JPS6419827U - - Google Patents
Info
- Publication number
- JPS6419827U JPS6419827U JP1987115260U JP11526087U JPS6419827U JP S6419827 U JPS6419827 U JP S6419827U JP 1987115260 U JP1987115260 U JP 1987115260U JP 11526087 U JP11526087 U JP 11526087U JP S6419827 U JPS6419827 U JP S6419827U
- Authority
- JP
- Japan
- Prior art keywords
- hole
- screw
- wall
- fitting
- receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002184 metal Substances 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims 3
Landscapes
- Domestic Hot-Water Supply Systems And Details Of Heating Systems (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987115260U JPH0526402Y2 (ru) | 1987-07-28 | 1987-07-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987115260U JPH0526402Y2 (ru) | 1987-07-28 | 1987-07-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6419827U true JPS6419827U (ru) | 1989-01-31 |
| JPH0526402Y2 JPH0526402Y2 (ru) | 1993-07-05 |
Family
ID=31356760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987115260U Expired - Lifetime JPH0526402Y2 (ru) | 1987-07-28 | 1987-07-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0526402Y2 (ru) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7187192B2 (en) | 2002-04-26 | 2007-03-06 | Advantest Corp. | Semiconductor test device having clock recovery circuit |
-
1987
- 1987-07-28 JP JP1987115260U patent/JPH0526402Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7187192B2 (en) | 2002-04-26 | 2007-03-06 | Advantest Corp. | Semiconductor test device having clock recovery circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0526402Y2 (ru) | 1993-07-05 |
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