JPS6442162A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS6442162A
JPS6442162A JP19857787A JP19857787A JPS6442162A JP S6442162 A JPS6442162 A JP S6442162A JP 19857787 A JP19857787 A JP 19857787A JP 19857787 A JP19857787 A JP 19857787A JP S6442162 A JPS6442162 A JP S6442162A
Authority
JP
Japan
Prior art keywords
power supply
supply line
voltage fluctuation
capacitor
analog circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19857787A
Other languages
Japanese (ja)
Inventor
Keisuke Okada
Sumitaka Takeuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP19857787A priority Critical patent/JPS6442162A/en
Publication of JPS6442162A publication Critical patent/JPS6442162A/en
Pending legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To prevent malfunction of an analog circuit, by providing a by-pass capacitor for eliminating a voltage fluctuation generated inside a digital circuit. CONSTITUTION:There is provided a power supply line 5E to which the ground potential GND is externally applied through a power supply terminal 4E and a capacitor C is connected between the power supply line 5E and a power supply line 5D. Therefore, even if a voltage fluctuation is generated in the power supply line 5D by switching operation in a digital circuit 3, a portion of the voltage fluctuation escapes through the capacitor C, the power supply line 5E and the power supply terminal 4E. As a result, a propagation amount to the side of an analog circuit 2 by a floating capacitance FC is reduced by the voltage fluctuation and it is possible to prevent malfunction of an analog circuit.
JP19857787A 1987-08-07 1987-08-07 Semiconductor integrated circuit device Pending JPS6442162A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19857787A JPS6442162A (en) 1987-08-07 1987-08-07 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19857787A JPS6442162A (en) 1987-08-07 1987-08-07 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS6442162A true JPS6442162A (en) 1989-02-14

Family

ID=16393490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19857787A Pending JPS6442162A (en) 1987-08-07 1987-08-07 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6442162A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02251169A (en) * 1989-03-24 1990-10-08 Nec Corp Semiconductor integrated circuit device
EP0827282A1 (en) * 1996-08-29 1998-03-04 Micronas Intermetall GmbH Connection configuration for reducing noise radiation in an integrated circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02251169A (en) * 1989-03-24 1990-10-08 Nec Corp Semiconductor integrated circuit device
EP0827282A1 (en) * 1996-08-29 1998-03-04 Micronas Intermetall GmbH Connection configuration for reducing noise radiation in an integrated circuit

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