JPS6392034A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6392034A
JPS6392034A JP23734686A JP23734686A JPS6392034A JP S6392034 A JPS6392034 A JP S6392034A JP 23734686 A JP23734686 A JP 23734686A JP 23734686 A JP23734686 A JP 23734686A JP S6392034 A JPS6392034 A JP S6392034A
Authority
JP
Japan
Prior art keywords
semiconductor device
film carrier
electrode group
semiconductor devices
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23734686A
Other languages
Japanese (ja)
Inventor
Koji Matsunaga
浩二 松永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP23734686A priority Critical patent/JPS6392034A/en
Publication of JPS6392034A publication Critical patent/JPS6392034A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector

Abstract

PURPOSE:To mount output transistors twice the number in a conventional device in the same mounting area and to double the transfer speed of data, by mounting driving ICs having the same function on both surfaces of one film carrier. CONSTITUTION:First semiconductor devices 3 and second semiconductor devices 4 are connected to both surfaces of inner leads 2 of a film carrier 1. The inner leads 2 of the film carrier 1 correspond to the output transistors of the first and second semiconductor devices every other line. When the first semiconductor device 3 has an odd-numbered line, the second semiconductor device 4 drives an even-numbered line. When the first and second semiconductor devices 3 and 4 are overlapped so that their electrode positions do not agree, the positions are arranged in a zigzag pattern. Since the devices are mounted on both surfaces of the film carrier 1, the transfer speed of data is improved and multiple pins can be implemented without increasing the mounting area.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、高速なデータ転送ができ、多くの出力トラン
ジスタを有する駆動用半導体装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a driving semiconductor device capable of high-speed data transfer and having many output transistors.

従来の技術 液晶、プラズマそしてELなどのフラットディスプレイ
は、大型化の傾向にあり、大きさ14インチ程度、ライ
ン数1000X1000本などが要求されている。
Conventional flat displays, such as liquid crystal, plasma, and EL, are becoming larger, and are required to have a size of about 14 inches and a number of lines of 1000 x 1000.

データの高速化については、データの多ポート入力化に
より対応されているが、現状では1ポ一トcsMHzと
して4ポートで20MHzまでしか対応できず、100
0X1000本程度になると6 oMHz程度の転送速
度が要求され現状のままでは対応が難しくなる。
Data speeding up has been achieved by inputting data into multiple ports, but currently it is only possible to support up to 20MHz with 4 ports, and 100MHz with 4 ports.
When the number of lines increases to about 0x1000, a transfer rate of about 6 oMHz is required, which becomes difficult to support with the current status.

また、1000×1ooO本程度のディスプレイだなる
と、32chの出力トランジスタをもつICが64個程
必要となシ非常に多くのICを実装する必要がでてくる
。物理的には、出力トランジスタの数を増す事ができる
が、ピン数が多くなればなるほど、第2図に示すように
有効素子面積の割合が減してしまう。現在e 4ch程
度がもっとも適当だといわれているが、それでも32個
のICが必要となる。
Furthermore, for a display of approximately 1000 x 100 lines, approximately 64 ICs each having 32 channels of output transistors are required, making it necessary to mount a large number of ICs. Physically, the number of output transistors can be increased, but as the number of pins increases, the effective element area ratio decreases as shown in FIG. Currently, it is said that e4ch is the most suitable, but 32 ICs are still required.

発明が解決しようとする問題点 1000X1000本程度の大型フラットディスプレイ
を駆動するだめに、E50 MHz程度の転送速度およ
び1ooch以上の出力トランジスタを有する駆動用I
Cが必要となる。そこで、転送速度の高速化および多ピ
ン化が課題となっている。
Problems to be Solved by the Invention In order to drive a large flat display of about 1000 x 1000 lines, a driving I having a transfer rate of about E50 MHz and an output transistor of 1ooch or more is required.
C is required. Therefore, increasing the transfer speed and increasing the number of pins have become issues.

問題点を解決するだめの手段 フィルムキャリヤのインナーリードの両面に同じ機能を
有する半導体装置を実装し、しかも互いの電極位置が向
い合せた時に一致しないように配置する。
Means for solving the problem Semiconductor devices having the same function are mounted on both sides of the inner lead of the film carrier, and the electrodes are arranged so that they do not coincide when facing each other.

作  用 フィルムキャリヤの両面に実装するために、実装面積を
増す事なく、データの転送速度および多ピン化を計る事
ができる。
Since it is mounted on both sides of the working film carrier, it is possible to increase the data transfer speed and increase the number of pins without increasing the mounting area.

実施例 本発明の概略図を第1図に示す。Example A schematic diagram of the invention is shown in FIG.

フィルムキャリヤ1のインナーリード2の両面に第1の
半導体装置3と第2の半導体装置4が接続された構造に
なっている。
The structure is such that a first semiconductor device 3 and a second semiconductor device 4 are connected to both sides of an inner lead 2 of a film carrier 1.

同図aは、フィルムキャリヤ1のインナーリード2を示
しており、1本おきに第1および第2の半導体装置の出
力トランジスタに対応するようになっており、第1の半
導体装置3が奇数番号のラインの場合、第゛2の半導体
装置4は偶数番号のラインを駆動する事になる。
Figure a shows the inner leads 2 of the film carrier 1, and every other lead corresponds to the output transistors of the first and second semiconductor devices, with the first semiconductor device 3 being an odd-numbered one. In the case of lines, the second semiconductor device 4 drives even-numbered lines.

同図すは、第1および第2の半導体装置3,4を示して
おり、互いの電極位置が一致しないようになっておυ、
かさね合せた時、チドリ状だなるようになっている。
The figure shows first and second semiconductor devices 3 and 4, and their electrode positions do not match, υ and 4.
When stacked together, it looks like a plover.

同図C接続した時の構造を示す。半導体装置3゜4の電
極上には金属突起Sが形成されており、この金属突起6
を介してインナーリード2と接合されている。
The figure shows the structure when C is connected. A metal protrusion S is formed on the electrode of the semiconductor device 3.4, and this metal protrusion 6
It is connected to the inner lead 2 via.

次に具体例について説明する。Next, a specific example will be explained.

フィルムキャリヤ1は125μm厚のポリイミド上に3
6μm 厚の銅箔のパターンが形成されており、表面は
錫メッキされている。インナーリード2は、第1の半導
体装置3の電極群を第2の半導体装置4の電極群に相対
する位置に形成されている。
The film carrier 1 is 3 on a 125 μm thick polyimide.
A 6 μm thick copper foil pattern is formed, and the surface is tin-plated. The inner lead 2 is formed at a position where the electrode group of the first semiconductor device 3 faces the electrode group of the second semiconductor device 4.

第1および第2の半導体装置3,4は、シフトレジスタ
、ランチそして出力トランジスタの機能を有しており、
大きさは、第1の半導体装置3の方を大きくしてあり、
電極群は、互いにかさなり合わないようにチドリ状に形
成した。Al電極の上にTi とPdのバリアメタルを
介してメッキ法によりAu突起電極5を形成した。デー
タの転送速度は、10MHz 、出力トランジスタは6
4chを有している。
The first and second semiconductor devices 3 and 4 have the functions of a shift register, a launch, and an output transistor,
The first semiconductor device 3 is larger in size,
The electrode group was formed in a staggered shape so as not to overlap each other. An Au protruding electrode 5 was formed on the Al electrode by a plating method via a barrier metal of Ti and Pd. Data transfer speed is 10MHz, output transistor is 6
It has 4ch.

フィルムキャリヤ1との接続は、大きさの小さい第2の
半導体装置4を先に行ない、Auの突起電極と錫メッキ
のリード間にAuSnの合金を形成し接続しそののち、
フィルムキャリヤ1を反転し、第1の半導体装置3を接
続した。つまり、データの転送速度20MHz 、出力
トランジスタは12schを有する事になる。
The connection to the film carrier 1 is made by first connecting the second semiconductor device 4, which is smaller in size, by forming an AuSn alloy between the Au protruding electrode and the tin-plated lead, and then connecting.
The film carrier 1 was inverted and the first semiconductor device 3 was connected. In other words, the data transfer rate is 20 MHz and the output transistor has 12 sch.

このようにして作成した半導体装置を用いてデー)側電
極1024本、スキャン側電極768本を有するELデ
ィスプレイを駆動電圧100Vで駆動した。ELディス
プレイは、データ側、スキャン側ともて電極は、上下お
よび左右に一本おきにより分けており、データ側は61
2本が上下に、スキャン側は384本が左右にふり分け
て形成されている。つまり、実際には、データの転送速
度40MHzで駆動でき、半導体装置の数もデータ側で
8ヶ、スキャン側で6ケで駆動できた。
Using the semiconductor device thus produced, an EL display having 1024 data side electrodes and 768 scan side electrodes was driven at a driving voltage of 100V. In the EL display, the data side, scan side, and front electrodes are separated by every other electrode on the top and bottom and left and right, and the data side has 61 electrodes.
There are 2 wires on the top and bottom, and 384 wires on the scan side, distributed left and right. That is, in reality, it was possible to drive at a data transfer rate of 40 MHz, and the number of semiconductor devices was eight on the data side and six on the scan side.

実施例では、フィルムキャリヤのリードに錫メツキされ
たものを用いたが、これに限定されるものではなく、金
メッキでも良い0また、突起電極の材質も金に限定され
るものではなく、鉛−錫の合金でも良くその形成方法も
メッキ法に限定されず蒸着法でも良い。つまり、フィル
ムキャリヤと突起電極とは、Au−3nやA u −A
 uの接合により行なわれる。
In the example, the leads of the film carrier were plated with tin, but the material is not limited to this and may be plated with gold.Also, the material of the protruding electrodes is not limited to gold, but may be lead-plated or lead-plated. It may be an alloy of tin, and its formation method is not limited to the plating method, but may also be a vapor deposition method. In other words, the film carrier and the protruding electrodes are Au-3n, Au-A
This is done by joining u.

また、実施例ではELディスプレイを用いたが、液晶デ
ィスプレイやプラズマディスプレイにも応用できる。
Further, although an EL display is used in the embodiment, it can also be applied to a liquid crystal display or a plasma display.

発明の効果 −つのフィルムキャリヤの両面に同じ機能を有する駆動
用ICを実装する事だより、同じ実装面積で2倍の出力
トランジスタを有する事ができ、さらにデータの転送速
度も2倍にできるため大型で電極数の多いフラットディ
スプレイにも対応する事ができる。
Effects of the invention - By mounting drive ICs with the same function on both sides of a single film carrier, it is possible to have twice as many output transistors in the same mounting area, and also double the data transfer speed. It can also be used for large flat displays with a large number of electrodes.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図aおよびbは本発明の一実施例における半導体装
置の要部を示す平面図、第1図Cは同断面図、第2図は
端子数の増加に伴なう有効素子面積の割合の減少を示す
平面図である。 1・・・・・・フィルムキャリヤ、2・・・・・・イン
ナーリード、3・・・・・・第1の半導体装置、4・・
・・・・第2の半導体装置、6・・・・・・突起電極。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名/−
−−フィルム午イリャ (6ン (Cジ 第2図
1A and 1B are plan views showing essential parts of a semiconductor device according to an embodiment of the present invention, FIG. 1C is a sectional view of the same, and FIG. 2 is a ratio of effective element area as the number of terminals increases. FIG. DESCRIPTION OF SYMBOLS 1... Film carrier, 2... Inner lead, 3... First semiconductor device, 4...
. . . second semiconductor device, 6 . . . protruding electrode. Name of agent: Patent attorney Toshio Nakao and 1 other person/-
--Film No. 6 (Cji 2nd figure)

Claims (3)

【特許請求の範囲】[Claims] (1)シフトレジスタ、ラッチおよび出力トランジスタ
を有し、入力信号用電極群と出力信号用電極群が周縁に
形成された第1の半導体装置と、前記第1の半導体装置
と同一機能を有し、入力信号用電極群と出力信号用電極
群とが前記第1の半導体装置の電極群とは異なる位置に
形成された第2の半導体装置と、インナリードが前記第
1および第2の半導体装置の入力信号用電極群と出力信
号用電極群と相対する位置まで延在されているフィルム
キャリヤからなり、前記フィルムキャリヤの前記第1の
半導体装置の電極群と相対するインナーリードと前記第
1の半導体装置の電極群とが接続され、前記フィルムキ
ャリヤの前記第2の半導体装置の電極群と相対するイン
ナーリードと、前記第2の半導体装置の電極群とが、前
記第1の半導体装置が接続された反対面で接続されてい
る事を特徴とする半導体装置。
(1) A first semiconductor device that has a shift register, a latch, and an output transistor, and has an input signal electrode group and an output signal electrode group formed on its periphery, and has the same function as the first semiconductor device. , a second semiconductor device in which an input signal electrode group and an output signal electrode group are formed at different positions from the electrode groups of the first semiconductor device; and an inner lead is formed in the first and second semiconductor devices. a film carrier extending to a position facing the input signal electrode group and the output signal electrode group, and an inner lead of the film carrier facing the electrode group of the first semiconductor device; The first semiconductor device is connected to an inner lead of the film carrier facing the electrode group of the second semiconductor device, and the electrode group of the second semiconductor device is connected to the first semiconductor device. A semiconductor device characterized in that the semiconductor device is connected on opposite sides.
(2)第1および第2の半導体装置の電極群に金属の突
起が形成された事を特徴とする特許請求の範囲第1項記
載の半導体装置。
(2) The semiconductor device according to claim 1, wherein metal protrusions are formed on the electrode groups of the first and second semiconductor devices.
(3)金属突起が金および錫−鉛の合金からなる事を特
徴とする特許請求の範囲第2項記載の半導体装置。
(3) The semiconductor device according to claim 2, wherein the metal protrusion is made of gold and a tin-lead alloy.
JP23734686A 1986-10-06 1986-10-06 Semiconductor device Pending JPS6392034A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23734686A JPS6392034A (en) 1986-10-06 1986-10-06 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23734686A JPS6392034A (en) 1986-10-06 1986-10-06 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6392034A true JPS6392034A (en) 1988-04-22

Family

ID=17014026

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23734686A Pending JPS6392034A (en) 1986-10-06 1986-10-06 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6392034A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6664618B2 (en) 2001-05-16 2003-12-16 Oki Electric Industry Co., Ltd. Tape carrier package having stacked semiconductor elements, and short and long leads
JP2009064854A (en) * 2007-09-05 2009-03-26 Nec Electronics Corp Lead frame, semiconductor device, and manufacturing method of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6664618B2 (en) 2001-05-16 2003-12-16 Oki Electric Industry Co., Ltd. Tape carrier package having stacked semiconductor elements, and short and long leads
JP2009064854A (en) * 2007-09-05 2009-03-26 Nec Electronics Corp Lead frame, semiconductor device, and manufacturing method of semiconductor device

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