JPS6435844A - Mass spectrograph - Google Patents

Mass spectrograph

Info

Publication number
JPS6435844A
JPS6435844A JP62192799A JP19279987A JPS6435844A JP S6435844 A JPS6435844 A JP S6435844A JP 62192799 A JP62192799 A JP 62192799A JP 19279987 A JP19279987 A JP 19279987A JP S6435844 A JPS6435844 A JP S6435844A
Authority
JP
Japan
Prior art keywords
electrode
mass spectrometry
potential
ions
orifice
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62192799A
Other languages
Japanese (ja)
Inventor
Sumio Kumashiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP62192799A priority Critical patent/JPS6435844A/en
Publication of JPS6435844A publication Critical patent/JPS6435844A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To satisfactorily perform the mass spectrometry by providing two types of cylindrical electrodes between an ionization chamber and a sample and using the electrode on the sample side as a secondary ion blocking electrode at the time of the mass spectrometry of neutral particles and using the electrode on the ionization chamber side as an energy filter at the time of the mass spectrometry of secondary ions. CONSTITUTION:At the time of the mass spectrometry of neutral particles, an orifice A is retreated, end the preset potential is applied to an ionization unit I. An electrode 1 is set to the positive potential to prevent the infiltration of positive secondary ions from a sample S for the positive ion measurement. When split electrodes 21, 25 of an electrode 2 are set to 0 potential together with the mesh 5 of an ionization chamber C to shield the electric field of the electrode 1, neutral particles are fed to an analysis unit M with the initial momentum. The orifice A is inserted and the 0-potential ionization unit I is set to 0 potential for the mass spectrometry of secondary ions, secondary ions are fed to the electrode 2, the potential with the opposite polarity to ions is applied to electrodes 21, 22 to act as energy filters. As a result, ions within the limited range reach the orifice A, the permeability is remarkably reduced, the resolution of the mass spectrometry is improved. The electrode 1 becomes an electric field shielding body in this case.
JP62192799A 1987-07-31 1987-07-31 Mass spectrograph Pending JPS6435844A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62192799A JPS6435844A (en) 1987-07-31 1987-07-31 Mass spectrograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62192799A JPS6435844A (en) 1987-07-31 1987-07-31 Mass spectrograph

Publications (1)

Publication Number Publication Date
JPS6435844A true JPS6435844A (en) 1989-02-06

Family

ID=16297182

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62192799A Pending JPS6435844A (en) 1987-07-31 1987-07-31 Mass spectrograph

Country Status (1)

Country Link
JP (1) JPS6435844A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03184251A (en) * 1989-12-12 1991-08-12 Shimadzu Corp Specimen surface analyzing device
JPH0438440A (en) * 1990-06-02 1992-02-07 Hitachi Ltd Quantity analysis sample and ion implantation and secondary ion mass spectrometer with ion implantation function
US5205447A (en) * 1991-12-16 1993-04-27 Hambrick Kathleen D Car telephone cover apparatus
JP2015046305A (en) * 2013-08-28 2015-03-12 株式会社トヤマ Neutral particle mass spectrometer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03184251A (en) * 1989-12-12 1991-08-12 Shimadzu Corp Specimen surface analyzing device
JPH0438440A (en) * 1990-06-02 1992-02-07 Hitachi Ltd Quantity analysis sample and ion implantation and secondary ion mass spectrometer with ion implantation function
US5205447A (en) * 1991-12-16 1993-04-27 Hambrick Kathleen D Car telephone cover apparatus
JP2015046305A (en) * 2013-08-28 2015-03-12 株式会社トヤマ Neutral particle mass spectrometer

Similar Documents

Publication Publication Date Title
CA2101427A1 (en) Mass Spectrometry Method Using Notch Filter
EP1107283A3 (en) Negative ion filter
US4789783A (en) Discharge ionization detector
CA2124344A1 (en) Corona discharge ionisation source
CA2288412A1 (en) Plasma mass filter
CA2101156A1 (en) Chemical Ionization Mass Spectrometry Method Using Notch Filter
JPS6435844A (en) Mass spectrograph
DE19635645A1 (en) High-resolution ion detection for linear time-of-flight mass spectrometers
GB1470847A (en) Surface-layer analysis by ion scattering
GB929883A (en) Improvements in or relating to the detection and/or analysis of low concentrations of gases and vapour
GB1387173A (en) Energy analyzer of the coaxial cylindrical type
AU6615294A (en) Gasphase ion source for time-of-flight mass-spectrometers with high mass resolution and large mass range
JPS6427156A (en) Method and apparatus for analyzing gaseous chemical objects in atmosphere
GB1064142A (en) Improved mass spectrometer
GB1445963A (en) Ion beam apparatus
JPS5512632A (en) Ion source device for mass spectrometer
CN112924531B (en) Ion mobility spectrometer migration tube, operation method and ion mobility spectrometer
GB1225272A (en)
DE1698202C3 (en) Electron impact ion source for a multipole mass filter
US4567368A (en) Bipolar pulsed electron capture detectors
JPS5611844A (en) Electric field elimination ion source
GB1286669A (en) Mass spectrometer apparatus
JPS57109244A (en) Ion source
DE2905166A1 (en) VACUUM SPARK GENERATOR
EP0820045A3 (en) Ionization type smoke detector