JPS6426982A - Inspection device for printed board - Google Patents

Inspection device for printed board

Info

Publication number
JPS6426982A
JPS6426982A JP62184435A JP18443587A JPS6426982A JP S6426982 A JPS6426982 A JP S6426982A JP 62184435 A JP62184435 A JP 62184435A JP 18443587 A JP18443587 A JP 18443587A JP S6426982 A JPS6426982 A JP S6426982A
Authority
JP
Japan
Prior art keywords
parts
pattern
angle
changed
key
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62184435A
Other languages
Japanese (ja)
Inventor
Tsutomu Arakawa
Shinya Suzuki
Yukinori Matsumoto
Masazumi Katayama
Eiji Kono
Makoto Okazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP62184435A priority Critical patent/JPS6426982A/en
Publication of JPS6426982A publication Critical patent/JPS6426982A/en
Pending legal-status Critical Current

Links

Landscapes

  • Supply And Installment Of Electrical Components (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

PURPOSE:To accurately confirm the tilting state of an electronic parts by displaying the image of said parts put on a printed board on a pattern showing the parts form on a display screen and changing the angle of said pattern. CONSTITUTION:An X-Y stage 2 is controlled by an X-Y stage controller 8 so that an electronic parts is set right under a camera 3. The image of the parts is inputted to a picture memory 5 and displayed on a CRT 6. Then the size of a parts pattern is inputted from a keyboard 10 and held by a parts pattern holding part 15. If the parts is tilted, the angle of a parts form pattern P is changed with operation of a key on the keyboard 10. In this case, an angle changing key, for example, is used and the angle value stored in an angle holding part 16 is increased every time the angle changing key is operated. Thus the display angle of the pattern P can be changed. Then the correspondence is secured between the parts and the pattern P when the tilt angle is changed to 90 deg. and the size of the parts pattern is set again.
JP62184435A 1987-07-23 1987-07-23 Inspection device for printed board Pending JPS6426982A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62184435A JPS6426982A (en) 1987-07-23 1987-07-23 Inspection device for printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62184435A JPS6426982A (en) 1987-07-23 1987-07-23 Inspection device for printed board

Publications (1)

Publication Number Publication Date
JPS6426982A true JPS6426982A (en) 1989-01-30

Family

ID=16153105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62184435A Pending JPS6426982A (en) 1987-07-23 1987-07-23 Inspection device for printed board

Country Status (1)

Country Link
JP (1) JPS6426982A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006086187A (en) * 2004-09-14 2006-03-30 I-Pulse Co Ltd Method of producing data for inspecting packaging substrate, method and apparatus of the inspecting packaging substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006086187A (en) * 2004-09-14 2006-03-30 I-Pulse Co Ltd Method of producing data for inspecting packaging substrate, method and apparatus of the inspecting packaging substrate

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