JPH0187263U - - Google Patents
Info
- Publication number
- JPH0187263U JPH0187263U JP18260387U JP18260387U JPH0187263U JP H0187263 U JPH0187263 U JP H0187263U JP 18260387 U JP18260387 U JP 18260387U JP 18260387 U JP18260387 U JP 18260387U JP H0187263 U JPH0187263 U JP H0187263U
- Authority
- JP
- Japan
- Prior art keywords
- unit
- fixed size
- feeding bed
- size feeding
- axis direction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims 2
- 238000007689 inspection Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第1図は、この考案に係る測定ユニツトの一実
施例としての概略構成を示す側面図、第2図は、
その平面図、第3図は、従来からある測定ユニツ
トの概略構成例を示す平面図である。
1……X−Yユニツト、2,3……X軸ガイド
腕、4……第1Y軸ガイド腕、5……第2Y軸ガ
イド腕、6……第1移動部、7……第2移動部、
8……コンタクトプローブ、11……被測定基板
、21……定寸送り用ベツト。
FIG. 1 is a side view showing the schematic configuration of an embodiment of the measuring unit according to this invention, and FIG.
The plan view, FIG. 3, is a plan view showing a schematic configuration example of a conventional measuring unit. 1... X-Y unit, 2, 3... X-axis guide arm, 4... First Y-axis guide arm, 5... Second Y-axis guide arm, 6... First moving part, 7... Second movement Department,
8... Contact probe, 11... Board to be measured, 21... Fixed size feeding bed.
Claims (1)
能に配設された2本のコンタクトプローブを有し
、かつ、その昇降が可能に形成されたX−Yユニ
ツトと、このX−Yユニツトの下方に配置され、
かつ、一定方向への往復移動を可能に形成された
定寸送り用ベツトとで構成するとともに、この定
寸送り用ベツトにセツトされる被測定基板に対し
ては、定寸送り用ベツトとX−Yユニツトとを相
対的に移動させることで、所定の測定ポイントに
各コンタクトプローブを位置させるようにしたこ
とを特徴とする基板検査装置用測定ユニツト。 An X-Y unit which has two contact probes arranged to be movable separately in the X-axis direction and the Y-axis direction and is formed to be able to move up and down, and this X-Y unit. placed below;
In addition, it is composed of a fixed size feeding bed formed to be able to reciprocate in a fixed direction, and a substrate to be measured that is set in this fixed size feeding bed is connected to the fixed size feeding bed and - A measurement unit for a board inspection apparatus, characterized in that each contact probe is positioned at a predetermined measurement point by moving the contact probe relative to the Y unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18260387U JPH0187263U (en) | 1987-11-30 | 1987-11-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18260387U JPH0187263U (en) | 1987-11-30 | 1987-11-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0187263U true JPH0187263U (en) | 1989-06-08 |
Family
ID=31474050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18260387U Pending JPH0187263U (en) | 1987-11-30 | 1987-11-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0187263U (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5018590A (en) * | 1973-05-10 | 1975-02-27 | ||
JPS5798869A (en) * | 1980-12-12 | 1982-06-19 | Fujitsu Ltd | Checking method for continuity of printed board circuit |
JPS61164168A (en) * | 1985-01-16 | 1986-07-24 | Toshiba Corp | Inspecting device of printed circuit board |
JPS6224370B2 (en) * | 1982-07-08 | 1987-05-28 | Ube Industries |
-
1987
- 1987-11-30 JP JP18260387U patent/JPH0187263U/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5018590A (en) * | 1973-05-10 | 1975-02-27 | ||
JPS5798869A (en) * | 1980-12-12 | 1982-06-19 | Fujitsu Ltd | Checking method for continuity of printed board circuit |
JPS6224370B2 (en) * | 1982-07-08 | 1987-05-28 | Ube Industries | |
JPS61164168A (en) * | 1985-01-16 | 1986-07-24 | Toshiba Corp | Inspecting device of printed circuit board |