JPS636862B2 - - Google Patents
Info
- Publication number
- JPS636862B2 JPS636862B2 JP54113707A JP11370779A JPS636862B2 JP S636862 B2 JPS636862 B2 JP S636862B2 JP 54113707 A JP54113707 A JP 54113707A JP 11370779 A JP11370779 A JP 11370779A JP S636862 B2 JPS636862 B2 JP S636862B2
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- pattern
- photomask
- mask substrate
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11370779A JPS5638475A (en) | 1979-09-05 | 1979-09-05 | Fabrication of photomask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11370779A JPS5638475A (en) | 1979-09-05 | 1979-09-05 | Fabrication of photomask |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5638475A JPS5638475A (en) | 1981-04-13 |
JPS636862B2 true JPS636862B2 (enrdf_load_stackoverflow) | 1988-02-12 |
Family
ID=14619119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11370779A Granted JPS5638475A (en) | 1979-09-05 | 1979-09-05 | Fabrication of photomask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5638475A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10960711B2 (en) | 2015-06-15 | 2021-03-30 | Bridgestone Corporation | Pneumatic tire |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2710967B2 (ja) | 1988-11-22 | 1998-02-10 | 株式会社日立製作所 | 集積回路装置の製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5251874A (en) * | 1975-10-22 | 1977-04-26 | Jeol Ltd | Electron beam exposure device |
-
1979
- 1979-09-05 JP JP11370779A patent/JPS5638475A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10960711B2 (en) | 2015-06-15 | 2021-03-30 | Bridgestone Corporation | Pneumatic tire |
Also Published As
Publication number | Publication date |
---|---|
JPS5638475A (en) | 1981-04-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3371852B2 (ja) | レチクル | |
US6083807A (en) | Overlay measuring mark and its method | |
US5128283A (en) | Method of forming mask alignment marks | |
KR19990083365A (ko) | 반도체제조방법및제조장치,및그것에의해제조된반도체디바이스 | |
JPH0321901B2 (enrdf_load_stackoverflow) | ||
US6309944B1 (en) | Overlay matching method which eliminates alignment induced errors and optimizes lens matching | |
JPH0450730B2 (enrdf_load_stackoverflow) | ||
US20100019241A1 (en) | Semiconductor device, fabrication method thereof, and photomask | |
JPH05205994A (ja) | アライメントマーク及びこれを用いたアライメント方法 | |
JPS636862B2 (enrdf_load_stackoverflow) | ||
JP2002190442A (ja) | 校正用プレート、校正用プレート生成方法、及び半導体装置の製造方法 | |
JP4304413B2 (ja) | 半導体露光装置のレチクルのレベル測定方法 | |
US5202204A (en) | Process of producing exposure mask | |
JP2004327831A (ja) | フォーカスモニタ用マスクの製造方法及び半導体装置の製造方法 | |
JP3658142B2 (ja) | 計測方法およびデバイス製造方法 | |
JPH04136855A (ja) | 露光用マスクの製造方法 | |
JPS5885532A (ja) | 電子ビ−ムによる位置決め方法 | |
JP2964978B2 (ja) | 半導体製造方法と半導体製造システムおよびそれらにより製造された半導体デバイス | |
JP2687256B2 (ja) | X線マスク作成方法 | |
JP3529967B2 (ja) | アライメントマーク付きフォトマスク用ブランクスの製造方法 | |
JPS6152973B2 (enrdf_load_stackoverflow) | ||
JPH06188179A (ja) | パターン形成方法および合わせずれ量測定装置の較正方法と合わせずれ量の測定方法とその測定装置 | |
JPH02280162A (ja) | マスクパターン形成方法 | |
JP2000275816A (ja) | フォトマスク基板およびフォトマスクの製造方法 | |
JPH04121745A (ja) | レティクルの製造方法 |