JPS6473600A - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
JPS6473600A
JPS6473600A JP62229535A JP22953587A JPS6473600A JP S6473600 A JPS6473600 A JP S6473600A JP 62229535 A JP62229535 A JP 62229535A JP 22953587 A JP22953587 A JP 22953587A JP S6473600 A JPS6473600 A JP S6473600A
Authority
JP
Japan
Prior art keywords
circuit
signal
writing
reading
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62229535A
Other languages
Japanese (ja)
Inventor
Osami Nagano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62229535A priority Critical patent/JPS6473600A/en
Publication of JPS6473600A publication Critical patent/JPS6473600A/en
Pending legal-status Critical Current

Links

Landscapes

  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To increase the simultaneously measurable items by an IC tester by being equipped with test circuit to contain an switching circuit to selectively switch the output of a reading circuit and the input of a writing circuit to one external terminal. CONSTITUTION:The reading circuit having the coincidence detecting function of all the bits of a reading signal composed of plural bits and a writing circuit WA to receive a signal of one bit and to form a writing signal of the same plural bits are provided and the test circuit to selectively switch the output of the reading circuit and the input of the writing circuit WA to one of external terminals D0-D7 by switching circuits S0-S7 is built into a RAM. Consequently, a test in units of the plural bits can be attained by one signal from the outside of the RAM. Thus, the simultaneously measurable items by the IC tester can be increased.
JP62229535A 1987-09-16 1987-09-16 Semiconductor memory device Pending JPS6473600A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62229535A JPS6473600A (en) 1987-09-16 1987-09-16 Semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62229535A JPS6473600A (en) 1987-09-16 1987-09-16 Semiconductor memory device

Publications (1)

Publication Number Publication Date
JPS6473600A true JPS6473600A (en) 1989-03-17

Family

ID=16893692

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62229535A Pending JPS6473600A (en) 1987-09-16 1987-09-16 Semiconductor memory device

Country Status (1)

Country Link
JP (1) JPS6473600A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0337900A (en) * 1989-07-04 1991-02-19 Fujitsu Ltd Semiconductor memory device
JP2005276426A (en) * 2004-03-23 2005-10-06 Samsung Electronics Co Ltd Memory module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0337900A (en) * 1989-07-04 1991-02-19 Fujitsu Ltd Semiconductor memory device
JP2005276426A (en) * 2004-03-23 2005-10-06 Samsung Electronics Co Ltd Memory module

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