JPS6466575A - Ic latch-up evaluating apparatus - Google Patents

Ic latch-up evaluating apparatus

Info

Publication number
JPS6466575A
JPS6466575A JP62223666A JP22366687A JPS6466575A JP S6466575 A JPS6466575 A JP S6466575A JP 62223666 A JP62223666 A JP 62223666A JP 22366687 A JP22366687 A JP 22366687A JP S6466575 A JPS6466575 A JP S6466575A
Authority
JP
Japan
Prior art keywords
latch
measured
control signal
signal
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62223666A
Other languages
Japanese (ja)
Inventor
Yukihiro Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP62223666A priority Critical patent/JPS6466575A/en
Publication of JPS6466575A publication Critical patent/JPS6466575A/en
Pending legal-status Critical Current

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  • Lasers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To search for a place easy to generate latch-up, by providing a pattern generator for supplying a signal for fixing the logic o an IC to be measured to a desired state to the IC to be measured. CONSTITUTION:The output voltage of a power supply 107 is set to a predetermined value by a control signal (d) and the input and output terminals of a detection means 106 are made conductive by a control signal (a) to drive an IC 104 to be measured. Next, a pattern generator 105 is driven by a control signal (e) to hold the logic in the IC 104 to a desired state. Subsequently, a light power is set to an initial state and the desired position of the IC 104 is irradiated with light beam on the basis of a control signal (g). The detection means 106 detects the generating of latch-up to send a latch-up generation signal (c) to a controller 108. The controller 108 performs data processing. By this method, latch-up sensitivity is measured with respect to the total or desired region of the IC 104 while the light irradiation position is changed to make it possible to accurately search for position easy to generate latch-up.
JP62223666A 1987-09-07 1987-09-07 Ic latch-up evaluating apparatus Pending JPS6466575A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62223666A JPS6466575A (en) 1987-09-07 1987-09-07 Ic latch-up evaluating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62223666A JPS6466575A (en) 1987-09-07 1987-09-07 Ic latch-up evaluating apparatus

Publications (1)

Publication Number Publication Date
JPS6466575A true JPS6466575A (en) 1989-03-13

Family

ID=16801748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62223666A Pending JPS6466575A (en) 1987-09-07 1987-09-07 Ic latch-up evaluating apparatus

Country Status (1)

Country Link
JP (1) JPS6466575A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010538289A (en) * 2007-09-06 2010-12-09 ヨーロピアン・アエロノーティック・ディフェンス・アンド・スペース・カンパニー・イーデス・フランス A method for characterizing the susceptibility of electronic components to active interactions

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010538289A (en) * 2007-09-06 2010-12-09 ヨーロピアン・アエロノーティック・ディフェンス・アンド・スペース・カンパニー・イーデス・フランス A method for characterizing the susceptibility of electronic components to active interactions

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