022-05-18 |
US20220319825A1 (en) | 2022-10-06 |
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