JPS6399207U - - Google Patents

Info

Publication number
JPS6399207U
JPS6399207U JP19661986U JP19661986U JPS6399207U JP S6399207 U JPS6399207 U JP S6399207U JP 19661986 U JP19661986 U JP 19661986U JP 19661986 U JP19661986 U JP 19661986U JP S6399207 U JPS6399207 U JP S6399207U
Authority
JP
Japan
Prior art keywords
metal ribbon
electromagnetic
micrometer
base
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19661986U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19661986U priority Critical patent/JPS6399207U/ja
Publication of JPS6399207U publication Critical patent/JPS6399207U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案装置の１実施例の正面図、第２
図は平面図、第３図は側面図、第４図は本考案装
置を使用した実測グラフである。 １：基台、２：直線移動テーブル、３：送りネ
ジ、４：アリ溝レール、９：電磁スケール、１０
：電磁マイクロメータ、１４：金属薄帯。 Figure 1 is a front view of one embodiment of the device of the present invention;
The figure is a plan view, FIG. 3 is a side view, and FIG. 4 is an actual measurement graph using the device of the present invention. 1: Base, 2: Linear movement table, 3: Feed screw, 4: Dovetail rail, 9: Electromagnetic scale, 10
: Electromagnetic micrometer, 14: Metal ribbon.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 基台と、基台上にとりつけた電磁スケールつき
直線移動テーブルと同じく基台から支腕を介して
前記移動テーブル面に対し垂直方向に配設した、
バネ押さえ式測定子を備えた電磁マイクロメータ
と前記電磁スケールと電磁マイクロメータからの
信号を受けてグラフを描くＸＹレコーダとからな
り、前記移動テーブル上に金属薄帯を貼りつけて
前記電磁マイクロメータの下をテーブルを移動さ
せて、該金属薄帯上を前記マイクロメータにより
なぞらせることにより、該金属薄帯の厚さ形状を
測定し得ることを特徴とする金属薄帯の形状測定
装置。 A base, and a linear movable table with an electromagnetic scale mounted on the base, which is arranged perpendicularly to the surface of the movable table from the base via a support arm.
It consists of an electromagnetic micrometer equipped with a spring-loaded measuring head, and an XY recorder that draws a graph by receiving signals from the electromagnetic scale and the electromagnetic micrometer. 1. An apparatus for measuring the shape of a metal ribbon, characterized in that the thickness and shape of the metal ribbon can be measured by moving a table under the metal ribbon and tracing the metal ribbon with the micrometer.
JP19661986U 1986-12-19 1986-12-19 Pending JPS6399207U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19661986U JPS6399207U (en) 1986-12-19 1986-12-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19661986U JPS6399207U (en) 1986-12-19 1986-12-19

Publications (1)

Publication Number Publication Date
JPS6399207U true JPS6399207U (en) 1988-06-27

Family

ID=31155608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19661986U Pending JPS6399207U (en) 1986-12-19 1986-12-19

Country Status (1)

Country Link
JP (1) JPS6399207U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61286701A (en) * 1985-06-14 1986-12-17 Ichikoh Ind Ltd Method for measuring curvature of mirror

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61286701A (en) * 1985-06-14 1986-12-17 Ichikoh Ind Ltd Method for measuring curvature of mirror

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