JPS6450965A - Voltage measuring method and apparatus with electronic probe - Google Patents

Voltage measuring method and apparatus with electronic probe

Info

Publication number
JPS6450965A
JPS6450965A JP63189545A JP18954588A JPS6450965A JP S6450965 A JPS6450965 A JP S6450965A JP 63189545 A JP63189545 A JP 63189545A JP 18954588 A JP18954588 A JP 18954588A JP S6450965 A JPS6450965 A JP S6450965A
Authority
JP
Japan
Prior art keywords
signals
tube
frequency
amplified
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63189545A
Other languages
English (en)
Inventor
Buruusuto Hansudetorefu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of JPS6450965A publication Critical patent/JPS6450965A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
JP63189545A 1987-07-30 1988-07-27 Voltage measuring method and apparatus with electronic probe Pending JPS6450965A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3725313 1987-07-30

Publications (1)

Publication Number Publication Date
JPS6450965A true JPS6450965A (en) 1989-02-27

Family

ID=6332738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63189545A Pending JPS6450965A (en) 1987-07-30 1988-07-27 Voltage measuring method and apparatus with electronic probe

Country Status (2)

Country Link
EP (1) EP0301254A3 (ja)
JP (1) JPS6450965A (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3866079D1 (de) * 1987-09-30 1991-12-12 Siemens Ag Automatische frequenznachfuehrung bei korpuskularstrahlmessverfahren unter anwendung eines modulierten primaerstrahls.
GB0717800D0 (en) * 2007-09-12 2007-10-24 Mitsubishi Electric Inf Tech Pulse analyzer
CN103941622B (zh) * 2014-04-28 2016-06-08 国家电网公司 基于fpga的高精度秒脉冲倍频出采样脉冲的方法
CN114019265B (zh) * 2021-09-23 2024-05-10 安徽康佳电子有限公司 一种pm模块屏线插接检测电路

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2743200A1 (de) * 1977-09-26 1979-04-05 Siemens Ag Verbesserung an einer vorrichtung zur elektronenstrahleintastung

Also Published As

Publication number Publication date
EP0301254A3 (de) 1990-10-10
EP0301254A2 (de) 1989-02-01

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