JPS6416973A - Testing device for semiconductor device - Google Patents

Testing device for semiconductor device

Info

Publication number
JPS6416973A
JPS6416973A JP62173311A JP17331187A JPS6416973A JP S6416973 A JPS6416973 A JP S6416973A JP 62173311 A JP62173311 A JP 62173311A JP 17331187 A JP17331187 A JP 17331187A JP S6416973 A JPS6416973 A JP S6416973A
Authority
JP
Japan
Prior art keywords
waveform
unit
signal
semiconductor device
comparators
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62173311A
Other languages
Japanese (ja)
Inventor
Kenichi Sakai
Kazuhisa Okada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62173311A priority Critical patent/JPS6416973A/en
Publication of JPS6416973A publication Critical patent/JPS6416973A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To generate an optional waveform by one unit by varying an output standard value in synchronization with the waveform of the output signal of a semiconductor device. CONSTITUTION:A control unit 1 controls the whole system to obtain an analog waveform 13 shown by (a) and standard value waveforms 15 and 16 shown by (c) by calculation processing or by digitizing an external waveform, and stores them into an analog pattern generator 31. As for the signal (a) with the waveform 13, a pattern stored in the generator 31 is DA-converted by a DA converter 32 and applied to the semiconductor device 5 through a driving circuit 33. The device 5 processes the input signal (a) with the waveform 13 internally and outputs a signal (b) with a waveform 14. The waveform 14 of the signal (b) is compared by comparators 36 and 37 wit the waveforms 15 and 16 to decide whether or not the waveform is within a standard range 17. This decision result is sent to an error detection unit 38. The unit 38 detects errors decided by the comparators 36 and 37, and the decision result of this unit 38 is sent to the unit 1.
JP62173311A 1987-07-10 1987-07-10 Testing device for semiconductor device Pending JPS6416973A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62173311A JPS6416973A (en) 1987-07-10 1987-07-10 Testing device for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62173311A JPS6416973A (en) 1987-07-10 1987-07-10 Testing device for semiconductor device

Publications (1)

Publication Number Publication Date
JPS6416973A true JPS6416973A (en) 1989-01-20

Family

ID=15958093

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62173311A Pending JPS6416973A (en) 1987-07-10 1987-07-10 Testing device for semiconductor device

Country Status (1)

Country Link
JP (1) JPS6416973A (en)

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