JPS6427170A - Electromagnetically shielded socket for probe card - Google Patents

Electromagnetically shielded socket for probe card

Info

Publication number
JPS6427170A
JPS6427170A JP62184321A JP18432187A JPS6427170A JP S6427170 A JPS6427170 A JP S6427170A JP 62184321 A JP62184321 A JP 62184321A JP 18432187 A JP18432187 A JP 18432187A JP S6427170 A JPS6427170 A JP S6427170A
Authority
JP
Japan
Prior art keywords
receptacle
circuit
probe card
probe
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62184321A
Other languages
Japanese (ja)
Inventor
Masao Okubo
Fumio Nakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Electronic Materials Corp
Original Assignee
Japan Electronic Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Electronic Materials Corp filed Critical Japan Electronic Materials Corp
Priority to JP62184321A priority Critical patent/JPS6427170A/en
Publication of JPS6427170A publication Critical patent/JPS6427170A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To restrict crosstalk between neighboring circuits at the time of testing by making an annular frame member constituting a socket for a probe card with a conductive material such as metal and arranging an electrical connection member to be inserted in a through hole bored in the wall section of the annular frame member via an insulator. CONSTITUTION:In each of two rows of through holes 1a bored along the circumference of a ring-shaped frame 1 made of aluminum, is inserted an electrical connection member 2 via a cylindrical insulator 3. The member 2 consists of a receptacle 2a for receiving a pin-shaped terminal, a spring 2b for supporting the receptacle 2a, and a projection 2d for a bottom terminal, with the receptacle 2a and the spring 2b held in a cylindrical holder 2c. In this constitution, the projection 2d is brought into electrical contact with a lead circuit 21 on the top surface of a lead circuit board 20 and its front end is soldered to the extended end of a circuit 21 extending on the reverse side of the circuit board 20. On the other hand, a pin-shaped projection 32 which is a lead portion of a probe 31 provided on a probe card 30 in inserted into the receptacle 2a to produce a circuit between the probe 31 and the circuit 21.
JP62184321A 1987-07-22 1987-07-22 Electromagnetically shielded socket for probe card Pending JPS6427170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62184321A JPS6427170A (en) 1987-07-22 1987-07-22 Electromagnetically shielded socket for probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62184321A JPS6427170A (en) 1987-07-22 1987-07-22 Electromagnetically shielded socket for probe card

Publications (1)

Publication Number Publication Date
JPS6427170A true JPS6427170A (en) 1989-01-30

Family

ID=16151285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62184321A Pending JPS6427170A (en) 1987-07-22 1987-07-22 Electromagnetically shielded socket for probe card

Country Status (1)

Country Link
JP (1) JPS6427170A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6430458U (en) * 1987-08-13 1989-02-23
JPH0613129A (en) * 1991-10-15 1994-01-21 Kel Corp Electric connector
JP2006004932A (en) * 2004-06-17 2006-01-05 Aries Electronics Inc Shielded integrated circuit probe
KR100821681B1 (en) * 2006-12-13 2008-04-14 리노공업주식회사 Socket, pcb with socket and method of manufaturing pcb for appalication test

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6286836A (en) * 1985-10-14 1987-04-21 Nec Corp Probe card

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6286836A (en) * 1985-10-14 1987-04-21 Nec Corp Probe card

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6430458U (en) * 1987-08-13 1989-02-23
JPH0613129A (en) * 1991-10-15 1994-01-21 Kel Corp Electric connector
JP2006004932A (en) * 2004-06-17 2006-01-05 Aries Electronics Inc Shielded integrated circuit probe
KR100821681B1 (en) * 2006-12-13 2008-04-14 리노공업주식회사 Socket, pcb with socket and method of manufaturing pcb for appalication test

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