JPS6476544A - Device for testing semiconductor laser driving circuit - Google Patents

Device for testing semiconductor laser driving circuit

Info

Publication number
JPS6476544A
JPS6476544A JP62235271A JP23527187A JPS6476544A JP S6476544 A JPS6476544 A JP S6476544A JP 62235271 A JP62235271 A JP 62235271A JP 23527187 A JP23527187 A JP 23527187A JP S6476544 A JPS6476544 A JP S6476544A
Authority
JP
Japan
Prior art keywords
semiconductor laser
driving circuit
laser driving
test
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62235271A
Other languages
Japanese (ja)
Inventor
Kazuoki Otani
Yoshihiko Honshiyouya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Mobile Communications Co Ltd
Original Assignee
Matsushita Communication Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Communication Industrial Co Ltd filed Critical Matsushita Communication Industrial Co Ltd
Priority to JP62235271A priority Critical patent/JPS6476544A/en
Publication of JPS6476544A publication Critical patent/JPS6476544A/en
Pending legal-status Critical Current

Links

Landscapes

  • Semiconductor Lasers (AREA)
  • Optical Head (AREA)

Abstract

PURPOSE:To enable the test of a semiconductor laser driving circuit to be performed even in a state where a semicondoctor laser may be damaged by performing the test by connecting an artificial circuit in which the characteristic of the driving current of the semiconductor laser is analogous to that of the output current of a photodiode for monitoring the semiconductor laser to the semiconductor laser driving circuit. CONSTITUTION:The test of the semiconductor laser driving circuit 11 is performed by connecting the artificial circuit 13 to the semiconductor laser driving circuit 11. The artificial semiconductor laser driving circuit 13 is constituted of a photocoupler 13a, a resistor r1 connected to the light emitting part of the photocoupler 13a in parallel, and a resistor r2 connected in series, and those members are selected so that the characteristic of the driving current of the semiconductor laser 15 which becomes a base is analogous to that of the output current of the photodiode 16 for monitoring the optical output of the semiconductor laser. In such a way, it is possible to perform the test of the semiconductor laser driving circuit 11 without using the semiconductor laser damaged due to overcurrent or surge current, etc.
JP62235271A 1987-09-18 1987-09-18 Device for testing semiconductor laser driving circuit Pending JPS6476544A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62235271A JPS6476544A (en) 1987-09-18 1987-09-18 Device for testing semiconductor laser driving circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62235271A JPS6476544A (en) 1987-09-18 1987-09-18 Device for testing semiconductor laser driving circuit

Publications (1)

Publication Number Publication Date
JPS6476544A true JPS6476544A (en) 1989-03-22

Family

ID=16983625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62235271A Pending JPS6476544A (en) 1987-09-18 1987-09-18 Device for testing semiconductor laser driving circuit

Country Status (1)

Country Link
JP (1) JPS6476544A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004200213A (en) * 2002-12-16 2004-07-15 Sony Corp Protective circuit of semiconductor laser and apparatus for measuring semiconductor laser having the same
JP2005197485A (en) * 2004-01-08 2005-07-21 Ricoh Co Ltd Test method of integrated circuit for laser diode driver
US8714564B2 (en) 2010-10-26 2014-05-06 Nippon Gasket Co., Ltd. Cylinder head gasket

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004200213A (en) * 2002-12-16 2004-07-15 Sony Corp Protective circuit of semiconductor laser and apparatus for measuring semiconductor laser having the same
JP2005197485A (en) * 2004-01-08 2005-07-21 Ricoh Co Ltd Test method of integrated circuit for laser diode driver
US8714564B2 (en) 2010-10-26 2014-05-06 Nippon Gasket Co., Ltd. Cylinder head gasket

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