JPS6415688A - Waveform shaping method - Google Patents

Waveform shaping method

Info

Publication number
JPS6415688A
JPS6415688A JP16973587A JP16973587A JPS6415688A JP S6415688 A JPS6415688 A JP S6415688A JP 16973587 A JP16973587 A JP 16973587A JP 16973587 A JP16973587 A JP 16973587A JP S6415688 A JPS6415688 A JP S6415688A
Authority
JP
Japan
Prior art keywords
signal
amplifier
resistor
waveform
energy data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16973587A
Other languages
Japanese (ja)
Other versions
JP2577386B2 (en
Inventor
Toru Onodera
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Atomic Industry Group Co Ltd
Original Assignee
Nippon Atomic Industry Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Atomic Industry Group Co Ltd filed Critical Nippon Atomic Industry Group Co Ltd
Priority to JP62169735A priority Critical patent/JP2577386B2/en
Publication of JPS6415688A publication Critical patent/JPS6415688A/en
Application granted granted Critical
Publication of JP2577386B2 publication Critical patent/JP2577386B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To regenerate energy data, to remove the error in the input stage of a linear amplifier and to perform accurate measurement, by shaping a waveform to a signal which has lost energy data by differentiation. CONSTITUTION:The electric signal 23 of a semiconductor detector 21 outputs an output signal 24 being an exponential damped waveform through a preamplifier 22. This output signal 24 becomes a stepwise changing signal 26 by a regeneration circuit 25 wherein a resistor R1 is connected to an amplifier A2 on this side and a series circuit consisting of a resistor R2 and a condenser C1 is connected to the input and output terminals of the amplifier A2. In order to prevent the saturation of voltage, a reset current input terminal 27 is provided. By this method, the deterioration of resolving power due to the variation of a rising time can be removed by the regeneration circuit 25 and radiation can be measured accurately.
JP62169735A 1987-07-09 1987-07-09 Radiation energy spectrum measurement device Expired - Lifetime JP2577386B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62169735A JP2577386B2 (en) 1987-07-09 1987-07-09 Radiation energy spectrum measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62169735A JP2577386B2 (en) 1987-07-09 1987-07-09 Radiation energy spectrum measurement device

Publications (2)

Publication Number Publication Date
JPS6415688A true JPS6415688A (en) 1989-01-19
JP2577386B2 JP2577386B2 (en) 1997-01-29

Family

ID=15891878

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62169735A Expired - Lifetime JP2577386B2 (en) 1987-07-09 1987-07-09 Radiation energy spectrum measurement device

Country Status (1)

Country Link
JP (1) JP2577386B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005049144A (en) * 2003-07-30 2005-02-24 Toshiba Corp Radiation measuring method
JP2011503550A (en) * 2007-11-02 2011-01-27 ユニヴァーシティ オブ ワシントン Data acquisition for positron emission tomography
CN105765405A (en) * 2013-11-26 2016-07-13 皇家飞利浦有限公司 Detection device for detecting photons and method therefore

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4787989B2 (en) * 2006-11-10 2011-10-05 横河電機株式会社 Peak detection circuit, multi-channel analyzer and radiation measurement system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59183677U (en) * 1983-05-25 1984-12-06 理化学研究所 semiconductor absorption dosimeter

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59183677U (en) * 1983-05-25 1984-12-06 理化学研究所 semiconductor absorption dosimeter

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005049144A (en) * 2003-07-30 2005-02-24 Toshiba Corp Radiation measuring method
JP2011503550A (en) * 2007-11-02 2011-01-27 ユニヴァーシティ オブ ワシントン Data acquisition for positron emission tomography
CN105765405A (en) * 2013-11-26 2016-07-13 皇家飞利浦有限公司 Detection device for detecting photons and method therefore
JP2016540209A (en) * 2013-11-26 2016-12-22 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Detection apparatus and method for detecting photons

Also Published As

Publication number Publication date
JP2577386B2 (en) 1997-01-29

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