JPS6457644U - - Google Patents

Info

Publication number
JPS6457644U
JPS6457644U JP15259387U JP15259387U JPS6457644U JP S6457644 U JPS6457644 U JP S6457644U JP 15259387 U JP15259387 U JP 15259387U JP 15259387 U JP15259387 U JP 15259387U JP S6457644 U JPS6457644 U JP S6457644U
Authority
JP
Japan
Prior art keywords
contact pin
power supply
holes
pins
power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15259387U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15259387U priority Critical patent/JPS6457644U/ja
Publication of JPS6457644U publication Critical patent/JPS6457644U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15259387U 1987-10-05 1987-10-05 Pending JPS6457644U (US20090163788A1-20090625-C00002.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15259387U JPS6457644U (US20090163788A1-20090625-C00002.png) 1987-10-05 1987-10-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15259387U JPS6457644U (US20090163788A1-20090625-C00002.png) 1987-10-05 1987-10-05

Publications (1)

Publication Number Publication Date
JPS6457644U true JPS6457644U (US20090163788A1-20090625-C00002.png) 1989-04-10

Family

ID=31427661

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15259387U Pending JPS6457644U (US20090163788A1-20090625-C00002.png) 1987-10-05 1987-10-05

Country Status (1)

Country Link
JP (1) JPS6457644U (US20090163788A1-20090625-C00002.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008300481A (ja) * 2007-05-30 2008-12-11 Micronics Japan Co Ltd 半導体検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008300481A (ja) * 2007-05-30 2008-12-11 Micronics Japan Co Ltd 半導体検査装置

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