JPS6435250A - Fast sample temperature varying apparatus - Google Patents

Fast sample temperature varying apparatus

Info

Publication number
JPS6435250A
JPS6435250A JP62190636A JP19063687A JPS6435250A JP S6435250 A JPS6435250 A JP S6435250A JP 62190636 A JP62190636 A JP 62190636A JP 19063687 A JP19063687 A JP 19063687A JP S6435250 A JPS6435250 A JP S6435250A
Authority
JP
Japan
Prior art keywords
sample
temperature
change
tube
specified
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62190636A
Other languages
Japanese (ja)
Other versions
JP2517609B2 (en
Inventor
Kazuyuki Akasaka
Akira Naito
Hiroshi Nakatani
Tsukasa Imanari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP62190636A priority Critical patent/JP2517609B2/en
Publication of JPS6435250A publication Critical patent/JPS6435250A/en
Application granted granted Critical
Publication of JP2517609B2 publication Critical patent/JP2517609B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Magnetic Resonance Imaging Apparatus (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To observe the behavior of a sample with a sharp change caused in the temperature of a sample, by mixing liquids different in the temperature to change the temperature of the sample with the formation of a specified temperature of a fluid. CONSTITUTION:A sample tube 12 holding a sample is inserted into a sample holder 1 to be housed into a probe body 4 and set in a magnetic field. Electromagnetic valves 8 and 9 are controlled to mix a high temperature gas and a low temperature gas with a mixer 7 at such a mixing ratio that a necessary temperature is obtained to cause a specified temperature change in the sample. The mixed gas of a specified temperature is sent into a probe body 4 through a blast tube 6 to be blown to a sample tube 12, which is made up of a thin fine capillary tube. With the blowing of the mixed gas, the entire sample is shifted instantaneously to a specified temperature. Under such a temperature change, a high frequency is made to irradiate the sample and a resonance signal is received with a receiving coil 3 thereby measuring the behavior of material with respect to a sharp temperature change.
JP62190636A 1987-07-30 1987-07-30 High-speed sample temperature changer for nuclear magnetic resonance Expired - Fee Related JP2517609B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62190636A JP2517609B2 (en) 1987-07-30 1987-07-30 High-speed sample temperature changer for nuclear magnetic resonance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62190636A JP2517609B2 (en) 1987-07-30 1987-07-30 High-speed sample temperature changer for nuclear magnetic resonance

Publications (2)

Publication Number Publication Date
JPS6435250A true JPS6435250A (en) 1989-02-06
JP2517609B2 JP2517609B2 (en) 1996-07-24

Family

ID=16261369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62190636A Expired - Fee Related JP2517609B2 (en) 1987-07-30 1987-07-30 High-speed sample temperature changer for nuclear magnetic resonance

Country Status (1)

Country Link
JP (1) JP2517609B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112068052A (en) * 2020-09-15 2020-12-11 苏州大学 High-precision multifunctional temperature-changing magnetoelectric test system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS576537B2 (en) * 1973-06-25 1982-02-05
JPS6292461U (en) * 1985-11-29 1987-06-12

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS576537B2 (en) * 1973-06-25 1982-02-05
JPS6292461U (en) * 1985-11-29 1987-06-12

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112068052A (en) * 2020-09-15 2020-12-11 苏州大学 High-precision multifunctional temperature-changing magnetoelectric test system

Also Published As

Publication number Publication date
JP2517609B2 (en) 1996-07-24

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees