JPS5971157U - Scanning device in spectrometer - Google Patents

Scanning device in spectrometer

Info

Publication number
JPS5971157U
JPS5971157U JP16669282U JP16669282U JPS5971157U JP S5971157 U JPS5971157 U JP S5971157U JP 16669282 U JP16669282 U JP 16669282U JP 16669282 U JP16669282 U JP 16669282U JP S5971157 U JPS5971157 U JP S5971157U
Authority
JP
Japan
Prior art keywords
axis
laser beam
direction along
plane
optical path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16669282U
Other languages
Japanese (ja)
Other versions
JPS6315815Y2 (en
Inventor
実 柴田
Original Assignee
西進商事株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 西進商事株式会社 filed Critical 西進商事株式会社
Priority to JP16669282U priority Critical patent/JPS5971157U/en
Publication of JPS5971157U publication Critical patent/JPS5971157U/en
Application granted granted Critical
Publication of JPS6315815Y2 publication Critical patent/JPS6315815Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図、第2図、第3図は各々異なる従来の光励起ルミ
ネッセンスによる分光分析装置の原理的説明図、第4図
はこの考案の実施例の概略の構成を示す斜視図である。 1・・・レーザ光源、2・・・試料、3.3′・・・集
光レンズ、4・・・分光器、5・・・検知器、7・・・
細孔付平面反射鏡、8・・・第1の平面反射鏡、9・・
・第2の平面反射鏡、10・・・台、11.13・・・
駆動装置、12・・・台、14・・・ガイドレール。
FIGS. 1, 2, and 3 are explanatory diagrams of the principles of different conventional spectroscopic analyzers using photoexcited luminescence, and FIG. 4 is a perspective view showing the general structure of an embodiment of this invention. DESCRIPTION OF SYMBOLS 1... Laser light source, 2... Sample, 3.3'... Condensing lens, 4... Spectrometer, 5... Detector, 7...
Plane reflecting mirror with pores, 8...first plane reflecting mirror, 9...
・Second plane reflecting mirror, 10... units, 11.13...
Drive device, 12... units, 14... guide rail.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] レーザ光線を試料に照射し、発生する光励起ルミネッセ
ンスを分光器に導く構成の分光分析装置において、上記
レーザ光線の光路の所定区間をY軸に対応させてその光
路をY軸に直角なZ軸に沿う方向に屈折させる第1の平
面反射鏡をY軸に沿う方向に移動操作可能な台に設け、
第1の平面反射鏡から反射するレーザ光線の光路をY軸
及びZ軸に直角なY軸に沿う方向に屈折させる第2の平
面反射鏡をZ軸に沿う方向に移動操作可能に上記台に設
け、第2の平面反射鏡から反射するレーザ光線が上記試
料の平面を直角に照射する位置関係に試料支持部を設け
たことを特徴とするスキャニング装置。
In a spectroscopic analyzer configured to irradiate a sample with a laser beam and guide the generated photoexcited luminescence to a spectrometer, a predetermined section of the optical path of the laser beam is made to correspond to the Y-axis, and the optical path is aligned with the Z-axis perpendicular to the Y-axis. A first plane reflecting mirror that refracts the light in the direction along the Y axis is provided on a stand that can be moved and operated in the direction along the Y axis,
A second plane reflector that refracts the optical path of the laser beam reflected from the first plane reflector in a direction along the Y axis perpendicular to the Y axis and the Z axis is attached to the above table so as to be movable in the direction along the Z axis. A scanning device comprising: a sample support portion arranged in such a position that the laser beam reflected from the second plane reflecting mirror irradiates the plane of the sample at right angles.
JP16669282U 1982-11-02 1982-11-02 Scanning device in spectrometer Granted JPS5971157U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16669282U JPS5971157U (en) 1982-11-02 1982-11-02 Scanning device in spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16669282U JPS5971157U (en) 1982-11-02 1982-11-02 Scanning device in spectrometer

Publications (2)

Publication Number Publication Date
JPS5971157U true JPS5971157U (en) 1984-05-15
JPS6315815Y2 JPS6315815Y2 (en) 1988-05-06

Family

ID=30364874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16669282U Granted JPS5971157U (en) 1982-11-02 1982-11-02 Scanning device in spectrometer

Country Status (1)

Country Link
JP (1) JPS5971157U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100396954B1 (en) * 2001-03-27 2003-09-03 임채헌 Fiter box for analysing wave length of light and cell analysis device utilizing the same
JP2011013167A (en) * 2009-07-06 2011-01-20 Hitachi High-Technologies Corp Spectrofluorometer and sample cell

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100396954B1 (en) * 2001-03-27 2003-09-03 임채헌 Fiter box for analysing wave length of light and cell analysis device utilizing the same
JP2011013167A (en) * 2009-07-06 2011-01-20 Hitachi High-Technologies Corp Spectrofluorometer and sample cell

Also Published As

Publication number Publication date
JPS6315815Y2 (en) 1988-05-06

Similar Documents

Publication Publication Date Title
CN112799221B (en) Confocal incident adapter with specific light splitting function
JPS5971157U (en) Scanning device in spectrometer
JPS59164945A (en) Optical analyzing meter
CN115706024A (en) Inspection apparatus
JPS60140144A (en) Head section of photometer
JPS6117656U (en) Equipment for testing reflective surfaces
JPS6354057U (en)
JPS6111148U (en) Reflector projector lighting system
JPS58107289U (en) Laser processing equipment
JPS59121614U (en) Lens switching mechanism
JPS5860256U (en) gas detection device
JPS58138010U (en) Dimension measuring device
JPS62103256U (en)
JPH0439586U (en)
JPS60176553U (en) Electronic component lead wire inspection equipment
JPS58118743U (en) Crystal evaluation device
JPS5861381U (en) Light beam processing equipment
JPS61131648U (en)
JPH0227744A (en) Wire bonding apparatus
JPS63272262A (en) Laser scanner
JPS605788U (en) Laser processing equipment
JPS58109730U (en) overhead type projector
JPS60113546U (en) Sample measuring device for spectrophotometer
JPS59154625U (en) Vibration analysis device for high-speed linear moving bodies
JPS58186459U (en) Surface analysis laser Raman microscope