JPS6361615B2 - - Google Patents
Info
- Publication number
- JPS6361615B2 JPS6361615B2 JP54155118A JP15511879A JPS6361615B2 JP S6361615 B2 JPS6361615 B2 JP S6361615B2 JP 54155118 A JP54155118 A JP 54155118A JP 15511879 A JP15511879 A JP 15511879A JP S6361615 B2 JPS6361615 B2 JP S6361615B2
- Authority
- JP
- Japan
- Prior art keywords
- point
- straight line
- arm
- moving table
- distance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 claims description 45
- 238000000441 X-ray spectroscopy Methods 0.000 claims 2
- 238000004611 spectroscopical analysis Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 11
- 230000000694 effects Effects 0.000 description 3
- 238000003754 machining Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15511879A JPS5679240A (en) | 1979-11-30 | 1979-11-30 | X-ray spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15511879A JPS5679240A (en) | 1979-11-30 | 1979-11-30 | X-ray spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5679240A JPS5679240A (en) | 1981-06-29 |
| JPS6361615B2 true JPS6361615B2 (pm) | 1988-11-29 |
Family
ID=15598965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15511879A Granted JPS5679240A (en) | 1979-11-30 | 1979-11-30 | X-ray spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5679240A (pm) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59221646A (ja) * | 1983-05-31 | 1984-12-13 | Shimadzu Corp | Ｘ線分光器 |
| JPS60190844A (ja) * | 1984-03-12 | 1985-09-28 | Hitachi Ltd | けい光ｘ線構造解析装置 |
| US12235228B2 (en) * | 2019-10-21 | 2025-02-25 | Easyxafs, Llc | Spectrometer |
-
1979
- 1979-11-30 JP JP15511879A patent/JPS5679240A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5679240A (en) | 1981-06-29 |
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