JPS6447148U - - Google Patents
Info
- Publication number
- JPS6447148U JPS6447148U JP14211287U JP14211287U JPS6447148U JP S6447148 U JPS6447148 U JP S6447148U JP 14211287 U JP14211287 U JP 14211287U JP 14211287 U JP14211287 U JP 14211287U JP S6447148 U JPS6447148 U JP S6447148U
- Authority
- JP
- Japan
- Prior art keywords
- test
- section
- interface
- processor
- microprocessor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14211287U JPS6447148U (US20090163788A1-20090625-C00002.png) | 1987-09-16 | 1987-09-16 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14211287U JPS6447148U (US20090163788A1-20090625-C00002.png) | 1987-09-16 | 1987-09-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6447148U true JPS6447148U (US20090163788A1-20090625-C00002.png) | 1989-03-23 |
Family
ID=31407781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14211287U Pending JPS6447148U (US20090163788A1-20090625-C00002.png) | 1987-09-16 | 1987-09-16 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6447148U (US20090163788A1-20090625-C00002.png) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05244655A (ja) * | 1992-03-02 | 1993-09-21 | Nippon Telegr & Teleph Corp <Ntt> | 故障監視装置 |
| WO2008044421A1 (fr) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Testeur et procédé de commande |
| US7502708B2 (en) | 2006-10-12 | 2009-03-10 | Advantest Corporation | Test apparatus, and control method |
| US7549097B2 (en) | 1996-05-30 | 2009-06-16 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit device and method of testing the same |
| WO2009078135A1 (ja) * | 2007-12-19 | 2009-06-25 | Advantest Corporation | 試験装置 |
| JP2015524179A (ja) * | 2012-05-02 | 2015-08-20 | ライトポイント・コーポレイションＬｉｔｅＰｏｉｎｔ Ｃｏｒｐｏｒａｔｉｏｎ | 複数の通信デバイスの試験を開始するためのシステム及び方法 |
| CN112816851A (zh) * | 2020-12-31 | 2021-05-18 | 上海移远通信技术股份有限公司 | 芯片可靠性测试装置及方法 |
-
1987
- 1987-09-16 JP JP14211287U patent/JPS6447148U/ja active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05244655A (ja) * | 1992-03-02 | 1993-09-21 | Nippon Telegr & Teleph Corp <Ntt> | 故障監視装置 |
| US7549097B2 (en) | 1996-05-30 | 2009-06-16 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit device and method of testing the same |
| WO2008044421A1 (fr) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Testeur et procédé de commande |
| US7502708B2 (en) | 2006-10-12 | 2009-03-10 | Advantest Corporation | Test apparatus, and control method |
| JP5008673B2 (ja) * | 2006-10-12 | 2012-08-22 | 株式会社アドバンテスト | 試験装置および制御方法 |
| WO2009078135A1 (ja) * | 2007-12-19 | 2009-06-25 | Advantest Corporation | 試験装置 |
| US7792656B2 (en) | 2007-12-19 | 2010-09-07 | Advantest Corporation | Test apparatus |
| JP5331709B2 (ja) * | 2007-12-19 | 2013-10-30 | 株式会社アドバンテスト | 試験装置 |
| JP2015524179A (ja) * | 2012-05-02 | 2015-08-20 | ライトポイント・コーポレイションＬｉｔｅＰｏｉｎｔ Ｃｏｒｐｏｒａｔｉｏｎ | 複数の通信デバイスの試験を開始するためのシステム及び方法 |
| CN112816851A (zh) * | 2020-12-31 | 2021-05-18 | 上海移远通信技术股份有限公司 | 芯片可靠性测试装置及方法 |
