JPWO2021003775A5 - - Google Patents
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上記目的を果たすべく、本発明の解決手段は、以下のようになる。
直流高速スイッチの内部アーク耐性試験方法は、
試験回路構築ステップと、試験操作ステップと、を含み、
前記試験回路は、短絡回路、整流回路、及びアークモニタリング回路を備え、
前記短絡回路は、短絡補助遮断器、交流電源、及び短絡変圧器を備え、前記交流電源、短絡補助遮断器、及び短絡変圧器の一次コイルは、順に直列接続されてループを形成し、
前記整流回路は、第１電流計、整流器群、リアクトル、整流補助遮断器、及び電流制限抵抗を備え、前記整流器群は前記短絡変圧器の二次コイルに接続され、第１電流計は、整流器の、短絡変圧器の二次コイルに接続されるコイルに実装され、前記電流制限抵抗は、一方端が前記整流器群の入力端に接続され、他方端が整流補助遮断器の一方端に接続され、前記リアクトルの一方端は、前記整流器群の出力端に接続され、
前記アークモニタリング回路は、第１電圧計、第２電圧計、第２電流計、及び特徴バラメータ総合モニタリング装置を備え、前記整流補助遮断器の他方端は、被試験遮断器に接続されるように構成され、前記特徴バラメータ総合モニタリング装置は、被試験遮断器をモニタリングすることで試験に必要なパラメータを取得するように構成され、前記第２電流計は、一方端が前記電流制限抵抗の他方端に接続され、他方端がそれぞれ被試験遮断器及びグランドに接続され、前記第１電圧計は、一方端が第２電流計の、被試験遮断器に接続される回線に接続され、他方端が接地され、前記第２電圧計は、一方端が整流補助遮断器の、被試験遮断器に接続される回線に接続され、他方端が接地され、
前記試験操作ステップは、試験回路パラメータ配置サブステップと、短絡電流発生サブステップと、整流サブステップと、アーク試験及び状態モニタリングサブステップとを含み、
前記試験回路パラメータ配置サブステップでは、
試験電流要求値及び発電機定格電圧に基づいて短絡変圧器の変圧比を調整し、更に整流試験回路における乾式リアクトルを調節することにより、被試験遮断器側で直流振幅値Ｉdcの短絡電流が発生可能にし、
前記短絡電流発生サブステップでは、
試験回路に短絡が発生する前に、被試験遮断器が閉極位置にあり、試験開始後、短絡補助遮断器を閉極させて回路を短絡させ、短絡変圧器によって短絡電流をコイルの巻き数比に応じて増幅させ、試験で要求される短絡電流を生成して整流回路の整流器に入力し、第１電流計によって電流振幅値をリアルタイムで記録し、
前記整流サブステップでは、
交流短絡電流を整流器によって整流した後、整流補助遮断器の閉極によって直流電流として出力し、乾式リアクトルと電流制限抵抗器とによって調節した後、試験要求を満たす電流振幅値Ｉdcを生成し、
前記アーク試験及び状態モニタリングサブステップでは、
アークモニタリング回路において、定格直流電流が被試験遮断器を流れた後、被試験遮断器を開極するように制御し、接触子の快速な相対開極運動につれて、アーク接触子の間で直流電弧が発生し、接触子が所定位置まで開極した後、直流電弧がアーク接触子の間でアブレーションし続け、試験要求時間ｔac維持した後、短絡補助遮断器によって交流短絡回路を遮断して電源側エネルギー供給を切断し、被試験遮断器Ｔ０のアーク接触子の電弧が徐々に減衰して最終的に消滅するようにし、これで１回の試験が終了し、試験要求値に応じてｎ回の試験を行い、試験間隔が、被試験遮断器の温度が環境温度まで回復するのに必要な時間を基準とし、試験過程において、被試験遮断器の動的抵抗、ガス組成変化、開閉極速度、及び消弧室赤外温度上昇量をそれぞれ記録し、ｎは、正整数である。
In order to achieve the above object, the solution of the present invention is as follows.
The internal arc resistance test method for DC high-speed switches is
including a test circuit construction step and a test operation step,
The test circuit comprises a short circuit, a rectifier circuit, and an arc monitoring circuit;
the short circuit comprises a short circuit auxiliary circuit breaker, an alternating current power supply and a short circuit transformer, the primary coils of the alternating current power supply, the short circuit auxiliary circuit breaker and the short circuit transformer being sequentially connected in series to form a loop;
The rectifier circuit includes a first ammeter, a rectifier group, a reactor, a rectifying auxiliary circuit breaker, and a current limiting resistor, the rectifier group is connected to the secondary coil of the short-circuit transformer, and the first ammeter is a rectifier. , the current limiting resistor has one end connected to the input end of the rectifier group and the other end connected to one end of the rectification auxiliary circuit breaker. , one end of the reactor is connected to the output end of the rectifier group,
The arc monitoring circuit includes a first voltmeter, a second voltmeter, a second ammeter, and a characteristic parameter comprehensive monitoring device, and the other end of the rectifying auxiliary circuit breaker is connected to the circuit breaker under test. wherein the characteristic parameter comprehensive monitoring device is configured to acquire parameters necessary for the test by monitoring the circuit breaker under test, and the second ammeter has one end connected to the other end of the current limiting resistor , and the other ends are connected to the circuit breaker under test and the ground respectively, the first voltmeter is connected to the line connected to the circuit breaker under test of the second ammeter at one end, and the other end is connected to one end of the second voltmeter is connected to the circuit connected to the circuit breaker under test of the rectifying auxiliary circuit breaker, and the other end is grounded;
the test operation step includes a test circuit parameter placement substep, a short circuit current generation substep, a commutation substep, and an arc test and condition monitoring substep;
In the test circuit parameter placement substep,
By adjusting the transformation ratio of the short-circuit transformer based on the test current demand value and the generator rated voltage, and further by adjusting the dry reactor in the rectification test circuit, the short-circuit current of the DC amplitude value I dc at the side of the circuit breaker under test is enable to occur,
In the short-circuit current generation sub-step,
Before a short circuit occurs in the test circuit, the circuit breaker under test is in the closed position. Amplify according to the ratio, generate the short circuit current required by the test and input it to the rectifier of the rectifier circuit, record the current amplitude value in real time by the first ammeter,
In said rectification sub-step,
After the AC short-circuit current is rectified by a rectifier, it is output as a DC current by closing the rectifying auxiliary circuit breaker, and after being adjusted by the dry reactor and the current limiting resistor, the current amplitude value I dc that meets the test requirements is generated,
In the arc testing and condition monitoring substep,
In the arc monitoring circuit, after the rated DC current flows through the circuit breaker under test, the circuit breaker under test is controlled to open. occurs, and after the contacts have opened to a predetermined position, the DC arc continues to ablate between the arc contacts. The side energy supply is cut off so that the electric arc of the arc contact of the circuit breaker under test T0 is gradually attenuated and finally extinguished. The test interval is based on the time required for the temperature of the circuit breaker under test to recover to the ambient temperature. , and arc chamber infrared temperature rise, respectively, where n is a positive integer.
前記整流器群は、６パルス又は１２パルスに設置されるように、制御可能なコンバータアームからなるブリッジ整流器によって構成されている。
Said rectifier group is constituted by a bridge rectifier consisting of converter arms which can be controlled to be placed in 6-pulse or 12-pulse.
当該整流回路２００は、第１電流計Ａ１、整流器群Ｖ、乾式リアクトルＬ、整流補助遮断器ＡＢ１、及び電流制限抵抗Ｒを備える。当該整流器群Ｖは、当該短絡変圧器Ｔの二次コイルに接続され、第１電流計Ａ１は、整流器Ｖの、短絡変圧器Ｔの二次コイルに接続されるコイルに実装され、当該電流制限抵抗Ｒは、一方端が前記整流器群Ｖの入力端に接続され、他方端が整流補助遮断器ＡＢ１の一方端に接続され、前記リアクトルＬの一方端は、前記整流器群Ｖの出力端に接続されている。
The rectifier circuit 200 includes a first ammeter A1, a rectifier group V, a dry reactor L, an auxiliary rectifier circuit breaker AB1, and a current limiting resistor R. The rectifier group V is connected to the secondary coil of the short-circuit transformer T, the first ammeter A1 is mounted on the coil of the rectifier V connected to the secondary coil of the short-circuit transformer T, and the current limiting One end of the resistor R is connected to the input end of the rectifier group V, the other end is connected to one end of the rectification auxiliary circuit breaker AB1, and one end of the reactor L is connected to the output end of the rectifier group V. It is
具体的に、当該整流器群Ｖは、制御可能なコンバータアームからなるブリッジ整流器Ｖによって構成され、６パルス又は１２パルスに設置されてもよい。当該特徴バラメータ総合モニタリング装置が被試験遮断器をモニタリングすることは、
被試験遮断器Ｔ０の開極時の時間－接触子速度、時間－接触子ストロークの曲線を取得するための機械特性モニタリングと、
被試験遮断器のアーク耐えにおける熱放射による消弧室の表面温度上昇の変化状況を取得するための赤外モニタリングと、
被試験遮断器の内部アーク耐え過程におけるＳＦ６ガス組成の発生、変化の過程を取得するためのガス組成モニタリングと、を含む。
Specifically, the rectifier group V is constituted by a bridge rectifier V consisting of controllable converter arms and may be arranged in 6-pulse or 12-pulse. The monitoring of the circuit breaker under test by the characteristic parameter comprehensive monitoring device is
mechanical property monitoring to obtain time-contact velocity, time-contact stroke curves during opening of the circuit breaker under test T0;
Infrared monitoring for obtaining changes in the surface temperature rise of the arc extinguishing chamber due to heat radiation in the arc resistance of the circuit breaker under test;
and gas composition monitoring for obtaining the process of generation and change of SF6 gas composition during the internal arc endurance process of the circuit breaker under test.
１）試験回路のパラメータの配置
試験電流要求値及び発電機定格電圧に基づいて短絡変圧器の変圧比を調整し、更に整流試験回路における乾式リアクトルを調節することにより、被試験遮断器側で直流振幅値Ｉdcの短絡電流が発生可能にする。
２）短絡電流の生成
試験回路に短絡が発生する前に、被試験遮断器が閉極位置にある。試験開始後、補助遮断器ＡＢ２を閉極させて回路を短絡させ、短絡変圧器Ｔによって短絡電流をコイルの巻き数比に応じて増幅させ、試験で要求される短絡電流を生成して整流回路の整流器に入力し、電流計Ａ１によって電流振幅値をリアルタイムで記録する。
３）整流
整流回路において、制御可能なコンバータアームからなるブリッジ整流器Ｖは、６パルス又は１２パルスに設置可能である。交流短絡電流を整流器によって整流した後、補助遮断器ＡＢ１の閉極によって直流電流として出力し、乾式リアクトルＬと電流制限抵抗器Ｒとによって調節した後、試験要求を満たす電流振幅値Ｉdcを生成する。
４）アーク試験及び状態モニタリング
アークモニタリング回路において、定格直流電流が被試験遮断器Ｔ０を流れた後、被試験遮断器Ｔ０を開極するように制御し、接触子の快速な相対開極運動につれて、アーク接触子の間で直流電弧が発生し、接触子が所定位置まで開極した後、直流電弧がアーク接触子の間でアブレーションし続け、試験要求時間ｔac維持した後、補助遮断器ＡＢ２によって交流短絡回路を遮断して電源側エネルギー供給を切断し、被試験遮断器Ｔ０のアーク接触子の電弧が徐々に減衰して最終的に消滅することになり、これで１回の試験が終了する。試験要求値に応じてｎ回の試験を行い、試験間隔は、人身傷害を回避するように、被試験遮断器の温度が環境温度まで回復するのに必要な時間を基準とするべきである。
1) Arrangement of test circuit parameters Adjust the transformation ratio of the short-circuit transformer based on the test current demand and generator rated voltage, and further adjust the dry reactor in the rectification test circuit to obtain a direct current at the circuit breaker under test. A short-circuit current of amplitude value I dc is allowed to occur.
2) Generation of short-circuit current Before a short-circuit occurs in the test circuit, the circuit breaker under test is in the closed position. After starting the test, the circuit is short-circuited by closing the auxiliary circuit breaker AB2, the short-circuit current is amplified by the short-circuit transformer T according to the turns ratio of the coil, and the short-circuit current required for the test is generated to generate the rectifier circuit. rectifier, and the current amplitude value is recorded in real time by the ammeter A1.
3) Rectification In the rectification circuit, a bridge rectifier V consisting of controllable converter arms can be installed with 6 or 12 pulses. After the AC short-circuit current is rectified by a rectifier, it is output as a DC current by closing the auxiliary circuit breaker AB1, and after being adjusted by the dry reactor L and the current limiting resistor R, the current amplitude value I dc that meets the test requirements is generated. do.
4) Arc test and state monitoring In the arc monitoring circuit, after the rated DC current flows through the circuit breaker under test T0, it is controlled to open the circuit breaker under test T0. , a DC arc is generated between the arc contacts, and after the contacts are opened to a predetermined position, the DC arc continues to ablate between the arc contacts, and after maintaining the test required time tac, the auxiliary circuit breaker AB2 By breaking the AC short circuit and cutting off the energy supply on the power supply side, the arc of the arc contact of the circuit breaker under test T0 gradually attenuates and finally disappears, and this completes one test. do. According to the test requirement, n tests are carried out and the test interval should be based on the time required for the temperature of the circuit breaker under test to recover to the ambient temperature so as to avoid personal injury.
Claims (5)
試験回路構築ステップと、試験操作ステップと、を含み、
前記試験回路は、短絡回路、整流回路、及びアークモニタリング回路を備え、
前記短絡回路は、短絡補助遮断器、交流電源、及び短絡変圧器を備え、前記交流電源、短絡補助遮断器、及び短絡変圧器の一次コイルは、順に直列接続されてループを形成し、
前記整流回路は、第１電流計、整流器群、リアクトル、整流補助遮断器、及び電流制限抵抗を備え、前記整流器群は前記短絡変圧器の二次コイルに接続され、第１電流計は、整流器の、短絡変圧器の二次コイルに接続されるコイルに実装され、前記電流制限抵抗は、一方端が前記整流器群の入力端に接続され、他方端が整流補助遮断器の一方端に接続され、前記リアクトルの一方端は前記整流器群の出力端に接続され、
前記アークモニタリング回路は、第１電圧計、第２電圧計、第２電流計、及び特徴バラメータ総合モニタリング装置を備え、前記整流補助遮断器の他方端は、被試験遮断器に接続されるように構成され、前記特徴バラメータ総合モニタリング装置は、被試験遮断器をモニタリングすることで試験に必要なパラメータを取得するように構成され、前記第２電流計は、一方端が前記電流制限抵抗の他方端に接続され、他方端がそれぞれ被試験遮断器及びグランドに接続され、前記第１電圧計は、一方端が第２電流計の、被試験遮断器に接続される回線に接続され、他方端が接地され、前記第２電圧計は、一方端が整流補助遮断器の、被試験遮断器に接続される回線に接続され、他方端が接地され、
前記試験操作ステップは、試験回路パラメータ配置サブステップと、短絡電流発生サブステップと、整流サブステップと、アーク試験及び状態モニタリングサブステップとを含み、
前記試験回路パラメータ配置サブステップでは、
試験電流要求値及び発電機定格電圧に基づいて短絡変圧器の変圧比を調整し、更に、整流試験回路における乾式リアクトルを調節することにより、被試験遮断器側で直流振幅値Ｉdcの短絡電流が発生可能にし、
前記短絡電流発生サブステップでは、
試験回路に短絡が発生する前に、被試験遮断器が閉極位置にあり、試験開始後、短絡補助遮断器を閉極させて回路を短絡させ、短絡変圧器によって短絡電流をコイルの巻き数比に応じて増幅させ、試験で要求される短絡電流を生成して整流回路の整流器に入力し、第１電流計によって電流振幅値をリアルタイムで記録し、
前記整流サブステップでは、
交流短絡電流を整流器によって整流した後、整流補助遮断器の閉極によって直流電流として出力し、乾式リアクトルと電流制限抵抗器とによって調節した後、試験要求を満たす電流振幅値Ｉdcを生成し、
前記アーク試験及び状態モニタリングサブステップでは、
アークモニタリング回路において、定格直流電流が被試験遮断器を流れた後、被試験遮断器を開極するように制御し、接触子の快速な相対開極運動につれて、アーク接触子の間で直流電弧が発生し、接触子が所定位置まで開極した後、直流電弧がアーク接触子の間でアブレーションし続け、試験要求時間ｔac維持した後、短絡補助遮断器によって交流短絡回路を遮断して電源側エネルギー供給を切断し、被試験遮断器Ｔ０のアーク接触子の電弧が徐々に減衰して最終的に消滅するようにし、これで１回の試験が終了し、試験要求値に応じてｎ回の試験を行い、試験間隔が、被試験遮断器の温度が環境温度まで回復するのに必要な時間を基準とし、試験過程において、被試験遮断器の動的抵抗、ガス組成変化、開閉極速度、及び消弧室赤外温度上昇量をそれぞれ記録し、ｎは、正整数であることを特徴とする方法。 A method for testing the internal arc resistance capability of a DC high-speed switch, comprising:
including a test circuit construction step and a test operation step,
The test circuit comprises a short circuit, a rectifier circuit, and an arc monitoring circuit;
the short circuit comprises a short circuit auxiliary circuit breaker, an alternating current power supply and a short circuit transformer, the primary coils of the alternating current power supply, the short circuit auxiliary circuit breaker and the short circuit transformer being sequentially connected in series to form a loop;
The rectifier circuit includes a first ammeter, a rectifier group, a reactor, a rectifying auxiliary circuit breaker, and a current limiting resistor, the rectifier group is connected to the secondary coil of the short-circuit transformer, and the first ammeter is a rectifier. , the current limiting resistor has one end connected to the input end of the rectifier group and the other end connected to one end of the rectification auxiliary circuit breaker. , one end of the reactor is connected to the output end of the rectifier group,
The arc monitoring circuit includes a first voltmeter, a second voltmeter, a second ammeter, and a characteristic parameter comprehensive monitoring device, and the other end of the rectifying auxiliary circuit breaker is connected to the circuit breaker under test. wherein the characteristic parameter comprehensive monitoring device is configured to acquire parameters necessary for the test by monitoring the circuit breaker under test, and the second ammeter has one end connected to the other end of the current limiting resistor , and the other ends are connected to the circuit breaker under test and the ground respectively, the first voltmeter is connected to the line connected to the circuit breaker under test of the second ammeter at one end, and the other end is connected to one end of the second voltmeter is connected to the circuit connected to the circuit breaker under test of the rectifying auxiliary circuit breaker, and the other end is grounded;
the test operation step includes a test circuit parameter placement substep, a short circuit current generation substep, a commutation substep, and an arc test and condition monitoring substep;
In the test circuit parameter placement substep,
By adjusting the transformation ratio of the short-circuit transformer based on the test current demand value and the generator rated voltage, and further by adjusting the dry reactor in the rectification test circuit, the short-circuit current of the DC amplitude value I dc at the circuit breaker under test allows to occur and
In the short-circuit current generation sub-step,
Before a short circuit occurs in the test circuit, the circuit breaker under test is in the closed position. Amplify according to the ratio, generate the short circuit current required by the test and input it to the rectifier of the rectifier circuit, record the current amplitude value in real time by the first ammeter,
In said rectification sub-step,
After the AC short-circuit current is rectified by a rectifier, it is output as a DC current by closing the rectifying auxiliary circuit breaker, and is adjusted by a dry reactor and a current limiting resistor to generate a current amplitude value I dc that meets the test requirements,
In the arc testing and condition monitoring substep,
In the arc monitoring circuit, after the rated DC current flows through the circuit breaker under test, it is controlled to open the circuit breaker under test. occurs, and after the contacts are opened to a predetermined position, the DC arc continues to ablate between the arc contacts. The side energy supply is cut off so that the electric arc of the arc contact of the circuit breaker under test T0 is gradually attenuated and finally extinguished, this completes one test, n times according to the test requirements The test interval is based on the time required for the temperature of the circuit breaker under test to recover to the ambient temperature. , and arc chamber infrared temperature rise, respectively, wherein n is a positive integer.
被試験遮断器のアーク耐え過程における熱放射による消弧室の表面温度上昇の変化状況を取得するための赤外モニタリングと、
被試験遮断器の内部アーク耐え過程におけるＳＦ６ガス組成の発生、変化の過程を取得するためのガス組成モニタリングと、を含む
ことを特徴とする請求項１に記載の方法。 The monitoring of the circuit breaker under test by the characteristic parameter comprehensive monitoring device includes mechanical characteristic monitoring for obtaining curves of time-contactor speed and time-contactor stroke at the time of opening of the circuit breaker under test T0,
Infrared monitoring for obtaining changes in the surface temperature rise of the arc extinguishing chamber due to heat radiation during the arc endurance process of the circuit breaker under test;
and gas composition monitoring to obtain the evolution and change process of SF6 gas composition during the internal arc endurance process of the circuit breaker under test.
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| CN201910621594.0A CN110376516A (en) | 2019-07-10 | 2019-07-10 | A kind of DC high-speed switch inside arcing resistance test method |
| CN201910621594.0 | 2019-07-10 | ||
| PCT/CN2019/097617 WO2021003775A1 (en) | 2019-07-10 | 2019-07-25 | Method for testing internal-arcing-resistance capability of direct-current high-speed switch |
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| JPS5511253B2 (en) * | 1974-04-08 | 1980-03-24 | ||
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| US9039275B2 (en) * | 2012-01-13 | 2015-05-26 | Nissan North America, Inc. | Methods of preventing freezing of relays in electrical components |
| CN103744018A (en) * | 2014-01-16 | 2014-04-23 | 常州市明及电气技术开发有限公司 | On-line monitoring system aiming at high-voltage circuit breaker |
| JP6237533B2 (en) * | 2014-08-22 | 2017-11-29 | 三菱電機株式会社 | Earth leakage breaker |
| CN104535923B (en) * | 2014-12-27 | 2017-10-31 | 中国西电电气股份有限公司 | A kind of test loop detected for dc circuit breaker break performance and test method |
| CN105807214B (en) * | 2014-12-29 | 2019-08-27 | 国家电网公司 | A kind of high voltage DC breaker breaking test apparatus and its test method |
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| CN109254242B (en) * | 2018-09-18 | 2023-09-26 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Ablation test loop and method for testing ablation state of arc contact of circuit breaker |
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