JPS6375876U - - Google Patents
Info
- Publication number
- JPS6375876U JPS6375876U JP17051886U JP17051886U JPS6375876U JP S6375876 U JPS6375876 U JP S6375876U JP 17051886 U JP17051886 U JP 17051886U JP 17051886 U JP17051886 U JP 17051886U JP S6375876 U JPS6375876 U JP S6375876U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- pads
- circuit device
- insulating substrate
- bumps
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011156 evaluation Methods 0.000 claims description 2
- 239000000758 substrate Substances 0.000 claims description 2
- 238000002788 crimping Methods 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17051886U JPS6375876U (un) | 1986-11-06 | 1986-11-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17051886U JPS6375876U (un) | 1986-11-06 | 1986-11-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6375876U true JPS6375876U (un) | 1988-05-20 |
Family
ID=31105322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17051886U Pending JPS6375876U (un) | 1986-11-06 | 1986-11-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6375876U (un) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0481668A (ja) * | 1990-07-25 | 1992-03-16 | Taiyo Kogyo Kk | プリント基板の検査装置およびピッチ変換基板 |
| WO2000004394A1 (fr) * | 1998-07-16 | 2000-01-27 | Advantest Corporation | Support pour mesure de dispositif et procede de mesure de dispositif |
-
1986
- 1986-11-06 JP JP17051886U patent/JPS6375876U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0481668A (ja) * | 1990-07-25 | 1992-03-16 | Taiyo Kogyo Kk | プリント基板の検査装置およびピッチ変換基板 |
| WO2000004394A1 (fr) * | 1998-07-16 | 2000-01-27 | Advantest Corporation | Support pour mesure de dispositif et procede de mesure de dispositif |