JPS6416973A - Testing device for semiconductor device - Google Patents
Testing device for semiconductor deviceInfo
- Publication number
- JPS6416973A JPS6416973A JP62173311A JP17331187A JPS6416973A JP S6416973 A JPS6416973 A JP S6416973A JP 62173311 A JP62173311 A JP 62173311A JP 17331187 A JP17331187 A JP 17331187A JP S6416973 A JPS6416973 A JP S6416973A
- Authority
- JP
- Japan
- Prior art keywords
- waveform
- unit
- signal
- semiconductor device
- comparators
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To generate an optional waveform by one unit by varying an output standard value in synchronization with the waveform of the output signal of a semiconductor device. CONSTITUTION:A control unit 1 controls the whole system to obtain an analog waveform 13 shown by (a) and standard value waveforms 15 and 16 shown by (c) by calculation processing or by digitizing an external waveform, and stores them into an analog pattern generator 31. As for the signal (a) with the waveform 13, a pattern stored in the generator 31 is DA-converted by a DA converter 32 and applied to the semiconductor device 5 through a driving circuit 33. The device 5 processes the input signal (a) with the waveform 13 internally and outputs a signal (b) with a waveform 14. The waveform 14 of the signal (b) is compared by comparators 36 and 37 wit the waveforms 15 and 16 to decide whether or not the waveform is within a standard range 17. This decision result is sent to an error detection unit 38. The unit 38 detects errors decided by the comparators 36 and 37, and the decision result of this unit 38 is sent to the unit 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62173311A JPS6416973A (en) | 1987-07-10 | 1987-07-10 | Testing device for semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62173311A JPS6416973A (en) | 1987-07-10 | 1987-07-10 | Testing device for semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6416973A true JPS6416973A (en) | 1989-01-20 |
Family
ID=15958093
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62173311A Pending JPS6416973A (en) | 1987-07-10 | 1987-07-10 | Testing device for semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6416973A (en) |
-
1987
- 1987-07-10 JP JP62173311A patent/JPS6416973A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0242700A3 (en) | Ac level calibration method and apparatus | |
JPS6475912A (en) | Apparatus for processing signal from angle position converter | |
GB1242646A (en) | Circuit arrangement for producing a random output signal | |
ES8704048A1 (en) | Testable, "fault-tolerant" power interface circuit for controlling plant process equipment. | |
JPS6482283A (en) | Image data converter having segment end point correcting function | |
JPS6416973A (en) | Testing device for semiconductor device | |
US4310830A (en) | Method of and system for analog/digital conversion | |
JPS56116101A (en) | Voltage comparator circuit | |
FR2430131A3 (en) | SIGNAL GENERATOR FOR GENERATING SINUSOIDAL OUTPUT SIGNALS AT PREDETERMINED PHASE POSITION | |
KR0129475B1 (en) | Noise-removing circuit of anglog/digital converter | |
JPS6412723A (en) | A/d converter with clamping circuit | |
JPS6455605A (en) | State output device for control system | |
JPS56132609A (en) | Inspecting device for electronic engine controller | |
JPS6430485A (en) | Elevator controller | |
JPS6424351A (en) | Self-diagonosis device of da converting output unit for electron beam device | |
JPS6441875A (en) | Ic tester | |
SU718914A1 (en) | Bipolar analogue-digital converter | |
JPS57120128A (en) | Voltage controller | |
SU1499462A2 (en) | Two-channel comparator | |
JPH03142396A (en) | Object detector | |
KR20010058532A (en) | Test system and the method for digital to analog converter | |
SU1201996A1 (en) | Control device for self-excited inverter | |
JPS62255874A (en) | Checking system for analog output signal | |
JPS6423622A (en) | Device for inspecting a/d converter | |
JPS641978A (en) | Tester |