JPS64614Y2 - - Google Patents
Info
- Publication number
- JPS64614Y2 JPS64614Y2 JP4263184U JP4263184U JPS64614Y2 JP S64614 Y2 JPS64614 Y2 JP S64614Y2 JP 4263184 U JP4263184 U JP 4263184U JP 4263184 U JP4263184 U JP 4263184U JP S64614 Y2 JPS64614 Y2 JP S64614Y2
- Authority
- JP
- Japan
- Prior art keywords
- burn
- microcomputer
- leakage current
- board
- yamba
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 11
- 239000004020 conductor Substances 0.000 claims description 7
- 230000001052 transient effect Effects 0.000 claims description 4
- 230000004913 activation Effects 0.000 claims description 2
- 238000012360 testing method Methods 0.000 description 9
- 230000006866 deterioration Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4263184U JPS60152972U (ja) | 1984-03-21 | 1984-03-21 | バ−ンイン装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4263184U JPS60152972U (ja) | 1984-03-21 | 1984-03-21 | バ−ンイン装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60152972U JPS60152972U (ja) | 1985-10-11 |
| JPS64614Y2 true JPS64614Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-01-09 |
Family
ID=30553566
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4263184U Granted JPS60152972U (ja) | 1984-03-21 | 1984-03-21 | バ−ンイン装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60152972U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018207270A1 (ja) * | 2017-05-09 | 2018-11-15 | 株式会社ダイチューテクノロジーズ | 記憶媒体の評価試験装置 |
-
1984
- 1984-03-21 JP JP4263184U patent/JPS60152972U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60152972U (ja) | 1985-10-11 |
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