JPS6392263U - - Google Patents

Info

Publication number
JPS6392263U
JPS6392263U JP18652686U JP18652686U JPS6392263U JP S6392263 U JPS6392263 U JP S6392263U JP 18652686 U JP18652686 U JP 18652686U JP 18652686 U JP18652686 U JP 18652686U JP S6392263 U JPS6392263 U JP S6392263U
Authority
JP
Japan
Prior art keywords
electronic component
switch
detection electrodes
current
control device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18652686U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18652686U priority Critical patent/JPS6392263U/ja
Publication of JPS6392263U publication Critical patent/JPS6392263U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP18652686U 1986-12-03 1986-12-03 Pending JPS6392263U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18652686U JPS6392263U (enExample) 1986-12-03 1986-12-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18652686U JPS6392263U (enExample) 1986-12-03 1986-12-03

Publications (1)

Publication Number Publication Date
JPS6392263U true JPS6392263U (enExample) 1988-06-15

Family

ID=31136159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18652686U Pending JPS6392263U (enExample) 1986-12-03 1986-12-03

Country Status (1)

Country Link
JP (1) JPS6392263U (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118670A (ja) * 1984-11-14 1986-06-05 Rohm Co Ltd 有極性半導体素子の測定方法
JPS61236135A (ja) * 1985-04-12 1986-10-21 Internatl Rectifier Corp Japan Ltd 電子部品の検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118670A (ja) * 1984-11-14 1986-06-05 Rohm Co Ltd 有極性半導体素子の測定方法
JPS61236135A (ja) * 1985-04-12 1986-10-21 Internatl Rectifier Corp Japan Ltd 電子部品の検査装置

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