JPS6357745U - - Google Patents
Info
- Publication number
- JPS6357745U JPS6357745U JP15101186U JP15101186U JPS6357745U JP S6357745 U JPS6357745 U JP S6357745U JP 15101186 U JP15101186 U JP 15101186U JP 15101186 U JP15101186 U JP 15101186U JP S6357745 U JPS6357745 U JP S6357745U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- card
- probe card
- needles
- rows
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 10
- 239000004065 semiconductor Substances 0.000 claims 1
- 239000000463 material Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15101186U JPS6357745U (ko) | 1986-09-30 | 1986-09-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15101186U JPS6357745U (ko) | 1986-09-30 | 1986-09-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6357745U true JPS6357745U (ko) | 1988-04-18 |
Family
ID=31067679
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15101186U Pending JPS6357745U (ko) | 1986-09-30 | 1986-09-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6357745U (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002082528A1 (fr) * | 2001-04-04 | 2002-10-17 | Fujitsu Limited | Appareil contacteur pour dispositif semi-conducteur et procede de test dudit dispositif semi-conducteur |
-
1986
- 1986-09-30 JP JP15101186U patent/JPS6357745U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002082528A1 (fr) * | 2001-04-04 | 2002-10-17 | Fujitsu Limited | Appareil contacteur pour dispositif semi-conducteur et procede de test dudit dispositif semi-conducteur |