JPWO2015107657A1 - Optical measuring device - Google Patents

Abstract

Provided is an optical measuring device having a simple configuration capable of obtaining a highly reliable measurement result by measuring optical characteristics of a light emitting element. The optical measuring device is based on an optical attenuator that attenuates the light emitted from the light emitting element, a measuring instrument that measures optical characteristics of the light attenuated by the optical attenuator, and the amount of light emitted by the light emitting element. A control unit for setting an attenuation amount of the optical attenuator.

Description

  The present invention relates to an optical measuring device.

  Patent Document 1 discloses an inspection apparatus that performs optical inspection of LEDs (Light Emitting Diodes).

JP2013-11542A

  However, in the apparatus described in Patent Document 1, since the optical characteristics of the LED are measured with a spectroscope, there is room for improvement in the reliability of the measurement results due to the characteristics of the spectroscope.

  The present invention has been made in view of the above circumstances, and an object of the present invention is to solve the above-described problems. That is, an example of the subject of the present invention is to provide an optical measuring device having a simple configuration that can obtain a highly reliable measurement result by measuring optical characteristics of a light emitting element.

  An optical measuring apparatus according to claim 1 of the present invention includes an optical attenuator that attenuates light emitted from a light emitting element, a measuring instrument that measures optical characteristics of light attenuated by the optical attenuator, and the light emitting element emits light. And a control unit that sets an attenuation amount of the optical attenuator based on the light amount of the light.

Several embodiments of the present invention will now be described, by way of example only, with reference to the accompanying drawings.
FIG. 1 shows a light emission state of a light emitting element measured by an optical measuring device. FIG. 2 schematically shows the configuration of the optical measurement apparatus. FIG. 3 shows an enlarged view of an optical fiber and a light emitting element included in the optical measuring device. FIG. 4 shows a configuration of an optical attenuator included in the optical measurement apparatus. FIG. 5A shows the photoelectric conversion characteristics of the spectrometer. FIG. 5B shows an example of the spectral characteristics of the light emitting element measured with a spectroscope. FIG. 6 is a flowchart for explaining processing performed by the control unit of the optical measurement apparatus when measuring optical characteristics. FIG. 7 is a diagram for explaining a first modification of the optical measuring device. FIG. 8 is a diagram for explaining a second modification of the optical measuring device. FIG. 9 is a flowchart for explaining processing performed by the control unit shown in FIG. 8 when measuring optical characteristics. FIG. 10 is a diagram for explaining a third modification of the optical measuring device.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Embodiment described below shows some examples of the present invention, and does not limit the contents of the present invention. In addition, all the configurations and operations described in the embodiments are not necessarily essential as the configurations and operations of the present invention. In addition, the same referential mark is attached | subjected to the same component and the overlapping description is abbreviate | omitted.

<About the light emission state of the light emitting element>
The light emission state of the light emitting element 101 measured by the optical measuring device 3 will be described with reference to FIG.
FIG. 1 shows a light emission state of the light emitting element 101 measured by the optical measuring device 3.

The light-emitting element 101 includes at least an electrode and a light-emitting portion, and emits light in a specific wavelength region when power is supplied. The light emitting element 101 is, for example, a light emitting diode.
As shown in FIG. 1A, the light emitting element 101 emits light radially from the light emitting surface 101a.
The light emitting surface 101 a is located on the surface of the light emitting element 101. The normal line of the light emitting surface 101a of the light emitting element 101 is referred to as a light emission central axis LCA. The light emitting surface 101a is the surface of the light emitting element 101 on the positive direction side of the light emission central axis LCA in FIG.
When one direction on a plane including the light emitting surface 101a is defined as a reference axis (x axis), a counterclockwise angle from the x axis on the plane is defined as φ. In addition, an angle formed with the light emission center axis LCA when φ is fixed is defined as θ.
The intensity of light emitted from the light emitting element 101 and emitted from the light emitting surface 101a varies depending on the angle θ from the light emission center axis LCA and the like.

The amount of light is calculated for the back side of the light emitting element 101 by integrating all the intensities of light within the range of θ values of 0 ° to 90 ° for φ values of 0 ° to 360 °. It is the added value.
Knowing this amount of light makes it possible to inspect whether or not the light emitting element 101 is suitable for various uses.

The intensity of light emitted from the light emitting element 101 has different values for each of θ and φ. In order to visually express the light intensity, a diagram as shown in FIG. 1B is used.
In FIG. 1B, the intersection of the x-axis and the y-axis represents θ = 0 °. Each point on the circle represents the position of each φ at θ = 90 °.
FIG. 1C is a cross-sectional view at a position where the value of φ is constant.

  Here, the light intensity at the same distance from the light emitting element 101 and at the position of the angle θ from the light emission central axis LCA is defined as the light distribution intensity E (θ). This light distribution intensity E (θ) corresponding to each θ is illustrated as a light distribution intensity distribution.

If the light distribution intensity distribution is known, the light amount of the light emitting element 101 can be obtained as follows.
That is, the light distribution intensity E (θ) is integrated on the circumference around the emission center axis LCA (integration from φ = 0 ° to 360 °) to obtain the peripheral light distribution intensity J (θ). The circumferential light distribution intensity J (θ) is represented by J (θ) = E (θ) · 2πr · sin θ. The circumferential light distribution intensity J (θ) is integrated from θ = 0 ° to θ °, and the light amount K (θ) on the surface side of the light emitting element 101 can be obtained.
Further, the amount of light on the back side of the light emitting element 101 can be obtained by multiplying K (θ) by a constant coefficient κ.
Then, the light amount of the light emitting element 101 can be obtained by adding the light amount K (θ) on the front surface side and the light amount K (θ) · κ on the back surface side.
Note that it is known that the difference between the light amount on the front surface side and the light amount on the back surface side of the light emitting element 101 is substantially constant in the light emitting element 101 manufactured in the same process. For this reason, if the coefficient κ is obtained by actually measuring the light amount of one light emitting element 101, the same value can be applied to the other light emitting elements 101.

  In the description of FIG. 1, it is assumed that the light emitting element 101 can be considered as a point by measuring at a position sufficiently far from the light emitting element 101. Since the light emitting element 101 is extremely small as compared with the normal photodetector 105 or the like (see FIG. 2), it can be assumed in this way. The same applies to the description after FIG. 2 unless otherwise specified.

<Configuration of optical measuring device>
The configuration of the optical measurement device 3 will be described with reference to FIGS. 2 and 3.
FIG. 2 schematically shows the configuration of the optical measuring device 3. FIG. 3 shows an enlarged view of the optical fiber 117 and the light emitting element 101 included in the optical measuring device 3.

The optical measuring device 3 is a device that measures the optical characteristics of the light emitted from the light emitting element 101. The optical characteristics measured by the optical measuring device 3 include at least the light amount, wavelength, and chromaticity of the light emitted from the light emitting element 101.
The optical measuring device 3 supplies power to the light emitting element 101 to emit light, and measures the optical characteristics of the light emitted from the light emitting element 101. If a plurality of light emitting elements 101 are arranged, the optical measuring device 3 sequentially supplies power to the light emitting element 101 to be measured among the light emitting elements 101 arranged in a plurality, and the light emitting element 101 to be measured emits light. Measure the optical properties of the light.
The optical measuring device 3 can be applied to an inspection device used in an inspection process included in the manufacturing process of the light emitting element 101. The optical measuring device 3 can measure electrical characteristics in addition to the optical characteristics of the light emitting element 101.

  The optical measuring device 3 includes a table 103, a probe needle 109, an optical fiber 117, a signal line 111, a spectroscope 121, an optical attenuator 123, an electrical characteristic measuring unit 125, a control unit 151, and an output unit. 163 at least.

The table 103 is a measurement sample stage on which the light emitting element 101 to be measured is placed.
The table 103 has a substantially uniform flat plate shape and is installed substantially horizontally.
The table 103 and the light emitting element 101 mounted thereon are substantially parallel to each other.

The table 103 includes at least a glass table 103a and a dicing sheet 103b.
The glass table 103a is formed in a substantially uniform flat plate shape using a light transmitting material such as sapphire or glass.
The dicing sheet 103b has adhesiveness on the surface and is laminated on the glass table 103a. The light emitting element 101 is placed on the dicing sheet 103b.
The table 103 having the dicing sheet 103b can easily transfer the light emitting element 101 to the table 103 at the time of measurement, and can suppress displacement.
In the manufacturing process of the light emitting element 101, when a plurality of the light emitting elements 101 are arranged in advance on the dicing sheet 103b, the light emitting element 101 and the dicing sheet 103b may be collectively placed on the glass table 103a. Good.

The probe needle 109 supplies power to the light emitting element 101 to cause the light emitting element 101 to emit light. The probe needles 109 extend radially in a direction perpendicular to the normal line of the light emitting element 101 substantially parallel to the light emitting surface 101 a of the light emitting element 101.
The probe needle 109 in FIG. 2 applies a voltage in contact with the electrode of the light emitting element 101 when measuring the optical characteristics of the light emitting element 101. In addition, the probe needle 109 is connected to the electrical characteristic measuring unit 125, and the electrical characteristics of the light emitting element 101 can be measured simultaneously. The probe needle 109 is disposed on the upper surface, the lower surface, or both surfaces of the light emitting element 101 according to the position of the electrode of the light emitting element 101.

  When the probe needle 109 is brought into contact with the light emitting element 101, the probe needle 109 may be moved while the table 103 and the light emitting element 101 are fixed. Conversely, the table 103 and the light emitting element 101 may be moved while the probe needle 109 is fixed.

The optical fiber 117 takes in the light emitted from the light emitting element 101 and guides it to the spectroscope 121. The optical fiber 117 takes in light with a predetermined numerical aperture.
As shown in FIG. 3, the optical fiber 117 includes a head 117a, an optical transmission line 117b, and an incident port 117c.

The head 117a is a part that captures light.
The head 117a is formed in a cylindrical shape. An incident port 117c, which is an opening for allowing light to enter, is provided at the tip of the head 117a. The head 117 a is disposed so that the incident port 117 c faces the light emitting surface 101 a of the light emitting element 101. The central axis of the incident port 117c substantially coincides with the light emission central axis LCA of the light emitting element 101 to be measured. The central axis of the head 117a substantially coincides with the central axis of the incident port 117c.
The incident port 117c allows light in a range corresponding to a predetermined numerical aperture of the optical fiber 117 to enter.
The optical transmission line 117b optically connects the spectroscope 121 to the end opposite to the tip of the head 117a provided with the incident port 117c.
The optical transmission path 117b guides the light incident from the incident port 117c to the spectroscope 121. The optical transmission path 117b totally reflects the light incident from the incident port 117c and guides it to the spectroscope 121 while suppressing transmission loss as much as possible.

The spectroscope 121 detects the light emitted from the light emitting element 101 via the optical fiber 117 and the optical attenuator 123, and measures the optical characteristics thereof.
The optical characteristics measured by the spectroscope 121 include at least the light amount, wavelength, and chromaticity of the light emitted from the light emitting element 101.
The spectroscope 121 includes a light receiving element. When light enters the light receiving element, the spectroscope 121 generates a charge corresponding to the incident light by photoelectric conversion. The light receiving element of the spectroscope 121 is, for example, a CCD (Charge Coupled Device), a photodiode array, or the like.

The spectroscope 121 wavelength-disperses incident light and determines the light intensity for each dispersed wavelength. The light intensity for each wavelength corresponds to the wavelength spectrum information of the incident light. The spectroscope 121 calculates component ratios of tristimulus values of red (R), green (G), and blue (B) from the wavelength spectrum information, and obtains the chromaticity of incident light. In addition, the spectroscope 121 integrates the light intensity for each dispersed wavelength to obtain the amount of incident light. The spectroscope 121 can obtain other optical characteristics as necessary.
The spectroscope 121 generates an electrical signal corresponding to the obtained various optical characteristics. The spectroscope 121 outputs the generated electrical signal to the control unit 151 via the signal line 111. This electrical signal corresponds to wavelength spectrum information, chromaticity information, light amount information, and the like measured by the spectroscope 121.

The optical attenuator 123 is disposed on the optical transmission path 117 b between the spectroscope 121 and the head 117 a provided with the incident port 117 c of the optical fiber 117.
The optical attenuator 123 attenuates the light emitted from the light emitting element 101 and guides the attenuated light to the spectroscope 121. The light detected by the spectroscope 121 is light attenuated by the optical attenuator 123.
The detailed configuration of the optical attenuator 123 will be described later with reference to FIG.

Here, as shown in FIG. 3, the distance between the light emitting element 101 to be measured and the optical fiber 117 is L. Let A be the distance from the center of the light emitting element 101 to be measured to the outer edge. Let B be the interval between adjacent light emitting elements 101. Let X be the distance from the center of the light emitting element 101 to be measured to the outer edge of the light emitting element 101 adjacent to the light emitting element 101 to be measured.
Further, the maximum value of the incident angle of light that can be totally reflected in the optical fiber 117 is α. It is assumed that the medium between the optical fiber 117 and the light emitting element 101 is air and the refractive index = 1. The numerical aperture of the optical fiber 117 and NA, the range indicated by the numerical aperture NA and _{S 0.} Let D be the distance from the center of the light emitting element 101 to the outer edge of the range S ₀ when the range S ₀ is projected onto the light emitting element 101.
At this time, the numerical aperture NA is NA = sin α. The distance X is X = A + B. The distance D is D = Ltanα.

When the light emitting element 101 is in the range S ₀ indicated by the numerical aperture NA, the light emitted from the light emitting element 101 can be totally reflected in the optical fiber 117 and guided to the spectroscope 121. If the light emitting element 101 is not in the range S ₀ , the light emitted from the light emitting element 101 is not guided to the spectroscope 121.
Therefore, the range S ₀ indicated by the numerical aperture NA corresponds to the range of light that can be detected by the spectroscope 121.
In the present embodiment, the range of light detected by the spectroscope 121 is also referred to as a “detection range”.
Further, the detection range of the spectroscope 121 corresponds to the range of light in which the optical measurement device 3 can measure the optical characteristics.

In the optical measuring device 3, the light emitting element 101 to be measured is positioned within the range S _0, and, for the light emitting element 101 other than the measurement object is not located within the range S _0, satisfying the relation of the following type distance L is set in advance.
A / tan α ≦ L ≦ X / tan α
As a result, the optical measurement device 3 does not detect unintended light emitted from the light emitting elements 101 other than the measurement target in a state where the plurality of light emitting elements 101 are arranged, and the light emitted from the measurement light emitting element 101 emits light. Can be detected.
“Unintended light emitted from the light emitting element 101 other than the measurement target” is light emitted from the light emitting element 101 other than the measurement target due to light emission of the light emitting element 101 as the measurement target.
For example, there is light emitted when light emitted from the light emitting element 101 to be measured enters the light emitting element 101 other than the measurement target and the light emitting elements 101 other than the measurement target are excited.
For example, there is light emitted when light emitted from the light emitting element 101 to be measured enters the light emitting element 101 other than the measurement target and is reflected by the light emitting element 101 other than the measurement target.

  The electrical characteristic measurement unit 125 includes at least a positioning unit 159, an HV unit 153, an ESD unit 155, and a switching unit 157.

  The positioning unit 159 positions and fixes the probe needle 109. Specifically, the positioning unit 159 has a function of holding the tip position of the probe needle 109 at a fixed position as long as the table 103 moves. Conversely, if the positioning unit 159 is of a type in which the probe needle 109 moves, the position of the tip of the probe needle 109 is moved to a predetermined position on the table 103 on which the light emitting element 101 is placed, and then the position It has the function to hold.

The HV unit 153 applies a rated voltage and detects various electrical characteristics of the light emitting element 101 with respect to the rated voltage.
Normally, the spectroscope 121 measures light emitted from the light emitting element 101 in a state where a voltage is applied from the HV unit 153.
Various characteristic information detected by the HV unit 153 is output to the control unit 151.

The ESD unit 155 is a unit for inspecting whether or not electrostatic discharge is caused by applying a large voltage to the light emitting element 101 for an instant to cause electrostatic discharge.
The electrostatic breakdown information detected by the ESD unit 155 is output to the control unit 151.

The switching unit 157 switches between the HV unit 153 and the ESD unit 155.
The voltage applied to the light emitting element 101 via the probe needle 109 is changed by the switching unit 157. And by this change, the inspection item of the light emitting element 101 is changed to detect various characteristics at the rated voltage or to detect the presence or absence of electrostatic breakdown.

The control unit 151 comprehensively controls the operation of the optical measurement device 3.
The control unit 151 receives wavelength spectrum information, chromaticity information, and light amount information measured by the spectroscope 121. The control unit 151 receives various electrical characteristic information output by the HV unit 153. The control unit 151 receives the electrostatic breakdown information detected by the ESD unit 155.
The control unit 151 separates and analyzes various characteristics of the light emitting element 101 from these inputs. After analyzing the various characteristics, the control unit 151 outputs the analysis result from the output unit 163 such as image output. Furthermore, the control part 151 controls each component of the optical measuring device 3 as needed based on the analysis result.

<About optical attenuator>
The optical attenuator 123 will be described with reference to FIG.
FIG. 4 shows the configuration of the optical attenuator 123 included in the optical measurement device 3.
The optical attenuator 123 attenuates the light emitted from the light emitting element 101 and guides the attenuated light to the spectroscope 121.
The optical attenuator 123 can be configured using, for example, an electro-optic element.

As shown in FIG. 4, the optical attenuator 123 configured using the electro-optic element includes a polarizer 123a, a polarizer 123b, and a Pockels cell 123c.
The polarizer 123a and the polarizer 123b convert the polarization state of incident light into linearly polarized light. The polarizer 123a and the polarizer 123b are disposed so as to be substantially orthogonal to the incident light. The polarizer 123a and the polarizer 123b are arranged in a crossed Nicols state.

The Pockels cell 123c is formed of a birefringent material.
The Pockels cell 123c is disposed between the polarizer 123a and the polarizer 123b. The Pockels cell 123c is arranged so as to be substantially orthogonal to the incident light.

  The Pockels cell 123c is connected to a voltage source (not shown). The voltage source applies a voltage to the Pockels cell 123c so that an electric field is generated in the same direction as the traveling direction of incident light. The voltage source is connected to the control unit 151. The voltage source adjusts the voltage applied to the Pockels cell 123c in accordance with the control signal input from the control unit 151.

When a voltage is applied to the Pockels cell 123c from the voltage source, the refractive index is changed according to the applied voltage due to the electro-optic effect. For this reason, the Pockels cell 123c can modulate the phase of incident light converted into linearly polarized light by the polarizer 123a, and convert the incident light into elliptically polarized light with respect to retardation corresponding to the applied voltage.
The incident light converted into elliptically polarized light with respect to the retardation corresponding to the applied voltage by the Pockels cell 123c is converted into linearly polarized light by the polarizer 123b.
Therefore, since the optical attenuator 123 including the Pockels cell 123c can perform amplitude modulation through phase modulation of incident light according to the applied voltage, it can modulate the light intensity of the incident light according to the applied voltage.
Thereby, the optical attenuator 123 including the Pockels cell 123c can attenuate the incident light by an attenuation amount corresponding to the control signal input from the control unit 151.

The optical attenuator 123 may be configured using an electro-optical element including a car cell instead of the electro-optical element including the Pockels cell 123c. Furthermore, the optical attenuator 123 may be configured using a magneto-optical element, an acousto-optical element, a liquid crystal optical element, or the like instead of the electro-optical element.
Furthermore, the optical attenuator 123 may be configured by disposing a fiber coupling as a relay fiber connector on the optical transmission path 117b and providing an air gap in the fiber coupling.

The optical attenuator 123 may not include the Pockels cell 123c. The optical attenuator 123 may include two polarizers and an analyzer arranged in a crossed Nicol state. Then, the optical attenuator 123 converts the polarization state of the incident light by rotating the polarizer around an axis inclined by 45 ° with respect to the transmission axis of the polarizer, and converts it into linearly polarized light by the analyzer. And may be emitted. The optical attenuator 123 may include two polarizers. The two polarizers may be configured such that at least a polarizer located on the downstream side of the incident light is rotatable. Then, the optical attenuator 123 may attenuate the incident light by converting the polarization state into linearly polarized light with a polarizer located on the upstream side of the incident light and rotating the polarizer located on the downstream side.
The optical attenuator 123 also has a configuration that can reduce the attenuation amount to zero.

<Measurement performance of spectrometer>
The measurement performance of the spectroscope 121 will be described with reference to FIGS. 5A and 5B.
FIG. 5A shows the photoelectric conversion characteristics of the spectroscope 121.

In FIG. 5A, a thick line shows the relationship between the amount of incident light and the output current in the spectroscope 121. In FIG. 5A, the broken line indicates the relationship between the amount of incident light and the output current in the photodetector.
The fact that the input and output are in a proportional relationship is called “linearity”. The relationship between the amount of incident light and the output current in the spectroscope 121 indicates the photoelectric conversion characteristics of the spectroscope 121. That is, the linearity in the photoelectric conversion characteristics of the spectroscope 121 is that the incident light amount and the output current are in a proportional relationship. The linearity in the photoelectric conversion characteristics of the spectroscope 121 is an index indicating the measurement performance of the spectroscope 121.
As shown in FIG. 5A, it can be seen that the linearity in the photoelectric conversion characteristics of the spectroscope 121 is inferior to that of the photodetector.
Further, a range in which a proportional relationship between input and output is established is called “dynamic range”. The dynamic range is a range where linearity is established. The dynamic range in the photoelectric conversion characteristics of the spectroscope 121 is a range in which a proportional relationship between the incident light amount and the output current is established, and is a range in which linearity in the photoelectric conversion characteristics is established.
As shown in FIG. 5A, it can be seen that the dynamic range of the photoelectric conversion characteristics of the spectroscope 121 is narrower than that of the photodetector.

FIG. 5B shows an example of the spectral characteristics of the light emitting element measured by the spectroscope 121.
FIG. 5B shows an example in which the spectroscope 121 measures the spectral characteristics of an element that emits light in a specific wavelength region when power is supplied.
As shown in FIG. 5B, the spectroscope 121 has a relative intensity of 10% or less in a wavelength region shorter than 870 nm or a wavelength region larger than 1000 nm, which is a poor sensitivity. For this reason, the spectroscope 121 cannot measure the light quantity of light in a wavelength region shorter than 870 nm or in a wavelength region larger than 1000 nm. A black portion in FIG. 5B indicates a range where the light quantity cannot be measured by the spectroscope 121.
In order to obtain a light amount with a constant measurement accuracy, for example, when the spectroscope 121 is used in a relative intensity range of 20 to 80%, the spectroscope 121 can only emit light for light in the wavelength regions of 880 nm to 920 nm and 950 nm to 990 nm. It cannot be measured. This is because when the relative intensity is in the range of 20% or less or in the range of 80% or more, the linearity in the photoelectric conversion characteristics of the spectroscope 121 is lowered and the measurement accuracy is lowered. The shaded area in FIG. 5B indicates a range in which the spectroscope 121 can measure the amount of light.
Although not shown, since the dynamic range of the photoelectric conversion characteristics of the photodetector is sufficiently wide, at least light in the wavelength region of 800 nm to 1100 nm shown in FIG. 5B can often be measured with high accuracy. .

Thus, when measuring various optical characteristics of the light emitting element 101 with the spectroscope 121, the measurement result of the spectroscope 121 may be inaccurate depending on the amount of light incident on the spectroscope 121.
Therefore, a technique capable of measuring the optical characteristics of the light emitting element 101 with high reliability is desired.

In addition, the light emitting elements 101 of different types often have different light emission characteristics depending on the type. Therefore, when measuring the optical characteristics of light emitting elements 101 of different varieties, the amount of light incident on the spectroscope 121 is often different. Therefore, it is necessary to adjust the amount of incident light appropriately for each type of light emitting element 101.
However, adjusting the amount of light incident on the spectroscope 121 by changing the measurement environment for each type of the light emitting element 101 has a heavy load.

  For example, when adjusting the amount of light incident on the spectroscope 121 while keeping the light emission time of the light emitting element 101 constant, the distance between the optical fiber 117 and the light emitting element 101 may be changed. In this case, depending on the type of the light emitting element 101, the difference in the amount of light deviates by a factor of 100, so the distance between the optical fiber 117 and the light emitting element 101 may need to be changed by a factor of ten. The fact that the distance between the optical fiber 117 and the light emitting element 101 must be changed ten times is a great load. In particular, when the light emitting element 101 is a pseudo white light emitting diode, the chromaticity of the light emitted from the light emitting element 101 changes when the distance is changed, so that the measurement accuracy of the optical characteristics by the spectroscope 121 decreases.

Further, for example, when adjusting the amount of light incident on the spectroscope 121 while keeping the distance between the optical fiber 117 and the light emitting element 101 constant, the light emission time of the light emitting element 101 may be changed. In this case, since the temperature of the light emitting element 101 changes and the wavelength and the amount of light emitted from the light emitting element 101 change, the measurement accuracy of the optical characteristics by the spectroscope 121 decreases.
Therefore, there is a demand for a technique capable of measuring with high accuracy under the same measurement environment even when measuring the optical characteristics of light emitting elements 101 of different varieties.

<Regarding the processing of the control unit when measuring optical characteristics>
When measuring the optical characteristics of the light emitting element 101, the light emitted from the light emitting element 101 to be measured enters the optical fiber 117. The light incident on the optical fiber 117 is attenuated by the optical attenuator 123 and then guided to the spectroscope 121.
When the spectroscope 121 detects light guided through the optical attenuator 123, the spectroscope 121 measures various optical characteristics including the amount of the detected light. The spectroscope 121 outputs measurement results of various optical characteristics including the light amount to the control unit 151.
The control unit 151 that comprehensively controls the operation of the optical measurement apparatus 3 mainly performs the following processing when measuring the optical characteristics.

A process performed by the control unit 151 when measuring the optical characteristics will be described with reference to FIG.
FIG. 6 is a flowchart for explaining processing performed by the control unit 151 of the optical measurement device 3 when measuring optical characteristics.

In step S10, the control unit 151 determines whether or not the measurement result of the spectroscope 121 has been input.
The controller 151 stands by until the measurement result of the spectroscope 121 is input. On the other hand, if it is determined that the measurement result of the spectroscope 121 has been input, the control unit 151 stores it in a predetermined storage area. And the control part 151 transfers to step S20.

In step S <b> 20, the control unit 151 verifies the validity of the measurement result of the spectroscope 121 based on the light amount measurement result included in the measurement result of the spectroscope 121.
The control unit 151 can verify the validity of the measurement result of the spectroscope 121 by, for example, the following method.

  For example, the control unit 151 stores in advance a range of the light quantity measurement result of the spectroscope 121 that can be acquired within the dynamic range in the photoelectric conversion characteristics of the spectroscope 121. And the control part 151 determines whether the light quantity measurement result input by step S10 exists in the range of the light quantity measurement result memorize | stored previously. Then, the control unit 151 determines that the measurement result of the spectroscope 121 input in step S10 is valid if the light intensity measurement result input in step S10 is within the range of the light intensity measurement result stored in advance. To do. On the other hand, the control unit 151 determines that the measurement result of the spectroscope 121 input in step S10 is not valid if the light measurement result input in step S10 is not within the range of the light measurement result stored in advance. To do.

In step S30, the control unit 151 determines whether or not the measurement result of the spectroscope 121 is valid.
If it is determined by the verification in step S20 that the measurement result of the spectroscope 121 is valid, the control unit 151 proceeds to step S40. On the other hand, if it is determined by the verification in step S20 that the measurement result of the spectroscope 121 is not valid, the control unit 151 proceeds to step S60.

  In step S <b> 40, the control unit 151 validates the measurement result of the spectroscope 121.

In step S <b> 50, the control unit 151 outputs the measurement result of the spectroscope 121 to the output unit 163. And the control part 151 complete | finishes the measurement of an optical characteristic.
Information on the measurement result of the spectroscope 121 is output by the output unit 163.

  In step S60, the control unit 151 invalidates the measurement result of the spectroscope 121.

In step S <b> 70, the control unit 151 sets the attenuation amount of the optical attenuator 123.
The control unit 151 confirms the light quantity measurement result included in the measurement result of the spectroscope 121 invalidated in step S60. And the control part 151 calculates | requires the attenuation amount in the optical attenuator 123 based on the said light quantity measurement result. The control unit 151 outputs a control signal including the obtained attenuation amount to the optical attenuator 123 and sets the attenuation amount in the optical attenuator 123.
The control unit 151 can obtain the attenuation amount in the optical attenuator 123 by, for example, the following method. That is, the control unit 151 corresponds to the difference between the threshold value of the light quantity measurement result of the spectroscope 121 that can be acquired within the dynamic range in the photoelectric conversion characteristic of the spectroscope 121 and the light quantity measurement result invalidated in step S60. To determine the attenuation.

In step S80, the control unit 151 instructs the spectroscope 121 to perform measurement again.
The control unit 151 outputs a control signal to the spectroscope 121 and instructs the spectroscope 121 to perform measurement again.
In the remeasurement, the spectroscope 121 can detect the light attenuated by the attenuation set in step S70 and measure the optical characteristics. Then, the measurement result of the spectroscope 121 that has been measured again is input to the control unit 151 again and verified in step S20. Thereby, the measurement result of the spectroscope 121 output in step S50 is only the measurement with high reliability.

As described above, the optical measurement device 3 selectively validates the measurement result of the spectroscope 121 in consideration of the dynamic range in the photoelectric conversion characteristics of the spectroscope 121.
For this reason, the optical measuring device 3 can output only a reliable measurement result as valid when measuring the optical characteristics of the light emitting element 101.
Therefore, the measurement result of the optical characteristics of the optical measuring device 3 can obtain high reliability.

Furthermore, if the measurement result of the spectroscope 121 is not appropriate, the optical measuring device 3 can automatically adjust the incident light to the spectroscope 121 to an appropriate light amount. In the optical measurement device 3, the spectroscope 121 can measure the optical characteristics again using the incident light adjusted to an appropriate light amount.
For this reason, the optical measuring device 3 automatically keeps the amount of light incident on the spectroscope 121 appropriately, without changing the measurement environment, even when measuring the optical characteristics of the light emitting elements 101 having different emission characteristics. Can do.
Therefore, the optical measuring device 3 can measure the optical characteristics of the light emitting elements 101 of different varieties with high accuracy under the same measurement environment. The optical measuring device 3 can obtain a highly reliable measurement result with a simple configuration.

<Modification of Optical Measuring Device>
A modification of the optical measuring device 3 will be described with reference to FIGS.
In the configuration of the optical measuring device 3 shown in FIGS. 7 to 10, the description of the same configuration as the optical measuring device 3 shown in FIGS.

A first modification of the optical measuring device 3 will be described with reference to FIG.
FIG. 7 is a diagram for explaining a first modification of the optical measuring device 3.
The optical measurement device 3 of Modification 1 has a configuration in which an integrating sphere 108 is added to the optical measurement device 3 shown in FIGS.

The integrating sphere 108 is formed in a hollow, substantially spherical shape.
The integrating sphere 108 includes an inner wall 108a, an inlet 108b, and an outlet 108c.
The inner wall 108a forms an internal space of the integrating sphere 108. The inner wall 108a is formed of a material having high reflectivity and excellent diffusibility.
The inner wall 108a is provided with an inlet 108b and an outlet 108c.

The intake port 108b is an opening for capturing light emitted from the light emitting element 101 to be measured.
The size of the intake port 108b is sufficiently larger than the incident port 117c of the optical fiber 117.
The opening center axis of the intake port 108b substantially coincides with the light emission center axis LCA of the light emitting element 101 to be measured.
The intake port 108 b guides the light emitted from the light emitting element 101 to the inside of the integrating sphere 108. The light guided into the integrating sphere 108 from the inlet 108b is repeatedly reflected by the inner wall 108a and reaches the outlet 108c.

The outlet 108 c is an opening for taking out the light reflected by the inner wall 108 a to the outside of the integrating sphere 108.
The outlet 108c is provided at a position different from the inlet 108b of the inner wall 108a.
An optical fiber 117 is provided at the outlet 108c in FIG.
The outlet 108c in FIG. 7 guides the light reflected by the inner wall 108a to the optical fiber 117. The light guided to the optical fiber 117 enters the optical fiber 117 and is guided to the spectroscope 121 through the optical attenuator 123.

The optical measurement device 3 of Modification 1 captures the light emitted from the light emitting element 101 to be measured through the intake 108b of the integrating sphere 108 that is sufficiently larger than the entrance 117c of the optical fiber 117. Then, the optical measurement device 3 of the first modification causes the light taken in by the integrating sphere 108 to enter the optical fiber 117 provided in the outlet 108c. For this reason, the optical measuring device 3 of the modification 1 can detect more light with the spectroscope 121, and can measure the light quantity with higher accuracy.
Other configurations of the optical measurement device 3 of Modification 1 are the same as the configurations of the optical measurement device 3 shown in FIGS.

A second modification of the optical measuring device 3 will be described with reference to FIGS. 8 and 9.
FIG. 8 is a diagram for explaining a second modification of the optical measuring device 3. FIG. 9 is a flowchart for explaining processing performed by the control unit 151 shown in FIG. 8 when measuring optical characteristics.
The optical measurement device 3 of Modification 2 has a configuration in which an optical waveguide 120, a photodetector 105, and an amplifier 113 are added to the optical measurement device 3 of Modification 1 shown in FIG.

The optical waveguide 120 is provided on the optical transmission line 117b between the optical attenuator 123 and the head 117a of the optical fiber 117 provided with the incident port 117c.
The optical waveguide 120 branches the optical transmission path 117 b into a first path 117 d toward the spectroscope 121 and a second path 117 e toward the photodetector 105. The first path 117d is an optical transmission path 117b that connects the optical waveguide 120 and the spectroscope 121. The second path 117 e is an optical transmission path 117 b that connects between the optical waveguide 120 and the photodetector 105.
The optical waveguide 120 internally reflects incident light to suppress transmission loss as much as possible, and branches and guides the light to the first path 117d and the second path 117e. The light guided to the first path 117d and the second path 117e is guided to the spectroscope 121 and the photodetector 105, respectively.

The photodetector 105 detects the light emitted from the light emitting element 101 via the optical fiber 117 and the optical waveguide 120, and measures the optical characteristics thereof.
The optical characteristics measured by the photodetector 105 include at least the amount of light emitted from the light emitting element 101.
The photodetector 105 includes a light receiving element. When light enters the light receiving element, the photodetector 105 generates a charge corresponding to the incident light by photoelectric conversion. The light receiving element of the photodetector 105 is, for example, a photodiode.

  The photo detector 105 adds up all the light intensities of the incident light and obtains the amount of the incident light. The photodetector 105 generates an electrical signal according to the obtained light amount. The photodetector 105 outputs the generated electric signal to the amplifier 113 via the signal line 111. This electric signal corresponds to the light amount information measured by the photodetector 105.

  The amplifier 113 amplifies the electrical signal output from the photodetector 105 and outputs the amplified signal to the control unit 151.

The optical measurement device 3 of Modification 2 can measure the optical characteristics of the light emitting element 101 to be measured by the photodetector 105 and the spectroscope 121, respectively. In particular, the optical measurement device 3 of Modification 2 measures the amount of light with the photodetector 105 and measures the optical characteristics including the amount of light with the spectroscope 121.
The control unit 151 that comprehensively controls the operation of the optical measurement apparatus 3 performs a process that is partially different from the process illustrated in FIG.

A process performed by the control unit 151 included in the optical measurement device 3 according to the second modification when measuring optical characteristics will be described with reference to FIG.
Of the steps shown in FIG. 9, the description of the same processing as in FIG. 6 is omitted.

In step S <b> 10, the control unit 151 determines whether the light amount measurement result of the photodetector 105 and the measurement result of the spectroscope 121 are input.
The control unit 151 waits until the light amount measurement result of the photodetector 105 and the measurement result of the spectroscope 121 are input. On the other hand, if it is determined that the light amount measurement result of the photodetector 105 and the measurement result of the spectroscope 121 are input, the control unit 151 associates each result and stores them in a predetermined storage area. And the control part 151 transfers to step S20.

In step S <b> 20, the control unit 151 verifies the validity of the measurement result of the spectroscope 121 based on the light amount measurement result of the photodetector 105.
The control unit 151 can verify the validity of the measurement result of the spectroscope 121 by, for example, the following method.

  For example, the control unit 151 confirms the light quantity measurement result included in the measurement result of the spectroscope 121 input in step S10. And the control part 151 calculates | requires the difference of the said light quantity measurement result of the spectroscope 121, and the light quantity measurement result of the photodetector 105 input by step S10. Then, the control unit 151 determines whether or not the difference is within a predetermined allowable range. And the control part 151 will judge that the measurement result of the spectroscope 121 input by step S10 is appropriate if the said difference exists in the predetermined | prescribed tolerance | permissible_range. On the other hand, the control unit 151 determines that the measurement result of the spectroscope 121 input in step S10 is not valid if the difference is not within the predetermined allowable range.

  For example, the control unit 151 stores in advance a range of the light quantity measurement result of the spectroscope 121 that can be acquired within the dynamic range in the photoelectric conversion characteristics of the spectroscope 121. Then, the control unit 151 determines whether or not the light quantity measurement result of the photodetector 105 input in step S10 is within the range of the light quantity measurement result of the spectroscope 121 stored in advance. Then, if the light amount measurement result of the photodetector 105 input in step S10 is within the range of the light amount measurement result of the spectroscope 121 stored in advance, the control unit 151 of the spectroscope 121 input in step S10. The measurement result is judged to be appropriate. On the other hand, if the light quantity measurement result of the photodetector 105 input in step S10 is not within the range of the light quantity measurement result of the spectroscope 121 stored in advance, the control unit 151 of the spectroscope 121 input in step S10. Judge that the measurement results are not valid.

  In step S30 to step S60, the control unit 151 performs the same process as in FIG.

In step S <b> 70, the control unit 151 sets the attenuation amount of the optical attenuator 123.
The control unit 151 confirms the measurement result of the spectroscope 121 invalidated in step S60 and the light amount measurement result of the photodetector 105 associated with the result. And the control part 151 calculates | requires the attenuation amount in the optical attenuator 123 based on the said light quantity measurement result. The control unit 151 outputs a control signal including the obtained attenuation amount to the optical attenuator 123 and sets the attenuation amount in the optical attenuator 123.
The control unit 151 can obtain the attenuation amount in the optical attenuator 123 by, for example, the following method.

  For example, when the control unit 151 obtains and verifies the difference between the light amount measurement result of the spectroscope 121 and the light amount measurement result of the photodetector 105 in the verification in step S20, the difference is within the allowable range of the difference. Find the amount of attenuation that will fit.

  Further, for example, in the verification in step S20, when the verification is performed using the range of the light quantity measurement result of the spectroscope 121 that can be acquired within the dynamic range in the photoelectric conversion characteristics of the spectroscope 121, the following is performed. Asking. That is, the control unit 151 determines the attenuation amount in the optical attenuator 123 according to the difference between the threshold value in the range and the light amount measurement result of the photodetector 105.

In step S80, the control unit 151 instructs the photodetector 105 and the spectroscope 121 to perform measurement again.
The control unit 151 outputs a control signal to the photo detector 105 and the spectroscope 121 and instructs the photo detector 105 and the spectroscope 121 to perform measurement again.

As described above, the optical measurement device 3 according to Modification 2 selectively validates the measurement result of the spectroscope 121 based on the light amount measurement result measured by the photodetector 105 having a wider dynamic range than the spectroscope 121.
For this reason, the optical measuring device 3 of the modified example 2 can output only a more reliable measurement result as effective when measuring the optical characteristics of the light emitting element 101.
Therefore, the measurement result of the optical characteristics of the optical measurement device 3 of the modification 2 can obtain higher reliability.
Other configurations of the optical measurement device 3 of Modification 2 are the same as those of the optical measurement device 3 of Modification 1 shown in FIG.

A third modification of the optical measuring device 3 will be described with reference to FIG.
FIG. 10 is a diagram for explaining a third modification of the optical measuring device 3.
The optical measurement device 3 of Modification 3 has a configuration in which the photodetectors 105 included in the optical measurement device 3 of Modification 2 shown in FIGS. 8 and 9 are arranged at different positions.

The optical measurement device 3 of Modification 3 does not include the optical waveguide 120.
The optical transmission line 117 b of the optical fiber 117 is not branched and is connected only to the optical attenuator 123 and the spectroscope 121.
The photodetector 105 is provided on the inner wall 108 a of the integrating sphere 108. The position of the photodetector 105 on the inner wall 108a is a position where the intake port 108b and the intake port 108c are not arranged.

  The light emitted from the light emitting element 101 to be measured is guided into the integrating sphere 108 from the intake 108b. The light guided into the integrating sphere 108 from the inlet 108 b is repeatedly reflected by the inner wall 108 a and is incident on the optical fiber 117 and the photodetector 105. Then, after the light is attenuated by the optical attenuator 123, the spectroscope 121 measures the chromaticity and the like, and the photodetector 105 measures the amount of light.

The optical measuring device 3 of Modification 3 directly detects the light taken in by the integrating sphere 108 with the photodetector 105 provided on the inner wall 108a without branching the light incident on the optical fiber 117, and measures the amount of light.
For this reason, the optical measuring device 3 of the modification 3 can detect more light with the photodetector 105, and can measure the light quantity with higher accuracy.
Other configurations of the optical measurement device 3 of Modification 3 are the same as those of the optical measurement device 3 of Modification 2 shown in FIGS. 8 and 9.

  It will be apparent to those skilled in the art that the embodiments described above can apply each other's techniques to each other, including modifications.

  The above description is intended to be illustrative only and not limiting. Thus, it will be apparent to one skilled in the art that modifications may be made to the embodiments of the present invention without departing from the scope of the appended claims.

  Terms used throughout this specification and the appended claims should be construed as "non-limiting" terms. For example, the terms “include” or “included” should be interpreted as “not limited to those described as included”. The term “comprising” should be interpreted as “not limited to what is described as having”. Also, the indefinite article “a” or “an” in the specification and the appended claims should be interpreted to mean “at least one” or “one or more”.

<Configuration and Effect of Embodiment>
In the optical measuring device 3 of the present embodiment, an optical attenuator 123 that attenuates light emitted from the light emitting element 101, a spectroscope 121 that measures optical characteristics of the light attenuated by the optical attenuator 123, and the light emitting element 101 emit light. And a control unit 151 that sets an attenuation amount of the optical attenuator 123 based on the light amount of the light.
With such a configuration, the optical measurement device 3 can enter the spectroscope 121 without changing the measurement environment even when measuring the optical characteristics of the light emitting elements 101 having different emission characteristics without using complicated means. The amount of light can be kept appropriate. The optical measuring device 3 can obtain a highly reliable measurement result with a simple configuration.

In addition, the optical measuring device 3 according to the present embodiment includes light including an incident port 117c into which light emitted from the light emitting element 101 is incident and an optical transmission path 117b that guides light incident from the incident port 117c to the spectroscope 121. The optical attenuator 123 may be disposed on the optical transmission path 117b between the incident port 117c and the spectroscope 121.
With such a configuration, the optical measurement device 3 can appropriately maintain the amount of light incident on the spectrometer 121 without changing the measurement environment even when measuring the optical characteristics of the light-emitting elements 101 having different emission characteristics. The apparatus can be realized with a simpler configuration. The optical measuring device 3 can obtain a highly reliable measurement result with a simpler configuration.

Further, in the optical measurement device 3 of the present embodiment, the control unit 151 may set the attenuation amount of the optical attenuator 123 based on the amount of light that is one of the optical characteristics measured by the spectroscope 121.
With such a configuration, the optical measurement device 3 can enter the spectroscope 121 without changing the measurement environment even when measuring the optical characteristics of the light emitting elements 101 having different emission characteristics without using complicated means. The amount of light can be kept more appropriate. The optical measuring device 3 can obtain a more reliable measurement result with a simple configuration.

In addition, the optical measuring device 3 of the present embodiment has a dynamic range wider than that of the spectroscope 121 and includes a photodetector 105 that measures the amount of light emitted from the light emitting element 101, and the controller 151 measures the amount of light measured by the photodetector 105. Based on the above, the attenuation amount of the optical attenuator 123 may be set.
With such a configuration, the optical measurement device 3 can enter the spectroscope 121 without changing the measurement environment even when measuring the optical characteristics of the light emitting elements 101 having different emission characteristics without using complicated means. The amount of light can be kept more appropriate. And the optical measuring device 3 can obtain a more reliable measurement result with a simple configuration.

Further, in the optical measuring device 3 of the present embodiment, the optical transmission path 117b of the optical fiber 117 is branched toward the photodetector 105 between the incident port 117c and the optical attenuator 123, and the incident light is branched and spectrally separated. The light may be guided to the detector 121 and the photodetector 105.
With such a configuration, the optical measurement device 3 can appropriately maintain the amount of light incident on the spectrometer 121 without changing the measurement environment even when measuring the optical characteristics of the light-emitting elements 101 having different emission characteristics. The apparatus can be realized with a simpler configuration. The optical measuring device 3 can obtain a highly reliable measurement result with a simpler configuration.

Further, the optical measuring device 3 of the present embodiment includes an integrating sphere 108 that takes in the light emitted from the light emitting element 101, and the optical fiber 117 enters the light taken into the integrating sphere 108 from the incident port 117c. The photodetector 105 may measure the amount of light taken into the integrating sphere 108.
With such a configuration, the optical measurement device 3 can enter the spectroscope 121 without changing the measurement environment even when measuring the optical characteristics of the light emitting elements 101 having different emission characteristics without using complicated means. The amount of light can be kept more appropriate. The optical measuring device 3 can obtain a highly accurate and reliable measurement result with a simple configuration.

<Definition etc.>
The “dynamic range” is a range in which a proportional relationship between input and output is established.
An example of the “dynamic range” of the present invention is the dynamic range in the photoelectric conversion characteristics of the “measuring device” or “light quantity measuring device”. The dynamic range in the photoelectric conversion characteristics is a range in which a proportional relationship between the incident light amount and the output current is established.
An example of the “measuring device” of the present invention is a spectroscope 121.
An example of the “light quantity measuring device” of the present invention is a photodetector 105.
An example of the “control unit” of the present invention is the control unit 151.
An example of the “optical attenuator” of the present invention is an optical attenuator 123.
An example of the “light guide tube” of the present invention is an optical fiber 117.
An example of the “incident port” of the present invention is the incident port 117c.
An example of the “optical transmission line” in the present invention is the optical transmission line 117b.
An example of the “integrating sphere” of the present invention is the integrating sphere 108.

DESCRIPTION OF SYMBOLS 3 Optical measuring device 101 Light emitting element 105 Photodetector 108 Integrating sphere 117 Optical fiber 117a Head 117b Optical transmission path 117c Entrance 117d First path 117e Second path 120 Optical waveguide 121 Spectroscope 123 Optical attenuator 151 Control part

An optical measuring apparatus according to claim 1 of the present invention includes an optical attenuator that attenuates light emitted from a light emitting element, a measuring instrument that measures optical characteristics of light attenuated by the optical attenuator, and the light emitting element emits light. A control unit that sets the attenuation amount of the optical attenuator based on the amount of light that has been emitted; an incident port through which the light emitted from the light emitting element is incident; and the light incident from the incident port is guided to the measuring device. And a light guide tube including an optical transmission path, wherein the optical attenuator is disposed on the optical transmission path between the entrance and the measuring instrument, and an air gap is provided in the optical transmission path. Consists of .

Claims (6)

An optical attenuator that attenuates the light emitted by the light emitting element;
A measuring instrument for measuring optical characteristics of light attenuated by the optical attenuator;
A control unit for setting the attenuation amount of the optical attenuator based on the amount of light emitted by the light emitting element;
An optical measuring device. A light guide tube including an incident port on which light emitted from the light emitting element is incident, and an optical transmission path that guides the light incident from the incident port to the measuring instrument;
The optical measurement apparatus according to claim 1, wherein the optical attenuator is disposed on the optical transmission path between the entrance and the measurement device. The optical measurement apparatus according to claim 2, wherein the control unit sets an attenuation amount of the optical attenuator based on an amount of light that is one of optical characteristics measured by the measurement device. The dynamic range is wider than the measuring instrument, and includes a light amount measuring device that measures the amount of light emitted by the light emitting element,
The optical measurement apparatus according to claim 2, wherein the control unit sets an attenuation amount of the optical attenuator based on the light amount measured by the light amount measuring device. The optical transmission path of the light guide tube is
Branched between the entrance and the optical attenuator toward the light amount measuring device,
The optical measuring device according to claim 4, wherein the incident light is branched and guided to the measuring device and the light amount measuring device. An integrating sphere that takes in the light emitted by the light emitting element;
The light guide tube enters the light taken into the integrating sphere from the entrance,
The optical measurement device according to claim 4, wherein the light amount measuring device measures a light amount of light taken into the integrating sphere.

Images