JPWO2021005730A1 - - Google Patents

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Publication number
JPWO2021005730A1
JPWO2021005730A1 JP2021530412A JP2021530412A JPWO2021005730A1 JP WO2021005730 A1 JPWO2021005730 A1 JP WO2021005730A1 JP 2021530412 A JP2021530412 A JP 2021530412A JP 2021530412 A JP2021530412 A JP 2021530412A JP WO2021005730 A1 JPWO2021005730 A1 JP WO2021005730A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021530412A
Other versions
JP7138247B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021005730A1 publication Critical patent/JPWO2021005730A1/ja
Application granted granted Critical
Publication of JP7138247B2 publication Critical patent/JP7138247B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2021530412A 2019-07-10 2019-07-10 質量分析装置 Active JP7138247B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/027237 WO2021005730A1 (ja) 2019-07-10 2019-07-10 質量分析装置

Publications (2)

Publication Number Publication Date
JPWO2021005730A1 true JPWO2021005730A1 (ja) 2021-01-14
JP7138247B2 JP7138247B2 (ja) 2022-09-15

Family

ID=74114994

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021530412A Active JP7138247B2 (ja) 2019-07-10 2019-07-10 質量分析装置

Country Status (5)

Country Link
US (1) US20220319825A1 (ja)
EP (1) EP3998624A4 (ja)
JP (1) JP7138247B2 (ja)
CN (1) CN114026671A (ja)
WO (1) WO2021005730A1 (ja)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001272375A (ja) * 2000-03-24 2001-10-05 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2004028763A (ja) * 2002-06-25 2004-01-29 Japan Science & Technology Corp 質量分析等に用いるジェット流放電大気圧イオン化方法
WO2014084015A1 (ja) * 2012-11-29 2014-06-05 株式会社日立ハイテクノロジーズ ハイブリッドイオン源、質量分析計及びイオンモビリティ装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004025841B4 (de) * 2004-05-24 2015-07-09 Bruker Daltonik Gmbh Verfahren und Vorrichtung zur massenspektroskopischen Untersuchung von Analyten
EP1819423A4 (en) * 2004-11-09 2010-11-03 Du Pont ION SOURCE FOR MASS SPECTROMETER
US7737395B2 (en) * 2006-09-20 2010-06-15 Agilent Technologies, Inc. Apparatuses, methods and compositions for ionization of samples and mass calibrants
BR112013031106B1 (pt) * 2011-06-03 2021-06-22 Perkinelmer Health Sciences, Inc Aparelho para análise de espécies químicas
JP6181764B2 (ja) 2013-09-05 2017-08-16 株式会社日立ハイテクノロジーズ ハイブリッドイオン源及び質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001272375A (ja) * 2000-03-24 2001-10-05 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2004028763A (ja) * 2002-06-25 2004-01-29 Japan Science & Technology Corp 質量分析等に用いるジェット流放電大気圧イオン化方法
WO2014084015A1 (ja) * 2012-11-29 2014-06-05 株式会社日立ハイテクノロジーズ ハイブリッドイオン源、質量分析計及びイオンモビリティ装置

Also Published As

Publication number Publication date
EP3998624A1 (en) 2022-05-18
CN114026671A (zh) 2022-02-08
US20220319825A1 (en) 2022-10-06
EP3998624A4 (en) 2023-03-29
WO2021005730A1 (ja) 2021-01-14
JP7138247B2 (ja) 2022-09-15

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