JPS6444479U - - Google Patents
Info
- Publication number
- JPS6444479U JPS6444479U JP14077887U JP14077887U JPS6444479U JP S6444479 U JPS6444479 U JP S6444479U JP 14077887 U JP14077887 U JP 14077887U JP 14077887 U JP14077887 U JP 14077887U JP S6444479 U JPS6444479 U JP S6444479U
- Authority
- JP
- Japan
- Prior art keywords
- under test
- circuit
- discharging
- switch
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図ａは本考案の第１の実施例を示す回路図
、第１図ｂは各スイツチの動作タイミングを示す
図、第１図ｃは入力保護回路つき半導体装置への
ストレス印加状態を示す図、第２図ａ，ｂは従来
の半導体試験装置を示す回路図、第３図は本考案
の第２の実施例を示す回路図である。
１…充放電用コンデンサ、２…高電圧電源、３
…充電用スイツチ、４…放電開始用スイツチ、５
…放電停止用スイツチ、６…被試験端子、７…供
試半導体装置、８…充放電用スイツチ。
FIG. 1a is a circuit diagram showing the first embodiment of the present invention, FIG. 1b is a diagram showing the operation timing of each switch, and FIG. 1c is a diagram showing the state of stress applied to a semiconductor device with an input protection circuit. 2A and 2B are circuit diagrams showing a conventional semiconductor testing device, and FIG. 3 is a circuit diagram showing a second embodiment of the present invention. 1...Charging/discharging capacitor, 2...High voltage power supply, 3
...Switch for charging, 4...Switch for starting discharge, 5
...Discharge stop switch, 6...Terminal under test, 7...Semiconductor device under test, 8...Charge/discharge switch.
Claims (1)
被試験端子に放電させる回路を有する半導体試験
装置において、前記放電回路に、放電開始用スイ
ツチと放電停止用スイツチとを備えたことを特徴
とする半導体試験装置。 A semiconductor test device having a circuit for discharging a charged capacitor charge to a terminal under test of a semiconductor device under test, wherein the discharging circuit is provided with a discharge start switch and a discharge stop switch. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14077887U JPS6444479U (en) | 1987-09-14 | 1987-09-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14077887U JPS6444479U (en) | 1987-09-14 | 1987-09-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6444479U true JPS6444479U (en) | 1989-03-16 |
Family
ID=31405262
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14077887U Pending JPS6444479U (en) | 1987-09-14 | 1987-09-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6444479U (en) |
-
1987
- 1987-09-14 JP JP14077887U patent/JPS6444479U/ja active Pending
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