JPS636363U - - Google Patents
Info
- Publication number
- JPS636363U JPS636363U JP9700686U JP9700686U JPS636363U JP S636363 U JPS636363 U JP S636363U JP 9700686 U JP9700686 U JP 9700686U JP 9700686 U JP9700686 U JP 9700686U JP S636363 U JPS636363 U JP S636363U
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- under test
- output
- input
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000017525 heat dissipation Effects 0.000 claims 1
- 230000005855 radiation Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9700686U JPS636363U (enExample) | 1986-06-24 | 1986-06-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9700686U JPS636363U (enExample) | 1986-06-24 | 1986-06-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS636363U true JPS636363U (enExample) | 1988-01-16 |
Family
ID=30963463
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9700686U Pending JPS636363U (enExample) | 1986-06-24 | 1986-06-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS636363U (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05196686A (ja) * | 1992-01-20 | 1993-08-06 | Nec Yamagata Ltd | 半導体測定治具 |
| JP2009168471A (ja) * | 2008-01-10 | 2009-07-30 | Tamagawa Electronics Co Ltd | 半導体装置の試験装置 |
-
1986
- 1986-06-24 JP JP9700686U patent/JPS636363U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05196686A (ja) * | 1992-01-20 | 1993-08-06 | Nec Yamagata Ltd | 半導体測定治具 |
| JP2009168471A (ja) * | 2008-01-10 | 2009-07-30 | Tamagawa Electronics Co Ltd | 半導体装置の試験装置 |