JPS6363755U - - Google Patents
Info
- Publication number
- JPS6363755U JPS6363755U JP15776286U JP15776286U JPS6363755U JP S6363755 U JPS6363755 U JP S6363755U JP 15776286 U JP15776286 U JP 15776286U JP 15776286 U JP15776286 U JP 15776286U JP S6363755 U JPS6363755 U JP S6363755U
- Authority
- JP
- Japan
- Prior art keywords
- inductively coupled
- coupled plasma
- emission spectrometer
- wavelengths
- list
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004458 analytical method Methods 0.000 claims description 5
- 238000000295 emission spectrum Methods 0.000 claims description 4
- 230000000737 periodic effect Effects 0.000 claims description 2
- 238000009616 inductively coupled plasma Methods 0.000 claims 6
- 230000003287 optical effect Effects 0.000 claims 4
- 230000035945 sensitivity Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
第１図は本考案の実施例を示すブロツク図、第
２図は本考案による周期律表の表示例、第３図は
本考案による任意の元素の分析用発光スペクトル
線の波長のリストの表示例、第４図は本考案によ
る任意の波長の近傍に存在する適当な元素の分析
用発光スペクトル線の波長のリストの表示例、第
５図は各種情報を表示しない場合の表示例である
。
Fig. 1 is a block diagram showing an embodiment of the present invention, Fig. 2 is a display example of the periodic table according to the present invention, and Fig. 3 is a list of wavelengths of emission spectrum lines for analysis of arbitrary elements according to the present invention. As an example, FIG. 4 is a display example of a list of wavelengths of emission spectrum lines for analysis of suitable elements existing in the vicinity of arbitrary wavelengths according to the present invention, and FIG. 5 is a display example when various information is not displayed.
Claims (1)
に、前記デイスプレイ上の情報を破壊することな
く、任意に表示させ、かつ、消去させ得ることを
特徴とする前記デイスプレイ上に、分析条件や分
析結果を表示するコンピユータ制御された誘導結
合プラズマ発光分光分析装置。 (2) 前記第１項に於いて、前記必要な情報が元
素の周期律表である誘導結合プラズマ発光分光分
析装置。 (3) 前記第１項に於いて、前記必要な情報が、
任意の元素の分析用発光スペクトル線の波長のリ
ストである誘導結合プラズマ発光分光分析装置。 (4) 前記第３項に於いて、前記波長のリストに
各波長の分析感度が並記されている誘導結合プラ
ズマ発光分光分析装置。 (5) 前記第１項に於いて、前記必要な情報とは
、任意の波長の近傍に存在する適当な元素の分析
用発光スペクトル線の波長のリストである誘導結
合プラズマ発光分光分析装置。 (6) 前記第５項に於いて、前記波長のリストに
、各波長の分析感度が並記されている誘導結合プ
ラズマ発光分光分析装置。[Claims for Utility Model Registration] (1) Necessary information can be displayed and erased on the computer display at will without destroying the information on the display. , a computer-controlled inductively coupled plasma emission spectrometer that displays analysis conditions and results. (2) In the above item 1, the inductively coupled plasma optical emission spectrometer, wherein the necessary information is a periodic table of elements. (3) In paragraph 1 above, if the necessary information is
Inductively coupled plasma optical emission spectrometer, which is a list of wavelengths of emission spectrum lines for analysis of any element. (4) In the above item 3, the inductively coupled plasma optical emission spectrometer, wherein the list of wavelengths includes the analytical sensitivity of each wavelength. (5) In the above item 1, in an inductively coupled plasma emission spectrometer, the necessary information is a list of wavelengths of emission spectrum lines for analysis of suitable elements existing in the vicinity of arbitrary wavelengths. (6) In the item 5 above, the inductively coupled plasma optical emission spectrometer, wherein the list of wavelengths includes the analytical sensitivity of each wavelength.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15776286U JPS6363755U (en) | 1986-10-15 | 1986-10-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15776286U JPS6363755U (en) | 1986-10-15 | 1986-10-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6363755U true JPS6363755U (en) | 1988-04-27 |
Family
ID=31080615
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15776286U Pending JPS6363755U (en) | 1986-10-15 | 1986-10-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6363755U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10309903B2 (en) | 2017-03-21 | 2019-06-04 | Hitachi High-Tech Science Corporation | ICP emission spectrophotometer |
-
1986
- 1986-10-15 JP JP15776286U patent/JPS6363755U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10309903B2 (en) | 2017-03-21 | 2019-06-04 | Hitachi High-Tech Science Corporation | ICP emission spectrophotometer |
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