JPS6371659A - 検針ユニツト - Google Patents
検針ユニツトInfo
- Publication number
- JPS6371659A JPS6371659A JP61216634A JP21663486A JPS6371659A JP S6371659 A JPS6371659 A JP S6371659A JP 61216634 A JP61216634 A JP 61216634A JP 21663486 A JP21663486 A JP 21663486A JP S6371659 A JPS6371659 A JP S6371659A
- Authority
- JP
- Japan
- Prior art keywords
- inspecting
- stylus
- holders
- holder
- insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61216634A JPS6371659A (ja) | 1986-09-12 | 1986-09-12 | 検針ユニツト |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61216634A JPS6371659A (ja) | 1986-09-12 | 1986-09-12 | 検針ユニツト |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6371659A true JPS6371659A (ja) | 1988-04-01 |
| JPH0516747B2 JPH0516747B2 (enrdf_load_html_response) | 1993-03-05 |
Family
ID=16691508
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61216634A Granted JPS6371659A (ja) | 1986-09-12 | 1986-09-12 | 検針ユニツト |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6371659A (enrdf_load_html_response) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6144212A (en) * | 1997-10-21 | 2000-11-07 | Mitsubishi Denki Kabushiki Kaisha | Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS547816U (enrdf_load_html_response) * | 1977-06-18 | 1979-01-19 |
-
1986
- 1986-09-12 JP JP61216634A patent/JPS6371659A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS547816U (enrdf_load_html_response) * | 1977-06-18 | 1979-01-19 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6144212A (en) * | 1997-10-21 | 2000-11-07 | Mitsubishi Denki Kabushiki Kaisha | Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0516747B2 (enrdf_load_html_response) | 1993-03-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| MY146719A (en) | Probe assembly, method of producing it and electrical connecting apparatus | |
| CN210775685U (zh) | 一种检测手机摄像头用的治具 | |
| JP2009079905A (ja) | 電子部品の評価試験用治具及び評価試験用電極 | |
| EP0838685A3 (en) | Probe card with needle-like probes resiliently supported by rigid substrate and process for fabricating thereof | |
| JPH0926446A (ja) | 電気抵抗測定装置 | |
| JPS6371659A (ja) | 検針ユニツト | |
| CN2494034Y (zh) | 用于测试半导体封装元件的治具 | |
| JP3691368B2 (ja) | プリント配線板の導通検査治具 | |
| US6164982A (en) | IC socket for holding IC having multiple parallel pins | |
| JP3803692B2 (ja) | 水平保持機構及びそれを用いたプリント基板回路検査装置又は部品ハンダ付け装置 | |
| JPS63235870A (ja) | 検針ユニツト | |
| CN212660331U (zh) | 听音笔 | |
| DE69901821D1 (de) | Kopf zum prüfen der lineardimension | |
| CN214377682U (zh) | 一种存储卡测试组件 | |
| JPH04206752A (ja) | 面実装形icの検査装置 | |
| CN220508265U (zh) | 温度校准装置 | |
| CN222964685U (zh) | 电池检测装置 | |
| CN218567531U (zh) | 一种检测治具 | |
| CN216434288U (zh) | 一种用于测试多种电路板的测试治具 | |
| CN211043492U (zh) | 便于测量信号的电路板结构 | |
| CN222979694U (zh) | 一种热电阻检定用接线装置 | |
| CN218037060U (zh) | 一种电阻测试装置 | |
| TWM456491U (zh) | 測試分類設備之接合板組與測試連接器之易拆組構造 | |
| CN112698098B (zh) | 一种测量卷带包裹式电阻装置 | |
| CN208537650U (zh) | 一种应用于电子器件的同步充电测试装置 |