JPS6354057U - - Google Patents

Info

Publication number
JPS6354057U
JPS6354057U JP14712586U JP14712586U JPS6354057U JP S6354057 U JPS6354057 U JP S6354057U JP 14712586 U JP14712586 U JP 14712586U JP 14712586 U JP14712586 U JP 14712586U JP S6354057 U JPS6354057 U JP S6354057U
Authority
JP
Japan
Prior art keywords
collimator
radiation
analysis
refracts
focuses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14712586U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14712586U priority Critical patent/JPS6354057U/ja
Publication of JPS6354057U publication Critical patent/JPS6354057U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案の実施例で、第１図は一部を縦断
した側面図、第２図は第１図の一部を縦断して拡
大した図、第３図は第２図のＡ―Ａ断面図である
。 なお図において、１はＸ線源、２はコリメータ
、３は試料、４は回転台、５はゴニオメータヘツ
ド、６はつまみ、７は望遠鏡、８はガイド、９は
投光器、１０，１１，１２はレンズ、１３は反射
鏡、１４は光フアイバー、１５は光源、１６はコ
ネクタ、１７は光線投射口、１８は開口である。 The drawings show an embodiment of the present invention; Fig. 1 is a partially longitudinal side view, Fig. 2 is an enlarged longitudinally sectional view of Fig. 1, and Fig. 3 is an A-A of Fig. 2. FIG. In the figure, 1 is an X-ray source, 2 is a collimator, 3 is a sample, 4 is a rotating table, 5 is a goniometer head, 6 is a knob, 7 is a telescope, 8 is a guide, 9 is a floodlight, 10, 11, and 12 are 13 is a reflecting mirror, 14 is an optical fiber, 15 is a light source, 16 is a connector, 17 is a light beam projection port, and 18 is an aperture.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 放射線を細い平行ビームに絞つて試料面上に入
射させるコリメータの基部に可視光線の投光器を
それらの軸が直交するように取付けると共に上記
コリメータの軸と投光器の軸との交点に前記投光
器の投射光をコリメータの軸に沿つてその先端方
向へ屈折させる反射鏡を配置した放射線分析の分
析位置検出装置。 A visible light projector is attached to the base of a collimator that focuses the radiation into a thin parallel beam and makes it incident on the sample surface, so that their axes are perpendicular to each other. An analysis position detection device for radiation analysis that has a reflector that refracts the light along the axis of the collimator toward its tip.
JP14712586U 1986-09-27 1986-09-27 Pending JPS6354057U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14712586U JPS6354057U (en) 1986-09-27 1986-09-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14712586U JPS6354057U (en) 1986-09-27 1986-09-27

Publications (1)

Publication Number Publication Date
JPS6354057U true JPS6354057U (en) 1988-04-11

Family

ID=31060205

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14712586U Pending JPS6354057U (en) 1986-09-27 1986-09-27

Country Status (1)

Country Link
JP (1) JPS6354057U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014076974A1 (en) * 2012-11-16 2014-05-22 パルステック工業株式会社 Diffraction ring forming device and diffraction ring forming system
JP5967394B2 (en) * 2013-02-21 2016-08-10 パルステック工業株式会社 Diffraction ring forming device and X-ray diffraction measuring device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4898891A (en) * 1972-02-24 1973-12-14
JPS51121388A (en) * 1975-04-16 1976-10-23 Nec Corp Apparatus for adjusting a specimen for x-ray diffration camera

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4898891A (en) * 1972-02-24 1973-12-14
JPS51121388A (en) * 1975-04-16 1976-10-23 Nec Corp Apparatus for adjusting a specimen for x-ray diffration camera

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014076974A1 (en) * 2012-11-16 2014-05-22 パルステック工業株式会社 Diffraction ring forming device and diffraction ring forming system
JP2014098677A (en) * 2012-11-16 2014-05-29 Pulstec Industrial Co Ltd Diffraction ring formation device, and diffraction ring formation system
JP5967394B2 (en) * 2013-02-21 2016-08-10 パルステック工業株式会社 Diffraction ring forming device and X-ray diffraction measuring device

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