JPS6410654U - - Google Patents

Info

Publication number
JPS6410654U
JPS6410654U JP10485887U JP10485887U JPS6410654U JP S6410654 U JPS6410654 U JP S6410654U JP 10485887 U JP10485887 U JP 10485887U JP 10485887 U JP10485887 U JP 10485887U JP S6410654 U JPS6410654 U JP S6410654U
Authority
JP
Japan
Prior art keywords
gas sensor
holding
holding means
sampling
metal oxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10485887U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10485887U priority Critical patent/JPS6410654U/ja
Publication of JPS6410654U publication Critical patent/JPS6410654U/ja
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は実施例の口臭検査装置の付帯回路図、
第2図は実施例の装置の断面図、第3図は実施例
の動作を現すフローチヤート、第4図は実施例の
装置の動作を現す波形図、第5図は実施例に用い
たガスセンサの正面図である。第6図は他の実施
例の回路図、第7図はその動作を現すフローチヤ
ートである。 図において、2……ガスセンサ、4……ヒータ
、6……金属酸化物半導体。
FIG. 1 is an accompanying circuit diagram of the bad breath testing device of the embodiment.
Figure 2 is a sectional view of the device of the example, Figure 3 is a flowchart showing the operation of the example, Figure 4 is a waveform diagram showing the operation of the device of the example, and Figure 5 is the gas sensor used in the example. FIG. FIG. 6 is a circuit diagram of another embodiment, and FIG. 7 is a flow chart showing its operation. In the figure, 2...gas sensor, 4...heater, 6...metal oxide semiconductor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 金属酸化物半導体の抵抗値の変化を用いたガス
センサを、呼気のサンプリング流路中に設置し、
呼気との接触時のガスセンサ出力をサンプリング
してホールドするためのホールド手段を設けると
共に、ホールド手段に口臭の状態を表示するため
の表示手段を接続した、口臭検査装置。
A gas sensor that uses changes in the resistance value of metal oxide semiconductors is installed in the exhalation sampling flow path,
A halitosis testing device comprising a holding means for sampling and holding a gas sensor output upon contact with exhaled breath, and a display means for displaying a state of bad breath connected to the holding means.
JP10485887U 1987-07-07 1987-07-07 Pending JPS6410654U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10485887U JPS6410654U (en) 1987-07-07 1987-07-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10485887U JPS6410654U (en) 1987-07-07 1987-07-07

Publications (1)

Publication Number Publication Date
JPS6410654U true JPS6410654U (en) 1989-01-20

Family

ID=31336951

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10485887U Pending JPS6410654U (en) 1987-07-07 1987-07-07

Country Status (1)

Country Link
JP (1) JPS6410654U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4962185A (en) * 1972-10-16 1974-06-17
JPS58208651A (en) * 1982-05-31 1983-12-05 Shigemi Iida Apparatus for measuring intensity of foul breath

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4962185A (en) * 1972-10-16 1974-06-17
JPS58208651A (en) * 1982-05-31 1983-12-05 Shigemi Iida Apparatus for measuring intensity of foul breath

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