JPS636363U - - Google Patents

Info

Publication number
JPS636363U
JPS636363U JP9700686U JP9700686U JPS636363U JP S636363 U JPS636363 U JP S636363U JP 9700686 U JP9700686 U JP 9700686U JP 9700686 U JP9700686 U JP 9700686U JP S636363 U JPS636363 U JP S636363U
Authority
JP
Japan
Prior art keywords
transistor
under test
output
input
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9700686U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9700686U priority Critical patent/JPS636363U/ja
Publication of JPS636363U publication Critical patent/JPS636363U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP9700686U 1986-06-24 1986-06-24 Pending JPS636363U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9700686U JPS636363U (enExample) 1986-06-24 1986-06-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9700686U JPS636363U (enExample) 1986-06-24 1986-06-24

Publications (1)

Publication Number Publication Date
JPS636363U true JPS636363U (enExample) 1988-01-16

Family

ID=30963463

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9700686U Pending JPS636363U (enExample) 1986-06-24 1986-06-24

Country Status (1)

Country Link
JP (1) JPS636363U (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05196686A (ja) * 1992-01-20 1993-08-06 Nec Yamagata Ltd 半導体測定治具
JP2009168471A (ja) * 2008-01-10 2009-07-30 Tamagawa Electronics Co Ltd 半導体装置の試験装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05196686A (ja) * 1992-01-20 1993-08-06 Nec Yamagata Ltd 半導体測定治具
JP2009168471A (ja) * 2008-01-10 2009-07-30 Tamagawa Electronics Co Ltd 半導体装置の試験装置

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