JPS6384530U - - Google Patents
Info
- Publication number
- JPS6384530U JPS6384530U JP17823186U JP17823186U JPS6384530U JP S6384530 U JPS6384530 U JP S6384530U JP 17823186 U JP17823186 U JP 17823186U JP 17823186 U JP17823186 U JP 17823186U JP S6384530 U JPS6384530 U JP S6384530U
- Authority
- JP
- Japan
- Prior art keywords
- wavelength
- absorbance
- spectrometer
- measure
- main
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000006185 dispersion Substances 0.000 claims description 3
- 238000002835 absorbance Methods 0.000 claims 4
- 238000010521 absorption reaction Methods 0.000 claims 2
- 230000000694 effects Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第1図は本考案の一実施例を示す構成図、第2
図は分散子を固定したまま波長を副波長に変える
構成図である。
1…光源、2…分散子、3…溶液試料、4…透
明板、5…受光器、6…レンズ、7…ミラー、8
…出射スリツト、9…入射スリツト、10…信号
処理部。
Fig. 1 is a configuration diagram showing one embodiment of the present invention;
The figure is a configuration diagram in which the wavelength is changed to a sub-wavelength while the dispersion element is fixed. DESCRIPTION OF SYMBOLS 1... Light source, 2... Dispersion element, 3... Solution sample, 4... Transparent plate, 5... Light receiver, 6... Lens, 7... Mirror, 8
... Output slit, 9... Input slit, 10... Signal processing unit.
Claims (1)
合いの少ない副波長における吸光度を測定し、両
波長における吸光度の差または比によつて、試料
による散乱等の影響を軽減して、濃度を測定する
二波長光度計において、まず主波長における吸光
度を測定し、次に分光器の分散子を固定したまま
分光器中の光路中に透明板を傾斜させて挿入し、
分光器の出射スリツトより出射する光の波長を変
えて副波長における吸光度を測定することを特徴
とする二波長分光光度計。 Measure the absorbance at the main wavelength in the main absorption band of the solution sample and at the subwavelength where the degree of absorption is low, and use the difference or ratio of the absorbance at both wavelengths to reduce the effects of scattering etc. due to the sample and calculate the concentration. In the two-wavelength photometer to be measured, first measure the absorbance at the dominant wavelength, then insert the transparent plate at an angle into the optical path of the spectrometer while keeping the dispersion of the spectrometer fixed.
A two-wavelength spectrophotometer characterized by measuring absorbance at a sub-wavelength by changing the wavelength of light emitted from an output slit of a spectrometer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17823186U JPS6384530U (en) | 1986-11-21 | 1986-11-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17823186U JPS6384530U (en) | 1986-11-21 | 1986-11-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6384530U true JPS6384530U (en) | 1988-06-02 |
Family
ID=31120172
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17823186U Pending JPS6384530U (en) | 1986-11-21 | 1986-11-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6384530U (en) |
-
1986
- 1986-11-21 JP JP17823186U patent/JPS6384530U/ja active Pending
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