JPS6348947B2 - - Google Patents

Info

Publication number
JPS6348947B2
JPS6348947B2 JP20368382A JP20368382A JPS6348947B2 JP S6348947 B2 JPS6348947 B2 JP S6348947B2 JP 20368382 A JP20368382 A JP 20368382A JP 20368382 A JP20368382 A JP 20368382A JP S6348947 B2 JPS6348947 B2 JP S6348947B2
Authority
JP
Japan
Prior art keywords
thin film
mirror
viewing window
film forming
forming apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP20368382A
Other languages
Japanese (ja)
Other versions
JPS5993874A (en
Inventor
Kazuhiko Honjo
Hitoshi Une
Sadao Kadokura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teijin Ltd
Original Assignee
Teijin Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teijin Ltd filed Critical Teijin Ltd
Priority to JP20368382A priority Critical patent/JPS5993874A/en
Publication of JPS5993874A publication Critical patent/JPS5993874A/en
Publication of JPS6348947B2 publication Critical patent/JPS6348947B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/52Means for observation of the coating process

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Description

【発明の詳細な説明】 本発明は、スパツタ装置、蒸着装置、イオンプ
レーテイング装置、プラズマCVD装置等の如く、
真空下で基板上に目的粒子を堆積させて薄膜を形
成する薄膜形成装置の改良に関し、更に詳しくは
膜形成状態の観察が長時間に亘りできる改良され
た覗窓を備えた薄膜形成装置に関する。
Detailed Description of the Invention The present invention is applicable to sputtering equipment, vapor deposition equipment, ion plating equipment, plasma CVD equipment, etc.
The present invention relates to an improvement in a thin film forming apparatus that forms a thin film by depositing target particles on a substrate under vacuum, and more particularly to a thin film forming apparatus equipped with an improved viewing window that allows observation of the film forming state over a long period of time.

上述の薄膜形成装置においては、目的粒子の発
生部分(例えばターゲツト)、又、薄膜堆積部分
(基板)を観測することは、膜形成の異常例えば
ターゲツトや基板の異常を発見するうえで特に有
効な手段である。
In the thin film forming apparatus described above, observing the part where the target particles are generated (for example, the target) or the part on which the thin film is deposited (the substrate) is particularly effective in discovering abnormalities in film formation, such as abnormalities in the target or the substrate. It is a means.

ところが従来より用いられている薄膜形成装置
は、装置本体の壁面にもうけられた貫通孔のフラ
ンジに直接又は短管を介してガラスを取りつけた
覗窓から前記ターゲツト又基板を直視する方法が
用いられている。この従来方法では、長時間薄膜
を製造していると、覗窓のガラスが飛散粒子の付
着等により不透明化してしまい、装置内部の観測
が不可能となつてしまい、前記ターゲツトの異常
や基板の異常を監視できないという問題が生じ
る。かかる問題を解消するものとして、覗窓と観
測部分との間に遮蔽板を設置したものがあり、極
力遮蔽状態に保ち、すなわち必要最小限に監視時
間を短くすることで前記ガラスの不透明化に対処
しているのが現状である。それでも遮蔽板の設置
位置によつては、(覗窓と遮蔽板との距離が長い
場合)飛散粒子の廻り込みによつて、遮蔽板を設
置しているにもかかわらず、長時間薄膜を製造し
ていると前記ガラスが不透明化してしまい、いざ
観測しようとしたときには観測不可能な状態にな
つてしまつていたという不都合なケースが多々あ
つた。
However, conventionally used thin film forming apparatuses use a method in which the target or substrate is directly viewed through a viewing window in which glass is attached directly or via a short tube to the flange of a through hole formed in the wall of the apparatus main body. ing. In this conventional method, if the thin film is manufactured for a long time, the glass of the viewing window becomes opaque due to the adhesion of scattered particles, making it impossible to observe the inside of the device, which may lead to abnormalities in the target or damage to the substrate. A problem arises in that abnormalities cannot be monitored. To solve this problem, a shielding plate is installed between the viewing window and the observation part, and by keeping the shielding as much as possible, that is, by shortening the monitoring time to the minimum necessary, it is possible to prevent the glass from becoming opaque. The current situation is that we are dealing with it. However, depending on the installation position of the shielding plate (when the distance between the viewing window and the shielding plate is long), the thin film can be produced for a long time despite the installation of the shielding plate due to scattered particles getting around. There were many inconvenient cases in which the glass became opaque, making it impossible to observe when attempting to observe it.

本発明は、かかる現状を解決するためなされた
もので、異物特に膜形成粒子の付着による覗窓の
不透明化がなく、簡単な構造で既存の薄膜形成装
置に容易に適用できるものである。
The present invention has been made to solve the current situation, and does not cause the viewing window to become opaque due to adhesion of foreign matter, especially film-forming particles, and has a simple structure that can be easily applied to existing thin film forming apparatuses.

すなわち、本発明は、前述の真空下で基板上の
薄膜を形成する薄膜形成装置において、装置本体
に覗窓を覗窓への飛散粒子が到達できない程度に
折曲した筒体を介して設けると共に、その折曲部
に鏡を設け、該鏡を介して覗窓より内部観察でき
るようにしたことを特徴とするものである。
That is, the present invention provides a thin film forming apparatus for forming a thin film on a substrate under vacuum as described above, in which a viewing window is provided in the main body of the equipment via a cylinder bent to such an extent that scattered particles cannot reach the viewing window. , is characterized in that a mirror is provided at the bent portion, and the interior can be observed through the viewing window through the mirror.

以下、本発明をスパツタ装置を例に図面により
説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be explained below using a sputtering apparatus as an example with reference to the drawings.

第1図は上記実施例の構成図である。 FIG. 1 is a configuration diagram of the above embodiment.

図から明らかな通り、その膜形成に係わる構成
はスパツタ装置として周知のものであり、周知の
通り真空槽1内を真空排気系2により所定の真空
度にした後、ガス導入系3よりアルゴン等の所定
のスパツタガスを導入すると共に、スパツタ電源
(図示省略)よりターゲツト4に電力を供給し、
ターゲツト4をスパツタし、ターゲツト4の組成
に応じた薄膜を基板5上に形成するようになつて
いる。なお、図の6はターゲツトホルダー、図の
7は基板ホルダーである。ところで、真空槽4の
内部を観察する覗窓10は以下のように設けてあ
る。すなわち、ターゲツト4、基板5及びその間
の放電領域等の膜形成状況を観察できるようにこ
れらに対面する真空槽1の側壁に貫通孔11を設
け、所定長の中間で略直角に折曲したL字状の筒
体12の一端をフランジ13a,13bにより貫
通孔11に接すると共に筒体12の折曲部に反射
のための鏡14をその入射角θが調整できるよう
に調整軸15回りに回動可能に設け、筒体12の
他端をフランジ16a,16bを介してガラス板
で封止して覗窓10としてある。なお、調整軸1
5は筒体12外まで延長し、調整つまみ(図示省
略)を設け、外部より鏡14の入射角θを調整で
きるようにして観察部位の拡大を計つてある。
As is clear from the figure, the configuration related to film formation is well-known as a sputtering device, and as is well-known, after the inside of the vacuum chamber 1 is brought to a predetermined degree of vacuum by the evacuation system 2, argon etc. are supplied from the gas introduction system 3. A predetermined sputter gas is introduced, and power is supplied to the target 4 from a sputter power source (not shown),
A target 4 is sputtered to form a thin film on a substrate 5 according to the composition of the target 4. Note that 6 in the figure is a target holder, and 7 in the figure is a substrate holder. By the way, the viewing window 10 for observing the inside of the vacuum chamber 4 is provided as follows. That is, a through hole 11 is provided in the side wall of the vacuum chamber 1 facing the target 4, the substrate 5, and the discharge area therebetween so that the state of film formation can be observed. One end of the letter-shaped cylindrical body 12 is brought into contact with the through hole 11 by flanges 13a and 13b, and a mirror 14 for reflection is attached to the bent part of the cylindrical body 12 and rotated around an adjustment shaft 15 so that the incident angle θ can be adjusted. The viewing window 10 is provided movably, and the other end of the cylindrical body 12 is sealed with a glass plate via flanges 16a and 16b. In addition, adjustment axis 1
5 extends outside the cylindrical body 12 and is provided with an adjustment knob (not shown) so that the angle of incidence θ of the mirror 14 can be adjusted from the outside to enlarge the observation area.

以上の通り、鏡14により覗窓10から真空槽
1の内部を観察する観察路Iを略直角に折り曲
げ、覗窓10が真空槽1の内部に直面しないよう
にしてあるので、粒子発生部であるターゲツト4
からの飛散粒子は覗窓10には全く到達せず、覗
窓10のガラスの不透明化は効果的に防止され
る。
As mentioned above, since the observation path I through which the inside of the vacuum chamber 1 is observed from the viewing window 10 by the mirror 14 is bent at a substantially right angle so that the viewing window 10 does not face the inside of the vacuum chamber 1, the particle generation section A certain target 4
The particles scattered from the glass do not reach the viewing window 10 at all, and the glass of the viewing window 10 is effectively prevented from becoming opaque.

ところで、鏡14は真空槽1の内部に直面して
いるので飛散粒子の付着は避けられないが、飛散
粒子が金属元素等の如く光反射率の高いものの場
合は、粒子の付着は鏡面の形成となり、何ら障害
とならない。このように光反射率の高い薄膜、特
に金属薄膜の薄膜形成装置には適したものであ
る。また、光反射率の低い薄膜の場合にも、鏡の
反射を利用しているためか従来よりは長い間使用
できるようになつた。更に、前述の調整つまみに
より常時は裏面を真空槽1の内部に向けておき、
必要時のみ鏡面側へ反転させて観察するようにす
れば、まず実用上充分な長時間に亘る監視ができ
る。
By the way, since the mirror 14 faces the inside of the vacuum chamber 1, adhesion of scattered particles is unavoidable, but if the scattered particles are of high light reflectance, such as metal elements, the adhesion of particles may cause the formation of a mirror surface. Therefore, there is no problem. Thus, it is suitable for a thin film forming apparatus for thin films with high light reflectance, especially metal thin films. Furthermore, even in the case of thin films with low light reflectance, they can be used for a longer period of time than before, probably because mirror reflection is used. Furthermore, use the aforementioned adjustment knob to always keep the back side facing the inside of the vacuum chamber 1.
By flipping it over to the mirror side for observation only when necessary, monitoring can be carried out for a long period of time that is practically sufficient.

なお、接続部をフランジ接続として着脱容易と
なしてあるので、定掃等に便利である。
In addition, the connection part is a flange connection so that it can be easily attached and detached, so it is convenient for regular cleaning etc.

以上、本発明を実施例に基いて説明したが、本
発明はかかる実施例に限定されるものでないこと
は云うまでもない。
Although the present invention has been described above based on Examples, it goes without saying that the present invention is not limited to these Examples.

スパツタ装置を例に説明したが、前述の真空下
で基板上に目的粒子を堆積させて薄膜を形成する
薄膜形成装置であれば、各種のものに適用できる
ことは本発明の趣旨から明らかである。
Although the sputtering apparatus has been described as an example, it is clear from the spirit of the present invention that it can be applied to various thin film forming apparatuses that deposit target particles on a substrate under vacuum to form a thin film.

また、鏡として像変形のない平面鏡を示した
が、凸面鏡等も適用できることも云うまでもな
い。凸面鏡を用いると視野拡大に有利である。更
に調整軸を中心とした多面鏡とすると、光反射率
の低い膜の形成の場合、順次回転させることによ
り、監視時間を大巾に長くできる利点がある。
Further, although a plane mirror without image deformation is shown as the mirror, it goes without saying that a convex mirror or the like can also be applied. Using a convex mirror is advantageous in expanding the field of view. Furthermore, if a polygon mirror is used centered on the adjustment axis, there is an advantage that when a film with low light reflectance is to be formed, the monitoring time can be greatly lengthened by sequentially rotating the mirror.

更に、L字状の筒体を示したが、筒体は覗窓へ
飛散粒子が到達できない程度に折れ曲がつたもの
であれば十分であることは、本発明の趣旨から明
らかである。具体的な折曲角は、筒径、筒長及び
鏡の大きさ等の影響を受け、実験的に決める必要
がる。
Furthermore, although an L-shaped cylinder is shown, it is clear from the spirit of the present invention that it is sufficient that the cylinder is bent to such an extent that scattered particles cannot reach the viewing window. The specific bending angle is influenced by the cylinder diameter, cylinder length, mirror size, etc., and must be determined experimentally.

以上のように、本発明は先端に設けた覗窓への
粒子の飛散がない程度に折れ曲がつた筒体の折曲
部に鏡を設け、該鏡により内部を反射させて観察
するようにしたことを特徴とする薄膜形成装置で
あり、種々の態様で実施でき、簡単な構成で長時
間の内部観察ができるもので、薄膜形成装置の性
能向上に大きな寄与をなすものである。
As described above, the present invention provides a mirror at the bent part of the cylinder which is bent to the extent that particles do not scatter to the viewing window provided at the tip, and the interior is reflected by the mirror for observation. This thin film forming apparatus is characterized by the following: it can be implemented in various ways, it has a simple configuration and allows long-term internal observation, and it greatly contributes to improving the performance of the thin film forming apparatus.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明に係わるスパツタ装置の構造
図である。 1:真空槽、4:ターゲツト、5:基板、1
0:覗窓、12:筒体、14:鏡。
FIG. 1 is a structural diagram of a sputtering device according to the present invention. 1: Vacuum chamber, 4: Target, 5: Substrate, 1
0: Peephole, 12: Cylinder, 14: Mirror.

Claims (1)

【特許請求の範囲】 1 真空下で基板上に薄膜を形成する薄膜形成装
置において、装置本体に覗窓を覗窓へ飛散粒子が
到達できない程度に折れ曲がつた筒体を介して設
けると共に、その折曲部に鏡を設け、該鏡を介し
て覗窓より内部観察できるようになしたことを特
徴とする薄膜形成装置。 2 前記鏡の少なくとも反射角が外部より調整可
能である特許請求の範囲第1項記載の薄膜形成装
置。 3 前記鏡が多面鏡である特許請求の範囲第2項
記載の薄膜形成装置。 4 前記薄膜が金属薄膜である特許請求の範囲第
1項若しくは第2項記載の薄膜形成装置。
[Scope of Claims] 1. In a thin film forming apparatus for forming a thin film on a substrate under vacuum, a viewing window is provided in the main body of the equipment via a cylindrical body bent to such an extent that scattered particles cannot reach the viewing window, and A thin film forming apparatus characterized in that a mirror is provided at the bent portion, and the interior can be observed from a viewing window through the mirror. 2. The thin film forming apparatus according to claim 1, wherein at least the reflection angle of the mirror is adjustable from the outside. 3. The thin film forming apparatus according to claim 2, wherein the mirror is a polygon mirror. 4. The thin film forming apparatus according to claim 1 or 2, wherein the thin film is a metal thin film.
JP20368382A 1982-11-22 1982-11-22 Thin film forming device Granted JPS5993874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20368382A JPS5993874A (en) 1982-11-22 1982-11-22 Thin film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20368382A JPS5993874A (en) 1982-11-22 1982-11-22 Thin film forming device

Publications (2)

Publication Number Publication Date
JPS5993874A JPS5993874A (en) 1984-05-30
JPS6348947B2 true JPS6348947B2 (en) 1988-10-03

Family

ID=16478107

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20368382A Granted JPS5993874A (en) 1982-11-22 1982-11-22 Thin film forming device

Country Status (1)

Country Link
JP (1) JPS5993874A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH066786B2 (en) * 1987-03-17 1994-01-26 日本電信電話株式会社 Thin film forming equipment
CN113308678A (en) * 2021-07-14 2021-08-27 苏州佑伦真空设备科技有限公司 Wide window of observation angle

Also Published As

Publication number Publication date
JPS5993874A (en) 1984-05-30

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