JPS6466575A - Ic latch-up evaluating apparatus - Google Patents
Ic latch-up evaluating apparatusInfo
- Publication number
- JPS6466575A JPS6466575A JP62223666A JP22366687A JPS6466575A JP S6466575 A JPS6466575 A JP S6466575A JP 62223666 A JP62223666 A JP 62223666A JP 22366687 A JP22366687 A JP 22366687A JP S6466575 A JPS6466575 A JP S6466575A
- Authority
- JP
- Japan
- Prior art keywords
- latch
- measured
- control signal
- signal
- logic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Lasers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To search for a place easy to generate latch-up, by providing a pattern generator for supplying a signal for fixing the logic o an IC to be measured to a desired state to the IC to be measured. CONSTITUTION:The output voltage of a power supply 107 is set to a predetermined value by a control signal (d) and the input and output terminals of a detection means 106 are made conductive by a control signal (a) to drive an IC 104 to be measured. Next, a pattern generator 105 is driven by a control signal (e) to hold the logic in the IC 104 to a desired state. Subsequently, a light power is set to an initial state and the desired position of the IC 104 is irradiated with light beam on the basis of a control signal (g). The detection means 106 detects the generating of latch-up to send a latch-up generation signal (c) to a controller 108. The controller 108 performs data processing. By this method, latch-up sensitivity is measured with respect to the total or desired region of the IC 104 while the light irradiation position is changed to make it possible to accurately search for position easy to generate latch-up.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62223666A JPS6466575A (en) | 1987-09-07 | 1987-09-07 | Ic latch-up evaluating apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62223666A JPS6466575A (en) | 1987-09-07 | 1987-09-07 | Ic latch-up evaluating apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6466575A true JPS6466575A (en) | 1989-03-13 |
Family
ID=16801748
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62223666A Pending JPS6466575A (en) | 1987-09-07 | 1987-09-07 | Ic latch-up evaluating apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6466575A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010538289A (en) * | 2007-09-06 | 2010-12-09 | ヨーロピアン・アエロノーティック・ディフェンス・アンド・スペース・カンパニー・イーデス・フランス | A method for characterizing the susceptibility of electronic components to active interactions |
-
1987
- 1987-09-07 JP JP62223666A patent/JPS6466575A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010538289A (en) * | 2007-09-06 | 2010-12-09 | ヨーロピアン・アエロノーティック・ディフェンス・アンド・スペース・カンパニー・イーデス・フランス | A method for characterizing the susceptibility of electronic components to active interactions |
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