JPS6453973U - - Google Patents
Info
- Publication number
- JPS6453973U JPS6453973U JP1987149575U JP14957587U JPS6453973U JP S6453973 U JPS6453973 U JP S6453973U JP 1987149575 U JP1987149575 U JP 1987149575U JP 14957587 U JP14957587 U JP 14957587U JP S6453973 U JPS6453973 U JP S6453973U
- Authority
- JP
- Japan
- Prior art keywords
- contact probe
- top plate
- probe pin
- mounting frame
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987149575U JPH0540458Y2 (en:Method) | 1987-09-30 | 1987-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987149575U JPH0540458Y2 (en:Method) | 1987-09-30 | 1987-09-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6453973U true JPS6453973U (en:Method) | 1989-04-03 |
| JPH0540458Y2 JPH0540458Y2 (en:Method) | 1993-10-14 |
Family
ID=31421927
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987149575U Expired - Lifetime JPH0540458Y2 (en:Method) | 1987-09-30 | 1987-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0540458Y2 (en:Method) |
-
1987
- 1987-09-30 JP JP1987149575U patent/JPH0540458Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0540458Y2 (en:Method) | 1993-10-14 |