JPWO2021001985A1 - - Google Patents

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Publication number
JPWO2021001985A1
JPWO2021001985A1 JP2021529649A JP2021529649A JPWO2021001985A1 JP WO2021001985 A1 JPWO2021001985 A1 JP WO2021001985A1 JP 2021529649 A JP2021529649 A JP 2021529649A JP 2021529649 A JP2021529649 A JP 2021529649A JP WO2021001985 A1 JPWO2021001985 A1 JP WO2021001985A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021529649A
Other versions
JP7201089B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021001985A1 publication Critical patent/JPWO2021001985A1/ja
Application granted granted Critical
Publication of JP7201089B2 publication Critical patent/JP7201089B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7266—Nebulising, aerosol formation or ionisation by electric field, e.g. electrospray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2021529649A 2019-07-04 2019-07-04 クロマトグラフ質量分析装置 Active JP7201089B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/026607 WO2021001985A1 (ja) 2019-07-04 2019-07-04 クロマトグラフ質量分析装置

Publications (2)

Publication Number Publication Date
JPWO2021001985A1 true JPWO2021001985A1 (ja) 2021-01-07
JP7201089B2 JP7201089B2 (ja) 2023-01-10

Family

ID=74100829

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021529649A Active JP7201089B2 (ja) 2019-07-04 2019-07-04 クロマトグラフ質量分析装置

Country Status (4)

Country Link
US (1) US20220246415A1 (ja)
JP (1) JP7201089B2 (ja)
CN (1) CN114008450A (ja)
WO (1) WO2021001985A1 (ja)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011141220A (ja) * 2010-01-08 2011-07-21 Shimadzu Corp 分析装置制御システム及び該システム用プログラム
JP2012098276A (ja) * 2010-11-03 2012-05-24 Agilent Technologies Inc 質量スペクトルのライブラリをキュレーションするためのシステム及び方法
JP2013224858A (ja) * 2012-04-20 2013-10-31 Shimadzu Corp クロマトグラフタンデム四重極型質量分析装置
WO2015029101A1 (ja) * 2013-08-26 2015-03-05 株式会社島津製作所 クロマトグラフ質量分析装置
US20160054264A1 (en) * 2013-04-15 2016-02-25 Micromass Uk Limited A Method of Screening Samples
WO2018042605A1 (ja) * 2016-09-01 2018-03-08 株式会社島津製作所 質量分析データ処理装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016053500A (ja) * 2014-09-03 2016-04-14 株式会社島津製作所 クロマトグラフ質量分析装置
CN108140060B (zh) * 2015-05-29 2022-06-28 沃特世科技公司 用于处理质谱数据的技术

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011141220A (ja) * 2010-01-08 2011-07-21 Shimadzu Corp 分析装置制御システム及び該システム用プログラム
JP2012098276A (ja) * 2010-11-03 2012-05-24 Agilent Technologies Inc 質量スペクトルのライブラリをキュレーションするためのシステム及び方法
JP2013224858A (ja) * 2012-04-20 2013-10-31 Shimadzu Corp クロマトグラフタンデム四重極型質量分析装置
US20160054264A1 (en) * 2013-04-15 2016-02-25 Micromass Uk Limited A Method of Screening Samples
WO2015029101A1 (ja) * 2013-08-26 2015-03-05 株式会社島津製作所 クロマトグラフ質量分析装置
WO2018042605A1 (ja) * 2016-09-01 2018-03-08 株式会社島津製作所 質量分析データ処理装置

Also Published As

Publication number Publication date
US20220246415A1 (en) 2022-08-04
JP7201089B2 (ja) 2023-01-10
WO2021001985A1 (ja) 2021-01-07
CN114008450A (zh) 2022-02-01

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