JPS6411526A - Sight examination apparatus - Google Patents
Sight examination apparatusInfo
- Publication number
- JPS6411526A JPS6411526A JP62167376A JP16737687A JPS6411526A JP S6411526 A JPS6411526 A JP S6411526A JP 62167376 A JP62167376 A JP 62167376A JP 16737687 A JP16737687 A JP 16737687A JP S6411526 A JPS6411526 A JP S6411526A
- Authority
- JP
- Japan
- Prior art keywords
- sight
- examination
- mark
- display
- correct
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Eye Examination Apparatus (AREA)
Abstract
PURPOSE:To examine sight by the remote operation of an examinee himself, by a method wherein a sight examination mark is indicated by a sight operation means to judge whether the signal outputted from a remote operation means is correct and a display means is controlled so as to continue the examination of sight when judgement is correct and the sight is operated when judgement is erroneous to be outputted to an information means. CONSTITUTION:When the sight examination key 2a of a remote operating means 2 is pushed to start the examination of sight, a sight examination mark is displayed on the display means 3 of a sight examination main unit 1. When an operating key 2b is pushed to respond to the sight examination mark, a sight operation means 4 judges whether said mark is correct. When the sight examination mark is correct, the sight operation means 4 erases the sight examination mark during the display on a display examination contracted by one stage as compared with the displayed sight examination mark on said display means 3. When said sight examination mark is erroneous, the sight operation means 4 calculates the size of the sight examination mark during the display on the display means 3 and the distance between the remote operating means 2 and the sight examination main unit 1 to operate sight. The sight calculated by operation is outputted to an information means 5 which in turn informs an examinee of the sight.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62167376A JPS6411526A (en) | 1987-07-03 | 1987-07-03 | Sight examination apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62167376A JPS6411526A (en) | 1987-07-03 | 1987-07-03 | Sight examination apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6411526A true JPS6411526A (en) | 1989-01-17 |
Family
ID=15848567
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62167376A Pending JPS6411526A (en) | 1987-07-03 | 1987-07-03 | Sight examination apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6411526A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000262476A (en) * | 1999-03-15 | 2000-09-26 | Carl Zeiss Jena Gmbh | Lighting system in optometric three-dimensional microscope and method therefor |
JP2007268169A (en) * | 2006-03-31 | 2007-10-18 | Nidek Co Ltd | Automatic optometer |
JP2008023129A (en) * | 2006-07-21 | 2008-02-07 | Nidek Co Ltd | Visual target presentation apparatus |
-
1987
- 1987-07-03 JP JP62167376A patent/JPS6411526A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000262476A (en) * | 1999-03-15 | 2000-09-26 | Carl Zeiss Jena Gmbh | Lighting system in optometric three-dimensional microscope and method therefor |
JP2007268169A (en) * | 2006-03-31 | 2007-10-18 | Nidek Co Ltd | Automatic optometer |
JP2008023129A (en) * | 2006-07-21 | 2008-02-07 | Nidek Co Ltd | Visual target presentation apparatus |
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