JPS645176U - - Google Patents
Info
- Publication number
- JPS645176U JPS645176U JP9735887U JP9735887U JPS645176U JP S645176 U JPS645176 U JP S645176U JP 9735887 U JP9735887 U JP 9735887U JP 9735887 U JP9735887 U JP 9735887U JP S645176 U JPS645176 U JP S645176U
- Authority
- JP
- Japan
- Prior art keywords
- data
- circuit board
- circuit
- serial
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 4
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Description
第１図は本考案の一実施例を示すブロツク図で
ある。
２……入出力制御群、３……アナログ信号測定
群、４……被検査群、１０……中央処理装置、１
１……波形観測装置、１２……アナログ信号量計
測装置、１３……被検査ボード、２０……電源回
路、２１……直列・並列変換回路、２２……論理
データ出力回路、２３……論理データ入力回路、
２４……拡張バス供給回路、２５……波形観測信
号選択回路、２６……特殊回路、１００……シス
テムバス、１０１……パラレルバス、１０２……
拡張バス、２００……特殊信号線、２０１……電
源供給線、２０２……シリアル伝送線、２０３…
…論理データ出力線、２０４……論理データ入力
線、２０５……アナログ信号入力線、２０６……
波形観測信号入力線。
FIG. 1 is a block diagram showing one embodiment of the present invention. 2...Input/output control group, 3...Analog signal measurement group, 4...Test group, 10...Central processing unit, 1
DESCRIPTION OF SYMBOLS 1...Waveform observation device, 12...Analog signal amount measuring device, 13...Board to be inspected, 20...Power supply circuit, 21...Serial/parallel conversion circuit, 22...Logic data output circuit, 23...Logic data input circuit,
24...Expansion bus supply circuit, 25...Waveform observation signal selection circuit, 26...Special circuit, 100...System bus, 101...Parallel bus, 102...
Expansion bus, 200...Special signal line, 201...Power supply line, 202...Serial transmission line, 203...
...Logic data output line, 204...Logic data input line, 205...Analog signal input line, 206...
Waveform observation signal input line.
Claims (1)
判定するボード検査装置において、 並列データを直列データに変換して前記回路基
板に出力し、前記回路基板からの直列データを並
列データに変換して出力する直列・並列変換回路
と、 前記回路基板に論理データを出力する論理デー
タ出力回路と、 前記回路基板から論理データを受け取る論理デ
ータ入力回路と、 前記回路基板が出力するアナログ信号を測定す
るアナログ信号測定手段と、 前記直列・並列変換回路により並列データであ
る検査用データを直列データに変換して前記回路
基板に入力し、この時回路基板が出力する直列デ
ータを前記直列・並列変換回路により並列データ
に変換して受信し、この受信した並列データと前
記検査用データとを比較して前記回路基板の良否
を判定する第１の制御手段と、 前記論理データ出力回路を通して前記回路基板
に検査用データを入力し、この時回路基板が出力
するデータを前記論理データ入力回路を通して受
信し、この受信したデータと前記検査用データと
を比較して前記回路基板の良否を判定する第２の
制御手段と、 前記アナログ信号測定手段による前記回路基板
からのアナログ信号の測定結果をもとに回路基板
の良否を判定する第３の制御手段とを備えたこと
を特徴とするボード検査装置。[Claims for Utility Model Registration] In a board inspection device that determines the electrical quality of a circuit board on which circuit components are mounted, parallel data is converted to serial data and outputted to the circuit board, and serial data from the circuit board is a serial/parallel conversion circuit that converts data into parallel data and outputs it; a logic data output circuit that outputs logic data to the circuit board; a logic data input circuit that receives logic data from the circuit board; an analog signal measuring means for measuring an analog signal to be output; and converting inspection data, which is parallel data, into serial data using the serial/parallel converting circuit and inputting the serial data to the circuit board, and at this time, serial data output by the circuit board. a first control means that receives the parallel data converted into parallel data by the serial/parallel conversion circuit, and compares the received parallel data with the inspection data to determine the quality of the circuit board; and the logic data. Test data is input to the circuit board through an output circuit, data output from the circuit board at this time is received through the logic data input circuit, and the received data is compared with the test data to determine the quality of the circuit board. A second control means for determining the quality of the circuit board; and a third control means for determining the quality of the circuit board based on the measurement result of the analog signal from the circuit board by the analog signal measurement means. board inspection equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9735887U JPS645176U (en) | 1987-06-26 | 1987-06-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9735887U JPS645176U (en) | 1987-06-26 | 1987-06-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS645176U true JPS645176U (en) | 1989-01-12 |
Family
ID=31322753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9735887U Pending JPS645176U (en) | 1987-06-26 | 1987-06-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS645176U (en) |
-
1987
- 1987-06-26 JP JP9735887U patent/JPS645176U/ja active Pending
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