JPS636363U - - Google Patents
Info
- Publication number
- JPS636363U JPS636363U JP9700686U JP9700686U JPS636363U JP S636363 U JPS636363 U JP S636363U JP 9700686 U JP9700686 U JP 9700686U JP 9700686 U JP9700686 U JP 9700686U JP S636363 U JPS636363 U JP S636363U
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- under test
- output
- input
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000017525 heat dissipation Effects 0.000 claims 1
- 230000005855 radiation Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図はこの考案の高周波高出力トランジスタ
試験装置の一実施例を示す斜視図、第２図はアー
ムを分解した状態を示す斜視図、第３図は従来の
高周波高出力トランジスタ試験装置を示す斜視図
である。
図において、１は放熱器、２は入力回路、３は
出力回路、４は供試トランジスタ、４ａは放熱用
フランジ、４ｂは入出力リード、５はアーム、６
は回転用軸、７，８，９は誘電体部材、１０は操
作用ノブ、１１はレバー、１２，１３はつる巻き
ばねである。なお、各図中の同一符号は同一また
は相当部分を示す。
Fig. 1 is a perspective view showing an embodiment of the high frequency, high power transistor testing device of this invention, Fig. 2 is a perspective view showing the arm disassembled, and Fig. 3 is a conventional high frequency, high power transistor testing device. FIG. In the figure, 1 is a heatsink, 2 is an input circuit, 3 is an output circuit, 4 is a transistor under test, 4a is a heat radiation flange, 4b is an input/output lead, 5 is an arm, 6
1 is a rotating shaft; 7, 8, and 9 are dielectric members; 10 is an operating knob; 11 is a lever; and 12, 13 are helical springs. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
られる放熱器と、前記供試トランジスタの入出力
リードと接続される入力回路および出力回路とを
備え、前記供試トランジスタを固定した後試験を
行う高周波高出力トランジスタ試験装置において
、前記供試トランジスタの放熱用フランジを押し
付ける誘電体部材と前記入出力リードを押し付け
る誘電体部材とを有し、これらの誘電体部材をそ
れぞれ異なる圧力で押し付けて固定することが可
能な供試トランジスタ固定手段を備えたことを特
徴とする高周波高出力トランジスタ試験装置。 A heatsink to which a test transistor for high frequency and high power is attached, and an input circuit and an output circuit connected to the input/output leads of the transistor under test, and a high frequency and high power test is carried out after the transistor under test is fixed. The transistor testing device has a dielectric member that presses the heat dissipation flange of the transistor under test and a dielectric member that presses the input/output lead, and it is possible to press and fix these dielectric members with different pressures. A high-frequency, high-output transistor testing device characterized by comprising means for fixing a transistor under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9700686U JPS636363U (en) | 1986-06-24 | 1986-06-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9700686U JPS636363U (en) | 1986-06-24 | 1986-06-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS636363U true JPS636363U (en) | 1988-01-16 |
Family
ID=30963463
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9700686U Pending JPS636363U (en) | 1986-06-24 | 1986-06-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS636363U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05196686A (en) * | 1992-01-20 | 1993-08-06 | Nec Yamagata Ltd | Semiconductor measuring jig |
| JP2009168471A (en) * | 2008-01-10 | 2009-07-30 | Tamagawa Electronics Co Ltd | Semiconductor device test apparatus |
-
1986
- 1986-06-24 JP JP9700686U patent/JPS636363U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05196686A (en) * | 1992-01-20 | 1993-08-06 | Nec Yamagata Ltd | Semiconductor measuring jig |
| JP2009168471A (en) * | 2008-01-10 | 2009-07-30 | Tamagawa Electronics Co Ltd | Semiconductor device test apparatus |
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