JPS6439546A - Electrode for magnetic particle flaw testing instrument - Google Patents
Electrode for magnetic particle flaw testing instrumentInfo
- Publication number
- JPS6439546A JPS6439546A JP19708287A JP19708287A JPS6439546A JP S6439546 A JPS6439546 A JP S6439546A JP 19708287 A JP19708287 A JP 19708287A JP 19708287 A JP19708287 A JP 19708287A JP S6439546 A JPS6439546 A JP S6439546A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- drape
- alloy
- wear resistance
- testing instrument
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE:To obtain an electrode which has deformation resistance, wear resistance and drape in combination and is easily regeneratable by using >=2 kinds of elements among lead, tin, copper, bismuth, antimony, cadmium, and gallium to constitute an alloy. CONSTITUTION:Electrodes of various shapes including flat plate-, bar- and needle shapes are used and the compsn. for the electrode material needs be changed by taking the shape of a material to be inspected and the pressing force of the electrode onto said material into consideration. The electrode having the excellent wear resistance and deformation resistance is obtd. by increasing the hardness of the electrode material in order to extend the life of the electrode but the drape is deteriorated on the contray and sparking is liable to arise. The alloy made by using >=2 kinds of the elements among the lead, tin, copper bismuth, antimony, and gallium is, therefore, constituted as the electrode material in order to balance these characteristics. The formulation of the alloy is determined by taking the deformation resistance, wear resistance and drape into consideration according to the flaw testing instrument and the material to be inspected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19708287A JPS6439546A (en) | 1987-08-06 | 1987-08-06 | Electrode for magnetic particle flaw testing instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19708287A JPS6439546A (en) | 1987-08-06 | 1987-08-06 | Electrode for magnetic particle flaw testing instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6439546A true JPS6439546A (en) | 1989-02-09 |
Family
ID=16368420
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19708287A Pending JPS6439546A (en) | 1987-08-06 | 1987-08-06 | Electrode for magnetic particle flaw testing instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6439546A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130088220A1 (en) * | 2011-10-06 | 2013-04-11 | Johnson & Allen Limited | Apparatus for non-destructive testing |
| KR20190002372U (en) * | 2018-03-15 | 2019-09-25 | 두산중공업 주식회사 | Prod type Magnetic Particle Testing Device |
| KR20190002481U (en) * | 2018-03-26 | 2019-10-07 | 두산중공업 주식회사 | Prod type Magnetic Particle Testing Device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58145012A (en) * | 1982-02-23 | 1983-08-29 | 田中貴金属工業株式会社 | Slide contact material |
-
1987
- 1987-08-06 JP JP19708287A patent/JPS6439546A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58145012A (en) * | 1982-02-23 | 1983-08-29 | 田中貴金属工業株式会社 | Slide contact material |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130088220A1 (en) * | 2011-10-06 | 2013-04-11 | Johnson & Allen Limited | Apparatus for non-destructive testing |
| KR20190002372U (en) * | 2018-03-15 | 2019-09-25 | 두산중공업 주식회사 | Prod type Magnetic Particle Testing Device |
| KR20190002481U (en) * | 2018-03-26 | 2019-10-07 | 두산중공업 주식회사 | Prod type Magnetic Particle Testing Device |
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