JPS6439760A - Complementary mos integrated circuit device - Google Patents

Complementary mos integrated circuit device

Info

Publication number
JPS6439760A
JPS6439760A JP62196830A JP19683087A JPS6439760A JP S6439760 A JPS6439760 A JP S6439760A JP 62196830 A JP62196830 A JP 62196830A JP 19683087 A JP19683087 A JP 19683087A JP S6439760 A JPS6439760 A JP S6439760A
Authority
JP
Japan
Prior art keywords
channel
gate electrode
cut
brought
state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62196830A
Other languages
Japanese (ja)
Inventor
Yoshio Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62196830A priority Critical patent/JPS6439760A/en
Publication of JPS6439760A publication Critical patent/JPS6439760A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To contrive improvement in the degree of integration as well as to prevent the deterioration in characteristics by a method wherein, in the integrated circuit device constituting a plurality of parts of complementary circuits consisting of P- channel and N-channel MOS transistors, a circuit equal to an isolation region is constituted without providing the isolation region. CONSTITUTION:The active region 1c of a P-channel and the active region 1d of an N-channel only are formed integrally opposing each other, and an isolation region is not provided. A gate electrode 6b is connected by the first layer of Al wiring 8f, to which negative power source GND will be given, and at the same time, the gate electrode 6b is connected to the opposing gate electrode 6a with the first layer of Al wiring 8g. A negative source power is applied to the gate electrode 6a, and on the other hand, an N-channel transistor is brought into a cut-off state, and between each N-channel transistor of gate electrodes 5b and 7b is cut off. Also, positive source power is applied to a gate electrode 7a in the same manner as above, and on the other hand, a P-channel transistor is brought into a cut-off state. As a result, the number of Al wirings can be reduced, a high degree of integration can also be obtained, each transistor is brought into a cut-off state, and the generation of deterioration in characteristics can be prevented.
JP62196830A 1987-08-05 1987-08-05 Complementary mos integrated circuit device Pending JPS6439760A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62196830A JPS6439760A (en) 1987-08-05 1987-08-05 Complementary mos integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62196830A JPS6439760A (en) 1987-08-05 1987-08-05 Complementary mos integrated circuit device

Publications (1)

Publication Number Publication Date
JPS6439760A true JPS6439760A (en) 1989-02-10

Family

ID=16364373

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62196830A Pending JPS6439760A (en) 1987-08-05 1987-08-05 Complementary mos integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6439760A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006049903A (en) * 2004-08-03 2006-02-16 Samsung Electronics Co Ltd Cmos element with improved performance, and manufacturing method of the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006049903A (en) * 2004-08-03 2006-02-16 Samsung Electronics Co Ltd Cmos element with improved performance, and manufacturing method of the same

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