JPS6450153A - Service request system in gpib communication system - Google Patents
Service request system in gpib communication systemInfo
- Publication number
- JPS6450153A JPS6450153A JP62206951A JP20695187A JPS6450153A JP S6450153 A JPS6450153 A JP S6450153A JP 62206951 A JP62206951 A JP 62206951A JP 20695187 A JP20695187 A JP 20695187A JP S6450153 A JPS6450153 A JP S6450153A
- Authority
- JP
- Japan
- Prior art keywords
- service request
- bit
- side device
- serial poll
- communication system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/20—Handling requests for interconnection or transfer for access to input/output bus
- G06F13/22—Handling requests for interconnection or transfer for access to input/output bus using successive scanning, e.g. polling
Abstract
PURPOSE:To simplify the processing of a master side device by retrieving periodically a service request bit of plural slaves and receiving a service request. CONSTITUTION:In addition to an RSV bit prescribed by a GPIB system, a service request bit 232 for showing a service request state is provided on a user open bit 230. On the other hand, in a master side device 1, a processor 12 executes periodically a serial poll, reads out successively a status byte of each slave side device 2, detects a state of the bit 232, and when the device to which the bit 232 is set is detected in the course of the serial poll, the serial poll is suspended, and a service request is received.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62206951A JPS6450153A (en) | 1987-08-19 | 1987-08-19 | Service request system in gpib communication system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62206951A JPS6450153A (en) | 1987-08-19 | 1987-08-19 | Service request system in gpib communication system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6450153A true JPS6450153A (en) | 1989-02-27 |
Family
ID=16531721
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62206951A Pending JPS6450153A (en) | 1987-08-19 | 1987-08-19 | Service request system in gpib communication system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6450153A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018159608A (en) * | 2017-03-22 | 2018-10-11 | 東京エレクトロン株式会社 | Wafer inspection device and method for diagnosing wafer inspection device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54126435A (en) * | 1978-03-24 | 1979-10-01 | Nec Corp | Contention control system |
-
1987
- 1987-08-19 JP JP62206951A patent/JPS6450153A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54126435A (en) * | 1978-03-24 | 1979-10-01 | Nec Corp | Contention control system |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018159608A (en) * | 2017-03-22 | 2018-10-11 | 東京エレクトロン株式会社 | Wafer inspection device and method for diagnosing wafer inspection device |
CN110446937A (en) * | 2017-03-22 | 2019-11-12 | 东京毅力科创株式会社 | The diagnostic method of wafer inspection device and wafer inspection device |
KR20190132436A (en) * | 2017-03-22 | 2019-11-27 | 도쿄엘렉트론가부시키가이샤 | Diagnosis method of wafer inspection apparatus and wafer inspection apparatus |
TWI763794B (en) * | 2017-03-22 | 2022-05-11 | 日商東京威力科創股份有限公司 | Wafer inspection apparatus and diagnostic method of wafer inspection apparatus |
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