JPS6358740U - - Google Patents
Info
- Publication number
- JPS6358740U JPS6358740U JP15260086U JP15260086U JPS6358740U JP S6358740 U JPS6358740 U JP S6358740U JP 15260086 U JP15260086 U JP 15260086U JP 15260086 U JP15260086 U JP 15260086U JP S6358740 U JPS6358740 U JP S6358740U
- Authority
- JP
- Japan
- Prior art keywords
- sample surface
- ray
- diffraction angle
- detector
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 claims 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は本考案実施例の正面図、第２図は第１
図の装置の右側面図である。なお図において、１
はコリメータ、２はＸ線管、３は試料、４は軸、
５および６は微調整腕、７および８は位置敏感形
Ｘ線検出器、９はＸ線窓である。
Fig. 1 is a front view of the embodiment of the present invention, and Fig. 2 is a front view of the embodiment of the present invention.
FIG. 3 is a right side view of the device shown in the figure. In the figure, 1
is the collimator, 2 is the X-ray tube, 3 is the sample, 4 is the axis,
5 and 6 are fine adjustment arms, 7 and 8 are position sensitive X-ray detectors, and 9 is an X-ray window.
Claims (1)
るコリメータと上記試料面で所望の平面内に回折
したＸ線の回折角をそれぞれ検出する複数個の位
置敏感形Ｘ線検出器とよりなり、かつ上記複数個
のＸ線検出器のうち回折角の大きいＸ線の検出器
を試料面から遠い位置に配置して回折角の小さい
Ｘ線の検出器を上記検出器より試料面に近い位置
に配置したＸ線回折測定装置。 It consists of a collimator that makes narrow parallel X-rays of a predetermined wavelength incident on the sample surface, and a plurality of position-sensitive X-ray detectors that respectively detect the diffraction angle of the X-rays diffracted in a desired plane on the sample surface, And among the plurality of X-ray detectors, the X-ray detector with a large diffraction angle is placed at a position far from the sample surface, and the X-ray detector with a small diffraction angle is placed at a position closer to the sample surface than the above-mentioned detector. X-ray diffraction measurement device installed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986152600U JPH0714873Y2 (en) | 1986-10-06 | 1986-10-06 | X-ray diffraction measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986152600U JPH0714873Y2 (en) | 1986-10-06 | 1986-10-06 | X-ray diffraction measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6358740U true JPS6358740U (en) | 1988-04-19 |
| JPH0714873Y2 JPH0714873Y2 (en) | 1995-04-10 |
Family
ID=31070730
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986152600U Expired - Lifetime JPH0714873Y2 (en) | 1986-10-06 | 1986-10-06 | X-ray diffraction measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714873Y2 (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4851679A (en) * | 1971-10-29 | 1973-07-20 | ||
| JPS55163445A (en) * | 1979-06-06 | 1980-12-19 | Kawasaki Steel Corp | On-line measurement of austenitic quantity in rolled steel plate |
-
1986
- 1986-10-06 JP JP1986152600U patent/JPH0714873Y2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4851679A (en) * | 1971-10-29 | 1973-07-20 | ||
| JPS55163445A (en) * | 1979-06-06 | 1980-12-19 | Kawasaki Steel Corp | On-line measurement of austenitic quantity in rolled steel plate |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0714873Y2 (en) | 1995-04-10 |
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