JPS6476544A - Device for testing semiconductor laser driving circuit - Google Patents
Device for testing semiconductor laser driving circuitInfo
- Publication number
- JPS6476544A JPS6476544A JP62235271A JP23527187A JPS6476544A JP S6476544 A JPS6476544 A JP S6476544A JP 62235271 A JP62235271 A JP 62235271A JP 23527187 A JP23527187 A JP 23527187A JP S6476544 A JPS6476544 A JP S6476544A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- driving circuit
- laser driving
- test
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Lasers (AREA)
- Optical Head (AREA)
Abstract
PURPOSE:To enable the test of a semiconductor laser driving circuit to be performed even in a state where a semicondoctor laser may be damaged by performing the test by connecting an artificial circuit in which the characteristic of the driving current of the semiconductor laser is analogous to that of the output current of a photodiode for monitoring the semiconductor laser to the semiconductor laser driving circuit. CONSTITUTION:The test of the semiconductor laser driving circuit 11 is performed by connecting the artificial circuit 13 to the semiconductor laser driving circuit 11. The artificial semiconductor laser driving circuit 13 is constituted of a photocoupler 13a, a resistor r1 connected to the light emitting part of the photocoupler 13a in parallel, and a resistor r2 connected in series, and those members are selected so that the characteristic of the driving current of the semiconductor laser 15 which becomes a base is analogous to that of the output current of the photodiode 16 for monitoring the optical output of the semiconductor laser. In such a way, it is possible to perform the test of the semiconductor laser driving circuit 11 without using the semiconductor laser damaged due to overcurrent or surge current, etc.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62235271A JPS6476544A (en) | 1987-09-18 | 1987-09-18 | Device for testing semiconductor laser driving circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62235271A JPS6476544A (en) | 1987-09-18 | 1987-09-18 | Device for testing semiconductor laser driving circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6476544A true JPS6476544A (en) | 1989-03-22 |
Family
ID=16983625
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62235271A Pending JPS6476544A (en) | 1987-09-18 | 1987-09-18 | Device for testing semiconductor laser driving circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6476544A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004200213A (en) * | 2002-12-16 | 2004-07-15 | Sony Corp | Protective circuit of semiconductor laser and apparatus for measuring semiconductor laser having the same |
JP2005197485A (en) * | 2004-01-08 | 2005-07-21 | Ricoh Co Ltd | Test method of integrated circuit for laser diode driver |
US8714564B2 (en) | 2010-10-26 | 2014-05-06 | Nippon Gasket Co., Ltd. | Cylinder head gasket |
-
1987
- 1987-09-18 JP JP62235271A patent/JPS6476544A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004200213A (en) * | 2002-12-16 | 2004-07-15 | Sony Corp | Protective circuit of semiconductor laser and apparatus for measuring semiconductor laser having the same |
JP2005197485A (en) * | 2004-01-08 | 2005-07-21 | Ricoh Co Ltd | Test method of integrated circuit for laser diode driver |
US8714564B2 (en) | 2010-10-26 | 2014-05-06 | Nippon Gasket Co., Ltd. | Cylinder head gasket |
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