JPS6367884U - - Google Patents
Info
- Publication number
- JPS6367884U JPS6367884U JP9432786U JP9432786U JPS6367884U JP S6367884 U JPS6367884 U JP S6367884U JP 9432786 U JP9432786 U JP 9432786U JP 9432786 U JP9432786 U JP 9432786U JP S6367884 U JPS6367884 U JP S6367884U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- semiconductor
- test
- center conductor
- coaxial line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
- 239000004020 conductor Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9432786U JPS6367884U (de) | 1986-06-20 | 1986-06-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9432786U JPS6367884U (de) | 1986-06-20 | 1986-06-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6367884U true JPS6367884U (de) | 1988-05-07 |
Family
ID=30957672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9432786U Pending JPS6367884U (de) | 1986-06-20 | 1986-06-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6367884U (de) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61107168A (ja) * | 1984-10-31 | 1986-05-26 | Hitachi Ltd | 低温用プロ−ブ |
| JPS61187244A (ja) * | 1985-02-14 | 1986-08-20 | Matsushita Electronics Corp | 半導体評価装置 |
-
1986
- 1986-06-20 JP JP9432786U patent/JPS6367884U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61107168A (ja) * | 1984-10-31 | 1986-05-26 | Hitachi Ltd | 低温用プロ−ブ |
| JPS61187244A (ja) * | 1985-02-14 | 1986-08-20 | Matsushita Electronics Corp | 半導体評価装置 |