JPS6439760A - Complementary mos integrated circuit device - Google Patents
Complementary mos integrated circuit deviceInfo
- Publication number
- JPS6439760A JPS6439760A JP62196830A JP19683087A JPS6439760A JP S6439760 A JPS6439760 A JP S6439760A JP 62196830 A JP62196830 A JP 62196830A JP 19683087 A JP19683087 A JP 19683087A JP S6439760 A JPS6439760 A JP S6439760A
- Authority
- JP
- Japan
- Prior art keywords
- channel
- gate electrode
- cut
- brought
- state
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To contrive improvement in the degree of integration as well as to prevent the deterioration in characteristics by a method wherein, in the integrated circuit device constituting a plurality of parts of complementary circuits consisting of P- channel and N-channel MOS transistors, a circuit equal to an isolation region is constituted without providing the isolation region. CONSTITUTION:The active region 1c of a P-channel and the active region 1d of an N-channel only are formed integrally opposing each other, and an isolation region is not provided. A gate electrode 6b is connected by the first layer of Al wiring 8f, to which negative power source GND will be given, and at the same time, the gate electrode 6b is connected to the opposing gate electrode 6a with the first layer of Al wiring 8g. A negative source power is applied to the gate electrode 6a, and on the other hand, an N-channel transistor is brought into a cut-off state, and between each N-channel transistor of gate electrodes 5b and 7b is cut off. Also, positive source power is applied to a gate electrode 7a in the same manner as above, and on the other hand, a P-channel transistor is brought into a cut-off state. As a result, the number of Al wirings can be reduced, a high degree of integration can also be obtained, each transistor is brought into a cut-off state, and the generation of deterioration in characteristics can be prevented.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62196830A JPS6439760A (en) | 1987-08-05 | 1987-08-05 | Complementary mos integrated circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62196830A JPS6439760A (en) | 1987-08-05 | 1987-08-05 | Complementary mos integrated circuit device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6439760A true JPS6439760A (en) | 1989-02-10 |
Family
ID=16364373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62196830A Pending JPS6439760A (en) | 1987-08-05 | 1987-08-05 | Complementary mos integrated circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6439760A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006049903A (en) * | 2004-08-03 | 2006-02-16 | Samsung Electronics Co Ltd | Cmos element with improved performance, and manufacturing method of the same |
-
1987
- 1987-08-05 JP JP62196830A patent/JPS6439760A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006049903A (en) * | 2004-08-03 | 2006-02-16 | Samsung Electronics Co Ltd | Cmos element with improved performance, and manufacturing method of the same |
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